ISTFA '97: proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Materials Park, OH
ASM International
c1997
|
| Schlagworte: | |
| Online-Zugang: | FAW01 FAW02 Volltext |
| Beschreibung: | "Manager of Book Production Grace M. Davidson." Includes bibliographical references and index |
| Beschreibung: | 1 Online-Ressource (xix, 346 p.) |
| ISBN: | 0871706199 1615030824 9780871706195 9781615030828 |
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Datensatz im Suchindex
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| isbn | 0871706199 1615030824 9780871706195 9781615030828 |
| language | English |
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| spelling | International Symposium for Testing and Failure Analysis < 1997, Santa Clara, Calif.> Verfasser aut ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California sponsored by ASM International 23rd international symposium for testing and failure analysis Materials Park, OH ASM International c1997 1 Online-Ressource (xix, 346 p.) txt rdacontent c rdamedia cr rdacarrier "Manager of Book Production Grace M. Davidson." Includes bibliographical references and index TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Prüftechnik (DE-588)4047610-8 gnd rswk-swf Elektronik (DE-588)4014346-6 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Elektronik (DE-588)4014346-6 s Prüftechnik (DE-588)4047610-8 s DE-604 Davidson, Grace M. Sonstige oth ASM International Sonstige oth http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=395816 Aggregator Volltext |
| spellingShingle | ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Prüftechnik (DE-588)4047610-8 gnd Elektronik (DE-588)4014346-6 gnd |
| subject_GND | (DE-588)4047610-8 (DE-588)4014346-6 (DE-588)1071861417 |
| title | ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California |
| title_alt | 23rd international symposium for testing and failure analysis |
| title_auth | ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California |
| title_exact_search | ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California |
| title_full | ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California sponsored by ASM International |
| title_fullStr | ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California sponsored by ASM International |
| title_full_unstemmed | ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California sponsored by ASM International |
| title_short | ISTFA '97 |
| title_sort | istfa 97 proceedings of the 23rd international symposium for testing and failure analysis 27 31 october 1997 santa clara convention center santa clara california |
| title_sub | proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh Electronic apparatus and appliances / Testing fast Electronics / Materials / Testing fast Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Prüftechnik (DE-588)4047610-8 gnd Elektronik (DE-588)4014346-6 gnd |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Circuits / General TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated Electronic apparatus and appliances / Testing Electronics / Materials / Testing Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Prüftechnik Elektronik Konferenzschrift |
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