X-ray scattering from semiconductors:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
London
Imperial College Press
©2003
|
| Ausgabe: | 2nd ed |
| Schlagworte: | |
| Online-Zugang: | FAW01 FAW02 Volltext |
| Beschreibung: | Includes bibliographical references and index Copyright; Preface; Contents; 1 -- An Introduction to Semiconductor Materials; 2 -- An Introduction to X-Ray Scattering; 3 -- Equipment for Measuring Diffraction Patterns; 4 -- A Practical Guide to the Evaluation of Structural Parameters; Appendix 1; Subject Index This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection |
| Beschreibung: | 1 Online-Ressource (xiv, 299 pages) |
| ISBN: | 1860944582 9781860944581 |
Internformat
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| 500 | |a Includes bibliographical references and index | ||
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| 500 | |a This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection | ||
| 650 | 7 | |a SCIENCE / Physics / Nuclear |2 bisacsh | |
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Datensatz im Suchindex
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| author | Fewster, Paul F. |
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| dewey-full | 539.7222 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 539 - Modern physics |
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| dewey-tens | 530 - Physics |
| discipline | Physik |
| edition | 2nd ed |
| format | Electronic eBook |
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| id | DE-604.BV043081179 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:16:51Z |
| institution | BVB |
| isbn | 1860944582 9781860944581 |
| language | English |
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| spelling | Fewster, Paul F. Verfasser aut X-ray scattering from semiconductors Paul F. Fewster 2nd ed London Imperial College Press ©2003 1 Online-Ressource (xiv, 299 pages) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Copyright; Preface; Contents; 1 -- An Introduction to Semiconductor Materials; 2 -- An Introduction to X-Ray Scattering; 3 -- Equipment for Measuring Diffraction Patterns; 4 -- A Practical Guide to the Evaluation of Structural Parameters; Appendix 1; Subject Index This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection SCIENCE / Physics / Nuclear bisacsh SCIENCE / Physics / Atomic & Molecular bisacsh Semiconductors fast X-rays / Scattering fast Semiconductors cct X-rays / Scattering cct X-rays Scattering Semiconductors Halbleiter (DE-588)4022993-2 gnd rswk-swf Röntgenstreuung (DE-588)4178324-4 gnd rswk-swf Röntgenstreuung (DE-588)4178324-4 s Halbleiter (DE-588)4022993-2 s 1\p DE-604 http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=105165 Aggregator Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Fewster, Paul F. X-ray scattering from semiconductors SCIENCE / Physics / Nuclear bisacsh SCIENCE / Physics / Atomic & Molecular bisacsh Semiconductors fast X-rays / Scattering fast Semiconductors cct X-rays / Scattering cct X-rays Scattering Semiconductors Halbleiter (DE-588)4022993-2 gnd Röntgenstreuung (DE-588)4178324-4 gnd |
| subject_GND | (DE-588)4022993-2 (DE-588)4178324-4 |
| title | X-ray scattering from semiconductors |
| title_auth | X-ray scattering from semiconductors |
| title_exact_search | X-ray scattering from semiconductors |
| title_full | X-ray scattering from semiconductors Paul F. Fewster |
| title_fullStr | X-ray scattering from semiconductors Paul F. Fewster |
| title_full_unstemmed | X-ray scattering from semiconductors Paul F. Fewster |
| title_short | X-ray scattering from semiconductors |
| title_sort | x ray scattering from semiconductors |
| topic | SCIENCE / Physics / Nuclear bisacsh SCIENCE / Physics / Atomic & Molecular bisacsh Semiconductors fast X-rays / Scattering fast Semiconductors cct X-rays / Scattering cct X-rays Scattering Semiconductors Halbleiter (DE-588)4022993-2 gnd Röntgenstreuung (DE-588)4178324-4 gnd |
| topic_facet | SCIENCE / Physics / Nuclear SCIENCE / Physics / Atomic & Molecular Semiconductors X-rays / Scattering X-rays Scattering Halbleiter Röntgenstreuung |
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