Introduction to scanning tunneling microscopy:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
New York
Oxford University Press
1993
|
| Schriftenreihe: | Oxford series in optical and imaging sciences
4 |
| Schlagworte: | |
| Online-Zugang: | FAW01 FAW02 Volltext |
| Beschreibung: | Includes bibliographical references (p. 383-404) and index 1. Overview. 1.1. The scanning tunneling microscope in a nutshell. 1.2. Tunneling: an elementary model. 1.3. Probing electronic structure at an atomic scale. 1.4. Spatially resolved tunneling spectroscopy. 1.5. Lateral resolution: Early theories. 1.6. Origin of atomic resolution in STM. 1.7. Tip-sample interaction effects. 1.8. Historical remarks -- 2. Atom-scale tunneling. 2.2. The perturbation approach. 2.3. The image force. 2.4. The Square-barrier problem. 2.5. The modified Bardeen approach. 2.6. Effect of image force on tunneling -- 3. Tunneling matrix elements. 3.2. Tip wavefunctions. 3.3. Green's function and tip wavefunctions. 3.4. The derivative rule: individual cases. 3.5. The derivative rule: general case. 3.6. An intuitive interpretation -- 4. Wavefunctions at surfaces. 4.1. Types of surface wavefunctions. 4.2. The jellium model. 4.3. Concept of surface states. 4.4. Field emission spectroscopy. 4.5. Photoemission studies. 4.6. Atom-beam diffraction |
| Beschreibung: | 1 Online-Ressource (xxii, 412 p., 31 p. of plates) |
| ISBN: | 0195071506 0198023561 9780195071504 9780198023562 |
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| 245 | 1 | 0 | |a Introduction to scanning tunneling microscopy |c C. Julian Chen |
| 264 | 1 | |a New York |b Oxford University Press |c 1993 | |
| 300 | |a 1 Online-Ressource (xxii, 412 p., 31 p. of plates) | ||
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| 490 | 0 | |a Oxford series in optical and imaging sciences |v 4 | |
| 500 | |a Includes bibliographical references (p. 383-404) and index | ||
| 500 | |a 1. Overview. 1.1. The scanning tunneling microscope in a nutshell. 1.2. Tunneling: an elementary model. 1.3. Probing electronic structure at an atomic scale. 1.4. Spatially resolved tunneling spectroscopy. 1.5. Lateral resolution: Early theories. 1.6. Origin of atomic resolution in STM. 1.7. Tip-sample interaction effects. 1.8. Historical remarks -- 2. Atom-scale tunneling. 2.2. The perturbation approach. 2.3. The image force. 2.4. The Square-barrier problem. 2.5. The modified Bardeen approach. 2.6. Effect of image force on tunneling -- 3. Tunneling matrix elements. 3.2. Tip wavefunctions. 3.3. Green's function and tip wavefunctions. 3.4. The derivative rule: individual cases. 3.5. The derivative rule: general case. 3.6. An intuitive interpretation -- 4. Wavefunctions at surfaces. 4.1. Types of surface wavefunctions. 4.2. The jellium model. 4.3. Concept of surface states. 4.4. Field emission spectroscopy. 4.5. Photoemission studies. 4.6. Atom-beam diffraction | ||
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Datensatz im Suchindex
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| author | Chen, C. Julian |
| author_facet | Chen, C. Julian |
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| dewey-full | 502/.8/2 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502/.8/2 |
| dewey-search | 502/.8/2 |
| dewey-sort | 3502 18 12 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft |
| format | Electronic eBook |
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| isbn | 0195071506 0198023561 9780195071504 9780198023562 |
| language | English |
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| spelling | Chen, C. Julian Verfasser aut Introduction to scanning tunneling microscopy C. Julian Chen New York Oxford University Press 1993 1 Online-Ressource (xxii, 412 p., 31 p. of plates) txt rdacontent c rdamedia cr rdacarrier Oxford series in optical and imaging sciences 4 Includes bibliographical references (p. 383-404) and index 1. Overview. 1.1. The scanning tunneling microscope in a nutshell. 1.2. Tunneling: an elementary model. 1.3. Probing electronic structure at an atomic scale. 1.4. Spatially resolved tunneling spectroscopy. 1.5. Lateral resolution: Early theories. 1.6. Origin of atomic resolution in STM. 1.7. Tip-sample interaction effects. 1.8. Historical remarks -- 2. Atom-scale tunneling. 2.2. The perturbation approach. 2.3. The image force. 2.4. The Square-barrier problem. 2.5. The modified Bardeen approach. 2.6. Effect of image force on tunneling -- 3. Tunneling matrix elements. 3.2. Tip wavefunctions. 3.3. Green's function and tip wavefunctions. 3.4. The derivative rule: individual cases. 3.5. The derivative rule: general case. 3.6. An intuitive interpretation -- 4. Wavefunctions at surfaces. 4.1. Types of surface wavefunctions. 4.2. The jellium model. 4.3. Concept of surface states. 4.4. Field emission spectroscopy. 4.5. Photoemission studies. 4.6. Atom-beam diffraction SCIENCE / Microscopes & Microscopy bisacsh Scanning tunneling microscopy gtt Microscopie tunnel à balayage ram Rastertunnelmikroskopie swd Scanning tunneling microscopy fast Scanning tunneling microscopy Rastertunnelmikroskopie (DE-588)4252995-5 gnd rswk-swf Rastertunnelmikroskopie (DE-588)4252995-5 s 1\p DE-604 http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=151165 Aggregator Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Chen, C. Julian Introduction to scanning tunneling microscopy SCIENCE / Microscopes & Microscopy bisacsh Scanning tunneling microscopy gtt Microscopie tunnel à balayage ram Rastertunnelmikroskopie swd Scanning tunneling microscopy fast Scanning tunneling microscopy Rastertunnelmikroskopie (DE-588)4252995-5 gnd |
| subject_GND | (DE-588)4252995-5 |
| title | Introduction to scanning tunneling microscopy |
| title_auth | Introduction to scanning tunneling microscopy |
| title_exact_search | Introduction to scanning tunneling microscopy |
| title_full | Introduction to scanning tunneling microscopy C. Julian Chen |
| title_fullStr | Introduction to scanning tunneling microscopy C. Julian Chen |
| title_full_unstemmed | Introduction to scanning tunneling microscopy C. Julian Chen |
| title_short | Introduction to scanning tunneling microscopy |
| title_sort | introduction to scanning tunneling microscopy |
| topic | SCIENCE / Microscopes & Microscopy bisacsh Scanning tunneling microscopy gtt Microscopie tunnel à balayage ram Rastertunnelmikroskopie swd Scanning tunneling microscopy fast Scanning tunneling microscopy Rastertunnelmikroskopie (DE-588)4252995-5 gnd |
| topic_facet | SCIENCE / Microscopes & Microscopy Scanning tunneling microscopy Microscopie tunnel à balayage Rastertunnelmikroskopie |
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