Introduction to conventional transmission electron microscopy:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Cambridge, U.K.
Cambridge University Press
2003
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| Schlagworte: | |
| Online-Zugang: | FAW01 FAW02 Volltext |
| Beschreibung: | Includes bibliographical references (pages 685-703) and index Basic crystallography -- Basic quantum mechanics, Bragg's Law and other tools -- The transmission electron microscope -- Getting started -- Dynamical electron scattering in perfect crystals -- Two-beam theory in defect-free crystals -- Systematic row and zone axis orientations -- Defects in crystals -- Electron diffraction patterns -- Phase contrast microscopy This graduate level textbook covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text |
| Beschreibung: | 1 Online-Ressource (xxi, 718 pages) |
| ISBN: | 0511075960 051107753X 9780511075964 9780511077531 |
Internformat
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| 500 | |a Includes bibliographical references (pages 685-703) and index | ||
| 500 | |a Basic crystallography -- Basic quantum mechanics, Bragg's Law and other tools -- The transmission electron microscope -- Getting started -- Dynamical electron scattering in perfect crystals -- Two-beam theory in defect-free crystals -- Systematic row and zone axis orientations -- Defects in crystals -- Electron diffraction patterns -- Phase contrast microscopy | ||
| 500 | |a This graduate level textbook covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text | ||
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Datensatz im Suchindex
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| author | De Graef, Marc |
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| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
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| dewey-search | 620.1/1299 |
| dewey-sort | 3620.1 41299 |
| dewey-tens | 620 - Engineering and allied operations |
| format | Electronic eBook |
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| id | DE-604.BV043106835 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:17:37Z |
| institution | BVB |
| isbn | 0511075960 051107753X 9780511075964 9780511077531 |
| language | English |
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| physical | 1 Online-Ressource (xxi, 718 pages) |
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| publishDate | 2003 |
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| publisher | Cambridge University Press |
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| spelling | De Graef, Marc Verfasser aut Introduction to conventional transmission electron microscopy Marc De Graef Cambridge, U.K. Cambridge University Press 2003 1 Online-Ressource (xxi, 718 pages) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references (pages 685-703) and index Basic crystallography -- Basic quantum mechanics, Bragg's Law and other tools -- The transmission electron microscope -- Getting started -- Dynamical electron scattering in perfect crystals -- Two-beam theory in defect-free crystals -- Systematic row and zone axis orientations -- Defects in crystals -- Electron diffraction patterns -- Phase contrast microscopy This graduate level textbook covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text SCIENCE / Nanoscience bisacsh Transmission electron microscopy fast Microscopia eletrônica larpcal Durchstrahlungselektronenmikroskopie swd Transmission electron microscopy Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd rswk-swf Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 s 1\p DE-604 http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=125026 Aggregator Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | De Graef, Marc Introduction to conventional transmission electron microscopy SCIENCE / Nanoscience bisacsh Transmission electron microscopy fast Microscopia eletrônica larpcal Durchstrahlungselektronenmikroskopie swd Transmission electron microscopy Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd |
| subject_GND | (DE-588)4215608-7 |
| title | Introduction to conventional transmission electron microscopy |
| title_auth | Introduction to conventional transmission electron microscopy |
| title_exact_search | Introduction to conventional transmission electron microscopy |
| title_full | Introduction to conventional transmission electron microscopy Marc De Graef |
| title_fullStr | Introduction to conventional transmission electron microscopy Marc De Graef |
| title_full_unstemmed | Introduction to conventional transmission electron microscopy Marc De Graef |
| title_short | Introduction to conventional transmission electron microscopy |
| title_sort | introduction to conventional transmission electron microscopy |
| topic | SCIENCE / Nanoscience bisacsh Transmission electron microscopy fast Microscopia eletrônica larpcal Durchstrahlungselektronenmikroskopie swd Transmission electron microscopy Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd |
| topic_facet | SCIENCE / Nanoscience Transmission electron microscopy Microscopia eletrônica Durchstrahlungselektronenmikroskopie |
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| work_keys_str_mv | AT degraefmarc introductiontoconventionaltransmissionelectronmicroscopy |