Building a successful board-test strategy:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boston
Butterworth-Heinemann
©2001
|
| Ausgabe: | 2nd ed |
| Schriftenreihe: | Test and measurement world series
|
| Schlagworte: | |
| Online-Zugang: | FAW01 FAW02 Volltext |
| Beschreibung: | "Test & measurement world"--Cover. - Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002 Includes bibliographical references (pages 321-328) and index What is a test strategy? -- Test methods -- Inspection as test -- Guidelines for a cost-effective "test" operation -- Reducing test-generation pain with boundary scan -- The VMEbus extension for instrumentation -- Environmental-stress screening -- Evaluating real tester speeds -- Test-program development and simulation -- Test-strategy economics -- Formulating a board-test strategy -- Test-strategy decisions -- Conclusions Written in a clear and thoughtful style, Building a Successful Board-Test Strategy, Second Edition offers an integrated approach to the complicated process of developing the test strategies most suited to a company's profile and philosophy. This book also provides comprehensive coverage of the specifics of electronic test equipment as well as those broader issues of management and marketing that shape a manufacturer's "image of quality." In this new edition, the author adds still more "war stories," relevant examples from his own experience, which will guide his readers in their decisionmaking. He has also updated all technical aspects of the first edition, covering new device and attachment technologies, new inspection techniques including optical, infrared and x-ray, as well as vectorless methods for detecting surface-mount open-circuit board failures. The chapter on economics has been extensively revised, and the bibliography includes the latest material on this topic. *Discusses ball-grid arrays and other new devices and attachment technologies *Adds a comprehensive new chapter on optical, infrared, and x-ray inspection *Covers vectorless techniques for detecting surface-mount open-circuit board failures |
| Beschreibung: | 1 Online-Ressource (xi, 337 pages) |
| ISBN: | 0585470405 0750672803 9780585470405 9780750672801 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV043079510 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 151126s2001 |||| o||u| ||||||eng d | ||
| 020 | |a 0585470405 |9 0-585-47040-5 | ||
| 020 | |a 0750672803 |9 0-7506-7280-3 | ||
| 020 | |a 9780585470405 |9 978-0-585-47040-5 | ||
| 020 | |a 9780750672801 |9 978-0-7506-7280-1 | ||
| 035 | |a (OCoLC)53149239 | ||
| 035 | |a (DE-599)BVBBV043079510 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-1046 |a DE-1047 | ||
| 082 | 0 | |a 621.3815/310287 |2 22 | |
| 100 | 1 | |a Scheiber, Stephen F. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Building a successful board-test strategy |c Stephen F. Scheiber |
| 250 | |a 2nd ed | ||
| 264 | 1 | |a Boston |b Butterworth-Heinemann |c ©2001 | |
| 300 | |a 1 Online-Ressource (xi, 337 pages) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Test and measurement world series | |
| 500 | |a "Test & measurement world"--Cover. - Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002 | ||
| 500 | |a Includes bibliographical references (pages 321-328) and index | ||
| 500 | |a What is a test strategy? -- Test methods -- Inspection as test -- Guidelines for a cost-effective "test" operation -- Reducing test-generation pain with boundary scan -- The VMEbus extension for instrumentation -- Environmental-stress screening -- Evaluating real tester speeds -- Test-program development and simulation -- Test-strategy economics -- Formulating a board-test strategy -- Test-strategy decisions -- Conclusions | ||
| 500 | |a Written in a clear and thoughtful style, Building a Successful Board-Test Strategy, Second Edition offers an integrated approach to the complicated process of developing the test strategies most suited to a company's profile and philosophy. This book also provides comprehensive coverage of the specifics of electronic test equipment as well as those broader issues of management and marketing that shape a manufacturer's "image of quality." In this new edition, the author adds still more "war stories," relevant examples from his own experience, which will guide his readers in their decisionmaking. He has also updated all technical aspects of the first edition, covering new device and attachment technologies, new inspection techniques including optical, infrared and x-ray, as well as vectorless methods for detecting surface-mount open-circuit board failures. The chapter on economics has been extensively revised, and the bibliography includes the latest material on this topic. *Discusses ball-grid arrays and other new devices and attachment technologies *Adds a comprehensive new chapter on optical, infrared, and x-ray inspection *Covers vectorless techniques for detecting surface-mount open-circuit board failures | ||
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Electronics / Circuits / General |2 bisacsh | |
| 650 | 7 | |a Printed circuits / Testing |2 fast | |
| 650 | 7 | |a Printed circuits / Testing |2 cct | |
| 650 | 4 | |a Printed circuits |x Testing | |
| 650 | 0 | 7 | |a Gedruckte Schaltung |0 (DE-588)4019627-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Testen |0 (DE-588)4367264-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Mikroprozessor |0 (DE-588)4039232-6 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Gedruckte Schaltung |0 (DE-588)4019627-6 |D s |
| 689 | 0 | 1 | |a Mikroprozessor |0 (DE-588)4039232-6 |D s |
| 689 | 0 | 2 | |a Testen |0 (DE-588)4367264-4 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 856 | 4 | 0 | |u http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=92138 |x Aggregator |3 Volltext |
| 912 | |a ZDB-4-EBA | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-028503702 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 966 | e | |u http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=92138 |l FAW01 |p ZDB-4-EBA |q FAW_PDA_EBA |x Aggregator |3 Volltext | |
| 966 | e | |u http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=92138 |l FAW02 |p ZDB-4-EBA |q FAW_PDA_EBA |x Aggregator |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804175470441267200 |
|---|---|
| any_adam_object | |
| author | Scheiber, Stephen F. |
| author_facet | Scheiber, Stephen F. |
| author_role | aut |
| author_sort | Scheiber, Stephen F. |
| author_variant | s f s sf sfs |
| building | Verbundindex |
| bvnumber | BV043079510 |
| collection | ZDB-4-EBA |
| ctrlnum | (OCoLC)53149239 (DE-599)BVBBV043079510 |
| dewey-full | 621.3815/310287 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815/310287 |
| dewey-search | 621.3815/310287 |
| dewey-sort | 3621.3815 6310287 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| edition | 2nd ed |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>04163nmm a2200565zc 4500</leader><controlfield tag="001">BV043079510</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">151126s2001 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0585470405</subfield><subfield code="9">0-585-47040-5</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0750672803</subfield><subfield code="9">0-7506-7280-3</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780585470405</subfield><subfield code="9">978-0-585-47040-5</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780750672801</subfield><subfield code="9">978-0-7506-7280-1</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)53149239</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV043079510</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-1046</subfield><subfield code="a">DE-1047</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815/310287</subfield><subfield code="2">22</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Scheiber, Stephen F.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Building a successful board-test strategy</subfield><subfield code="c">Stephen F. Scheiber</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">2nd ed</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boston</subfield><subfield code="b">Butterworth-Heinemann</subfield><subfield code="c">©2001</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (xi, 337 pages)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Test and measurement world series</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">"Test & measurement world"--Cover. - Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references (pages 321-328) and index</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">What is a test strategy? -- Test methods -- Inspection as test -- Guidelines for a cost-effective "test" operation -- Reducing test-generation pain with boundary scan -- The VMEbus extension for instrumentation -- Environmental-stress screening -- Evaluating real tester speeds -- Test-program development and simulation -- Test-strategy economics -- Formulating a board-test strategy -- Test-strategy decisions -- Conclusions</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Written in a clear and thoughtful style, Building a Successful Board-Test Strategy, Second Edition offers an integrated approach to the complicated process of developing the test strategies most suited to a company's profile and philosophy. This book also provides comprehensive coverage of the specifics of electronic test equipment as well as those broader issues of management and marketing that shape a manufacturer's "image of quality." In this new edition, the author adds still more "war stories," relevant examples from his own experience, which will guide his readers in their decisionmaking. He has also updated all technical aspects of the first edition, covering new device and attachment technologies, new inspection techniques including optical, infrared and x-ray, as well as vectorless methods for detecting surface-mount open-circuit board failures. The chapter on economics has been extensively revised, and the bibliography includes the latest material on this topic. *Discusses ball-grid arrays and other new devices and attachment technologies *Adds a comprehensive new chapter on optical, infrared, and x-ray inspection *Covers vectorless techniques for detecting surface-mount open-circuit board failures</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TECHNOLOGY & ENGINEERING / Electronics / Circuits / General</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Printed circuits / Testing</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Printed circuits / Testing</subfield><subfield code="2">cct</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Printed circuits</subfield><subfield code="x">Testing</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Gedruckte Schaltung</subfield><subfield code="0">(DE-588)4019627-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikroprozessor</subfield><subfield code="0">(DE-588)4039232-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Gedruckte Schaltung</subfield><subfield code="0">(DE-588)4019627-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Mikroprozessor</subfield><subfield code="0">(DE-588)4039232-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=92138</subfield><subfield code="x">Aggregator</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-4-EBA</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-028503702</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=92138</subfield><subfield code="l">FAW01</subfield><subfield code="p">ZDB-4-EBA</subfield><subfield code="q">FAW_PDA_EBA</subfield><subfield code="x">Aggregator</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=92138</subfield><subfield code="l">FAW02</subfield><subfield code="p">ZDB-4-EBA</subfield><subfield code="q">FAW_PDA_EBA</subfield><subfield code="x">Aggregator</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV043079510 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:16:48Z |
| institution | BVB |
| isbn | 0585470405 0750672803 9780585470405 9780750672801 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-028503702 |
| oclc_num | 53149239 |
| open_access_boolean | |
| owner | DE-1046 DE-1047 |
| owner_facet | DE-1046 DE-1047 |
| physical | 1 Online-Ressource (xi, 337 pages) |
| psigel | ZDB-4-EBA ZDB-4-EBA FAW_PDA_EBA |
| publishDate | 2001 |
| publishDateSearch | 2001 |
| publishDateSort | 2001 |
| publisher | Butterworth-Heinemann |
| record_format | marc |
| series2 | Test and measurement world series |
| spelling | Scheiber, Stephen F. Verfasser aut Building a successful board-test strategy Stephen F. Scheiber 2nd ed Boston Butterworth-Heinemann ©2001 1 Online-Ressource (xi, 337 pages) txt rdacontent c rdamedia cr rdacarrier Test and measurement world series "Test & measurement world"--Cover. - Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002 Includes bibliographical references (pages 321-328) and index What is a test strategy? -- Test methods -- Inspection as test -- Guidelines for a cost-effective "test" operation -- Reducing test-generation pain with boundary scan -- The VMEbus extension for instrumentation -- Environmental-stress screening -- Evaluating real tester speeds -- Test-program development and simulation -- Test-strategy economics -- Formulating a board-test strategy -- Test-strategy decisions -- Conclusions Written in a clear and thoughtful style, Building a Successful Board-Test Strategy, Second Edition offers an integrated approach to the complicated process of developing the test strategies most suited to a company's profile and philosophy. This book also provides comprehensive coverage of the specifics of electronic test equipment as well as those broader issues of management and marketing that shape a manufacturer's "image of quality." In this new edition, the author adds still more "war stories," relevant examples from his own experience, which will guide his readers in their decisionmaking. He has also updated all technical aspects of the first edition, covering new device and attachment technologies, new inspection techniques including optical, infrared and x-ray, as well as vectorless methods for detecting surface-mount open-circuit board failures. The chapter on economics has been extensively revised, and the bibliography includes the latest material on this topic. *Discusses ball-grid arrays and other new devices and attachment technologies *Adds a comprehensive new chapter on optical, infrared, and x-ray inspection *Covers vectorless techniques for detecting surface-mount open-circuit board failures TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh Printed circuits / Testing fast Printed circuits / Testing cct Printed circuits Testing Gedruckte Schaltung (DE-588)4019627-6 gnd rswk-swf Testen (DE-588)4367264-4 gnd rswk-swf Mikroprozessor (DE-588)4039232-6 gnd rswk-swf Gedruckte Schaltung (DE-588)4019627-6 s Mikroprozessor (DE-588)4039232-6 s Testen (DE-588)4367264-4 s 1\p DE-604 http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=92138 Aggregator Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Scheiber, Stephen F. Building a successful board-test strategy TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh Printed circuits / Testing fast Printed circuits / Testing cct Printed circuits Testing Gedruckte Schaltung (DE-588)4019627-6 gnd Testen (DE-588)4367264-4 gnd Mikroprozessor (DE-588)4039232-6 gnd |
| subject_GND | (DE-588)4019627-6 (DE-588)4367264-4 (DE-588)4039232-6 |
| title | Building a successful board-test strategy |
| title_auth | Building a successful board-test strategy |
| title_exact_search | Building a successful board-test strategy |
| title_full | Building a successful board-test strategy Stephen F. Scheiber |
| title_fullStr | Building a successful board-test strategy Stephen F. Scheiber |
| title_full_unstemmed | Building a successful board-test strategy Stephen F. Scheiber |
| title_short | Building a successful board-test strategy |
| title_sort | building a successful board test strategy |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh Printed circuits / Testing fast Printed circuits / Testing cct Printed circuits Testing Gedruckte Schaltung (DE-588)4019627-6 gnd Testen (DE-588)4367264-4 gnd Mikroprozessor (DE-588)4039232-6 gnd |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Circuits / General Printed circuits / Testing Printed circuits Testing Gedruckte Schaltung Testen Mikroprozessor |
| url | http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=92138 |
| work_keys_str_mv | AT scheiberstephenf buildingasuccessfulboardteststrategy |