ISTFA 2011: conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Materials Park, OH
ASM International
2011
|
| Schlagworte: | |
| Online-Zugang: | FAW01 FAW02 Volltext |
| Beschreibung: | Some online versions lack accompanying media packaged with the printed version Includes bibliographical references and index |
| Beschreibung: | 1 Online-Ressource (xix, 456 p.) |
| ISBN: | 1615038264 1615038507 9781615038268 9781615038503 |
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| 246 | 1 | 3 | |a International Symposium for Testing and Failure Analysis 2011 |
| 246 | 1 | 3 | |a Conference proceedings of the 37th International Symposium for Testing and Failure Analysis |
| 246 | 1 | 3 | |a 37th International Symposium for Testing and Failure Analysis |
| 246 | 1 | 3 | |a Thirty-seventh International Symposium for Testing and Failure Analysis |
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| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Electronics / Microelectronics |2 bisacsh | |
| 650 | 7 | |a Electronic apparatus and appliances / Testing |2 fast | |
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| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
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| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
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| spelling | International Symposium for Testing and Failure Analysis < 2011, San Jose, Calif.> Verfasser aut ISTFA 2011 conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California sponsored by EDFAS, ISTFA/2011, ASM International International Symposium for Testing and Failure Analysis 2011 Conference proceedings of the 37th International Symposium for Testing and Failure Analysis 37th International Symposium for Testing and Failure Analysis Thirty-seventh International Symposium for Testing and Failure Analysis Materials Park, OH ASM International 2011 1 Online-Ressource (xix, 456 p.) txt rdacontent c rdamedia cr rdacarrier Some online versions lack accompanying media packaged with the printed version Includes bibliographical references and index TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses (DE-588)1071861417 Konferenzschrift gnd-content Electronic Device Failure Analysis Society Sonstige oth International Symposium for Testing and Failure Analysis/2011 Sonstige oth ASM International Sonstige oth http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=438625 Aggregator Volltext |
| spellingShingle | ISTFA 2011 conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses |
| subject_GND | (DE-588)1071861417 |
| title | ISTFA 2011 conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California |
| title_alt | International Symposium for Testing and Failure Analysis 2011 Conference proceedings of the 37th International Symposium for Testing and Failure Analysis 37th International Symposium for Testing and Failure Analysis Thirty-seventh International Symposium for Testing and Failure Analysis |
| title_auth | ISTFA 2011 conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California |
| title_exact_search | ISTFA 2011 conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California |
| title_full | ISTFA 2011 conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California sponsored by EDFAS, ISTFA/2011, ASM International |
| title_fullStr | ISTFA 2011 conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California sponsored by EDFAS, ISTFA/2011, ASM International |
| title_full_unstemmed | ISTFA 2011 conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California sponsored by EDFAS, ISTFA/2011, ASM International |
| title_short | ISTFA 2011 |
| title_sort | istfa 2011 conference proceedings from the 37th international symposium for testing and failure analysis november 13 17 2011 san jose convention center san jose california |
| title_sub | conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Digital bisacsh TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Digital TECHNOLOGY & ENGINEERING / Electronics / Microelectronics Electronic apparatus and appliances / Testing Electronics / Materials / Testing Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Konferenzschrift |
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