Stochastic reliability modeling, optimization and applications:
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Singapore
World Scientific Pub. Co.
c2010
|
| Schlagworte: | |
| Online-Zugang: | FAW01 FAW02 Volltext |
| Beschreibung: | Includes bibliographical references 1. Multistate coherent systems / Fumio Ohi -- 2. Cumulative damage models / Takashi Satow -- 3. Extended inspection models / Satoshi Mizutani -- 4. Stochastic analyses for hybrid state saving and its experimental validation / Mamoru Ohara, Masayuki Arai and Satoshi Fukumoto -- 5. Reliability analysis of a system connected with networks / Mitsuhiro Imaizumi -- 6. Reliability analysis of communication systems / Mitsutaka Kimura -- 7. Backup policies for a database system / Cun-Hua Qian -- 8. Optimal checkpoint intervals for computer systems / Kenichiro Naruse and Sayori Maeji -- 9. Maintenance models of miscellaneous systems / Kodo Ito -- 10. Management policies for stochastic models with monetary facilities / Syouji Nakamura Reliability theory and applications become major concerns of engineers and managers engaged in making high quality products and designing highly reliable systems. This book aims to survey new research topics in reliability theory and useful applied techniques in reliability engineering. Our research group in Nagoya, Japan has continued to study reliability theory and applications for more than twenty years, and has presented and published many good papers at international conferences and in journals. This book focuses mainly on how to apply the results of reliability theory to practical models. Theoretical results of coherent, inspection, and damage systems are summarized methodically, using the techniques of stochastic processes. There exist optimization problems in computer and management sciences and engineering. It is shown that such problems as computer, information and network systems are solved by using the techniques of reliability. Furthermore, some useful techniques applied to the analysis of stochastic models in management science and plants are shown. The reader will learn new topics and techniques, and how to apply reliability models to actual ones. The book will serve as an essential guide to a subject of study for graduate students and researchers and as a useful guide for reliability engineers engaged not only in maintenance work but also in management and computer works |
| Beschreibung: | 1 Online-Ressource (xvi, 300 p.) |
| ISBN: | 9789814277433 9789814277440 9814277436 9814277444 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV043087005 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 151126s2010 |||| o||u| ||||||eng d | ||
| 020 | |a 9789814277433 |9 978-981-4277-43-3 | ||
| 020 | |a 9789814277440 |c electronic bk. |9 978-981-4277-44-0 | ||
| 020 | |a 9814277436 |9 981-4277-43-6 | ||
| 020 | |a 9814277444 |c electronic bk. |9 981-4277-44-4 | ||
| 035 | |a (OCoLC)630166345 | ||
| 035 | |a (DE-599)BVBBV043087005 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-1046 |a DE-1047 | ||
| 082 | 0 | |a 620.00452 |2 22 | |
| 245 | 1 | 0 | |a Stochastic reliability modeling, optimization and applications |c editors, Syouji Nakamura, Toshio Nakagawa |
| 264 | 1 | |a Singapore |b World Scientific Pub. Co. |c c2010 | |
| 300 | |a 1 Online-Ressource (xvi, 300 p.) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Includes bibliographical references | ||
| 500 | |a 1. Multistate coherent systems / Fumio Ohi -- 2. Cumulative damage models / Takashi Satow -- 3. Extended inspection models / Satoshi Mizutani -- 4. Stochastic analyses for hybrid state saving and its experimental validation / Mamoru Ohara, Masayuki Arai and Satoshi Fukumoto -- 5. Reliability analysis of a system connected with networks / Mitsuhiro Imaizumi -- 6. Reliability analysis of communication systems / Mitsutaka Kimura -- 7. Backup policies for a database system / Cun-Hua Qian -- 8. Optimal checkpoint intervals for computer systems / Kenichiro Naruse and Sayori Maeji -- 9. Maintenance models of miscellaneous systems / Kodo Ito -- 10. Management policies for stochastic models with monetary facilities / Syouji Nakamura | ||
| 500 | |a Reliability theory and applications become major concerns of engineers and managers engaged in making high quality products and designing highly reliable systems. This book aims to survey new research topics in reliability theory and useful applied techniques in reliability engineering. Our research group in Nagoya, Japan has continued to study reliability theory and applications for more than twenty years, and has presented and published many good papers at international conferences and in journals. This book focuses mainly on how to apply the results of reliability theory to practical models. Theoretical results of coherent, inspection, and damage systems are summarized methodically, using the techniques of stochastic processes. There exist optimization problems in computer and management sciences and engineering. It is shown that such problems as computer, information and network systems are solved by using the techniques of reliability. Furthermore, some useful techniques applied to the analysis of stochastic models in management science and plants are shown. The reader will learn new topics and techniques, and how to apply reliability models to actual ones. The book will serve as an essential guide to a subject of study for graduate students and researchers and as a useful guide for reliability engineers engaged not only in maintenance work but also in management and computer works | ||
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Quality Control |2 bisacsh | |
| 650 | 4 | |a Mathematisches Modell | |
| 650 | 4 | |a Reliability (Engineering) |x Mathematical models | |
| 650 | 4 | |a Stochastic systems | |
| 700 | 1 | |a Nakamura, Syouji |e Sonstige |4 oth | |
| 700 | 1 | |a Nakagawa, Toshio |e Sonstige |4 oth | |
| 710 | 2 | |a World Scientific (Firm) |e Sonstige |4 oth | |
| 856 | 4 | 0 | |u http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=340622 |x Aggregator |3 Volltext |
| 912 | |a ZDB-4-EBA | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-028511197 | ||
| 966 | e | |u http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=340622 |l FAW01 |p ZDB-4-EBA |q FAW_PDA_EBA |x Aggregator |3 Volltext | |
| 966 | e | |u http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=340622 |l FAW02 |p ZDB-4-EBA |q FAW_PDA_EBA |x Aggregator |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804175484271984640 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV043087005 |
| collection | ZDB-4-EBA |
| ctrlnum | (OCoLC)630166345 (DE-599)BVBBV043087005 |
| dewey-full | 620.00452 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.00452 |
| dewey-search | 620.00452 |
| dewey-sort | 3620.00452 |
| dewey-tens | 620 - Engineering and allied operations |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>04011nmm a2200457zc 4500</leader><controlfield tag="001">BV043087005</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">151126s2010 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9789814277433</subfield><subfield code="9">978-981-4277-43-3</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9789814277440</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">978-981-4277-44-0</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9814277436</subfield><subfield code="9">981-4277-43-6</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9814277444</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">981-4277-44-4</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)630166345</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV043087005</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-1046</subfield><subfield code="a">DE-1047</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">620.00452</subfield><subfield code="2">22</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Stochastic reliability modeling, optimization and applications</subfield><subfield code="c">editors, Syouji Nakamura, Toshio Nakagawa</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Singapore</subfield><subfield code="b">World Scientific Pub. Co.</subfield><subfield code="c">c2010</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (xvi, 300 p.)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">1. Multistate coherent systems / Fumio Ohi -- 2. Cumulative damage models / Takashi Satow -- 3. Extended inspection models / Satoshi Mizutani -- 4. Stochastic analyses for hybrid state saving and its experimental validation / Mamoru Ohara, Masayuki Arai and Satoshi Fukumoto -- 5. Reliability analysis of a system connected with networks / Mitsuhiro Imaizumi -- 6. Reliability analysis of communication systems / Mitsutaka Kimura -- 7. Backup policies for a database system / Cun-Hua Qian -- 8. Optimal checkpoint intervals for computer systems / Kenichiro Naruse and Sayori Maeji -- 9. Maintenance models of miscellaneous systems / Kodo Ito -- 10. Management policies for stochastic models with monetary facilities / Syouji Nakamura</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Reliability theory and applications become major concerns of engineers and managers engaged in making high quality products and designing highly reliable systems. This book aims to survey new research topics in reliability theory and useful applied techniques in reliability engineering. Our research group in Nagoya, Japan has continued to study reliability theory and applications for more than twenty years, and has presented and published many good papers at international conferences and in journals. This book focuses mainly on how to apply the results of reliability theory to practical models. Theoretical results of coherent, inspection, and damage systems are summarized methodically, using the techniques of stochastic processes. There exist optimization problems in computer and management sciences and engineering. It is shown that such problems as computer, information and network systems are solved by using the techniques of reliability. Furthermore, some useful techniques applied to the analysis of stochastic models in management science and plants are shown. The reader will learn new topics and techniques, and how to apply reliability models to actual ones. The book will serve as an essential guide to a subject of study for graduate students and researchers and as a useful guide for reliability engineers engaged not only in maintenance work but also in management and computer works</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TECHNOLOGY & ENGINEERING / Quality Control</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Mathematisches Modell</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Reliability (Engineering)</subfield><subfield code="x">Mathematical models</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Stochastic systems</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Nakamura, Syouji</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Nakagawa, Toshio</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">World Scientific (Firm)</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=340622</subfield><subfield code="x">Aggregator</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-4-EBA</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-028511197</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=340622</subfield><subfield code="l">FAW01</subfield><subfield code="p">ZDB-4-EBA</subfield><subfield code="q">FAW_PDA_EBA</subfield><subfield code="x">Aggregator</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=340622</subfield><subfield code="l">FAW02</subfield><subfield code="p">ZDB-4-EBA</subfield><subfield code="q">FAW_PDA_EBA</subfield><subfield code="x">Aggregator</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV043087005 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:17:01Z |
| institution | BVB |
| isbn | 9789814277433 9789814277440 9814277436 9814277444 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-028511197 |
| oclc_num | 630166345 |
| open_access_boolean | |
| owner | DE-1046 DE-1047 |
| owner_facet | DE-1046 DE-1047 |
| physical | 1 Online-Ressource (xvi, 300 p.) |
| psigel | ZDB-4-EBA ZDB-4-EBA FAW_PDA_EBA |
| publishDate | 2010 |
| publishDateSearch | 2010 |
| publishDateSort | 2010 |
| publisher | World Scientific Pub. Co. |
| record_format | marc |
| spelling | Stochastic reliability modeling, optimization and applications editors, Syouji Nakamura, Toshio Nakagawa Singapore World Scientific Pub. Co. c2010 1 Online-Ressource (xvi, 300 p.) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references 1. Multistate coherent systems / Fumio Ohi -- 2. Cumulative damage models / Takashi Satow -- 3. Extended inspection models / Satoshi Mizutani -- 4. Stochastic analyses for hybrid state saving and its experimental validation / Mamoru Ohara, Masayuki Arai and Satoshi Fukumoto -- 5. Reliability analysis of a system connected with networks / Mitsuhiro Imaizumi -- 6. Reliability analysis of communication systems / Mitsutaka Kimura -- 7. Backup policies for a database system / Cun-Hua Qian -- 8. Optimal checkpoint intervals for computer systems / Kenichiro Naruse and Sayori Maeji -- 9. Maintenance models of miscellaneous systems / Kodo Ito -- 10. Management policies for stochastic models with monetary facilities / Syouji Nakamura Reliability theory and applications become major concerns of engineers and managers engaged in making high quality products and designing highly reliable systems. This book aims to survey new research topics in reliability theory and useful applied techniques in reliability engineering. Our research group in Nagoya, Japan has continued to study reliability theory and applications for more than twenty years, and has presented and published many good papers at international conferences and in journals. This book focuses mainly on how to apply the results of reliability theory to practical models. Theoretical results of coherent, inspection, and damage systems are summarized methodically, using the techniques of stochastic processes. There exist optimization problems in computer and management sciences and engineering. It is shown that such problems as computer, information and network systems are solved by using the techniques of reliability. Furthermore, some useful techniques applied to the analysis of stochastic models in management science and plants are shown. The reader will learn new topics and techniques, and how to apply reliability models to actual ones. The book will serve as an essential guide to a subject of study for graduate students and researchers and as a useful guide for reliability engineers engaged not only in maintenance work but also in management and computer works TECHNOLOGY & ENGINEERING / Quality Control bisacsh Mathematisches Modell Reliability (Engineering) Mathematical models Stochastic systems Nakamura, Syouji Sonstige oth Nakagawa, Toshio Sonstige oth World Scientific (Firm) Sonstige oth http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=340622 Aggregator Volltext |
| spellingShingle | Stochastic reliability modeling, optimization and applications TECHNOLOGY & ENGINEERING / Quality Control bisacsh Mathematisches Modell Reliability (Engineering) Mathematical models Stochastic systems |
| title | Stochastic reliability modeling, optimization and applications |
| title_auth | Stochastic reliability modeling, optimization and applications |
| title_exact_search | Stochastic reliability modeling, optimization and applications |
| title_full | Stochastic reliability modeling, optimization and applications editors, Syouji Nakamura, Toshio Nakagawa |
| title_fullStr | Stochastic reliability modeling, optimization and applications editors, Syouji Nakamura, Toshio Nakagawa |
| title_full_unstemmed | Stochastic reliability modeling, optimization and applications editors, Syouji Nakamura, Toshio Nakagawa |
| title_short | Stochastic reliability modeling, optimization and applications |
| title_sort | stochastic reliability modeling optimization and applications |
| topic | TECHNOLOGY & ENGINEERING / Quality Control bisacsh Mathematisches Modell Reliability (Engineering) Mathematical models Stochastic systems |
| topic_facet | TECHNOLOGY & ENGINEERING / Quality Control Mathematisches Modell Reliability (Engineering) Mathematical models Stochastic systems |
| url | http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=340622 |
| work_keys_str_mv | AT nakamurasyouji stochasticreliabilitymodelingoptimizationandapplications AT nakagawatoshio stochasticreliabilitymodelingoptimizationandapplications AT worldscientificfirm stochasticreliabilitymodelingoptimizationandapplications |