In-situ electron microscopy at high resolution:
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Singapore
World Scientific Pub. Co.
c2008
|
| Schlagworte: | |
| Online-Zugang: | FAW01 FAW02 Volltext |
| Beschreibung: | Includes bibliographical references and index Ch. 1. Introduction to in-situ electron microscopy / Florian Banhart -- ch. 2. Observation of dynamic processes using environmental transmission or scanning transmission electron microscopy / Renu Sharma -- ch. 3. In-situ high-resolution observation of solid-solid, solid-liquid and solid-gas reactions / Hiroyasu Saka -- ch. 4. In-situ transmission electron microscopy: nanoindentation and straining experiments / Wouter A. Soer and Jeff T. De Hosson -- ch. 5. In-situ HRTEM studies of interface dynamics during solid-solid phase transformations in metal alloys / James M. Howe -- ch. 6. In-situ TEM of filled nanotubes: heating, electron irradiation, electrical and mechanical probing / Dmitri Golberg and Yoshio Bando -- ch. 7. In-situ ion and electron beam effects on the fabrication and analysis of nanomaterials / Kazuo Furuya, Minghui Song, and Masayuki Shimojo -- ch. 8. Electron irradiation of nanomaterials in the electron microscope / Florian Banhart -- ch. 9. In-situ observation of atomic defects in carbon nanostructures / Kazu Suenaga In-situ high-resolution electron microscopy is a modern and powerful technique in materials research, physics, and chemistry. In-situ techniques are hardly treated in textbooks of electron microscopy. Thus, there is a need to collect the present knowledge about the techniques and achievements of in-situ electron microscopy in one book. Since high-resolution electron microscopes are available in most modern laboratories of materials science, more and more scientists or students are starting to work on this subject. In this comprehensive volume, the most important techniques and achievements of in-situ high-resolution electron microscopy will be reviewed by renowned experts. Applications in several fields of materials science will also be demonstrated |
| Beschreibung: | 1 Online-Ressource (vi, 311 p.) |
| ISBN: | 9789812797346 9812797343 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV043070069 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 151126s2008 |||| o||u| ||||||eng d | ||
| 020 | |a 9789812797346 |c electronic bk. |9 978-981-279-734-6 | ||
| 020 | |a 9812797343 |c electronic bk. |9 981-279-734-3 | ||
| 035 | |a (OCoLC)747539683 | ||
| 035 | |a (DE-599)BVBBV043070069 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-1046 |a DE-1047 | ||
| 082 | 0 | |a 502.825 |2 22 | |
| 245 | 1 | 0 | |a In-situ electron microscopy at high resolution |c editor, Florian Banhart |
| 264 | 1 | |a Singapore |b World Scientific Pub. Co. |c c2008 | |
| 300 | |a 1 Online-Ressource (vi, 311 p.) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Includes bibliographical references and index | ||
| 500 | |a Ch. 1. Introduction to in-situ electron microscopy / Florian Banhart -- ch. 2. Observation of dynamic processes using environmental transmission or scanning transmission electron microscopy / Renu Sharma -- ch. 3. In-situ high-resolution observation of solid-solid, solid-liquid and solid-gas reactions / Hiroyasu Saka -- ch. 4. In-situ transmission electron microscopy: nanoindentation and straining experiments / Wouter A. Soer and Jeff T. De Hosson -- ch. 5. In-situ HRTEM studies of interface dynamics during solid-solid phase transformations in metal alloys / James M. Howe -- ch. 6. In-situ TEM of filled nanotubes: heating, electron irradiation, electrical and mechanical probing / Dmitri Golberg and Yoshio Bando -- ch. 7. In-situ ion and electron beam effects on the fabrication and analysis of nanomaterials / Kazuo Furuya, Minghui Song, and Masayuki Shimojo -- ch. 8. Electron irradiation of nanomaterials in the electron microscope / Florian Banhart -- ch. 9. In-situ observation of atomic defects in carbon nanostructures / Kazu Suenaga | ||
| 500 | |a In-situ high-resolution electron microscopy is a modern and powerful technique in materials research, physics, and chemistry. In-situ techniques are hardly treated in textbooks of electron microscopy. Thus, there is a need to collect the present knowledge about the techniques and achievements of in-situ electron microscopy in one book. Since high-resolution electron microscopes are available in most modern laboratories of materials science, more and more scientists or students are starting to work on this subject. In this comprehensive volume, the most important techniques and achievements of in-situ high-resolution electron microscopy will be reviewed by renowned experts. Applications in several fields of materials science will also be demonstrated | ||
| 650 | 7 | |a SCIENCE / Electron Microscopes & Microscopy |2 bisacsh | |
| 650 | 7 | |a Electron microscopy / Technique |2 fast | |
| 650 | 7 | |a High resolution electron microscopy |2 fast | |
| 650 | 4 | |a Electron microscopy |x Technique | |
| 650 | 4 | |a High resolution electron microscopy | |
| 650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Hochauflösendes Verfahren |0 (DE-588)4287503-1 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a In situ |0 (DE-588)4293230-0 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
| 689 | 0 | 1 | |a In situ |0 (DE-588)4293230-0 |D s |
| 689 | 0 | 2 | |a Hochauflösendes Verfahren |0 (DE-588)4287503-1 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 700 | 1 | |a Banhart, Florian |e Sonstige |4 oth | |
| 710 | 2 | |a World Scientific (Firm) |e Sonstige |4 oth | |
| 856 | 4 | 0 | |u http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=521202 |x Aggregator |3 Volltext |
| 912 | |a ZDB-4-EBA | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-028494261 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 966 | e | |u http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=521202 |l FAW01 |p ZDB-4-EBA |q FAW_PDA_EBA |x Aggregator |3 Volltext | |
| 966 | e | |u http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=521202 |l FAW02 |p ZDB-4-EBA |q FAW_PDA_EBA |x Aggregator |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804175452483354624 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV043070069 |
| collection | ZDB-4-EBA |
| ctrlnum | (OCoLC)747539683 (DE-599)BVBBV043070069 |
| dewey-full | 502.825 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502.825 |
| dewey-search | 502.825 |
| dewey-sort | 3502.825 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>04079nmm a2200529zc 4500</leader><controlfield tag="001">BV043070069</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">151126s2008 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9789812797346</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">978-981-279-734-6</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9812797343</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">981-279-734-3</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)747539683</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV043070069</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-1046</subfield><subfield code="a">DE-1047</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">502.825</subfield><subfield code="2">22</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">In-situ electron microscopy at high resolution</subfield><subfield code="c">editor, Florian Banhart</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Singapore</subfield><subfield code="b">World Scientific Pub. Co.</subfield><subfield code="c">c2008</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (vi, 311 p.)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Ch. 1. Introduction to in-situ electron microscopy / Florian Banhart -- ch. 2. Observation of dynamic processes using environmental transmission or scanning transmission electron microscopy / Renu Sharma -- ch. 3. In-situ high-resolution observation of solid-solid, solid-liquid and solid-gas reactions / Hiroyasu Saka -- ch. 4. In-situ transmission electron microscopy: nanoindentation and straining experiments / Wouter A. Soer and Jeff T. De Hosson -- ch. 5. In-situ HRTEM studies of interface dynamics during solid-solid phase transformations in metal alloys / James M. Howe -- ch. 6. In-situ TEM of filled nanotubes: heating, electron irradiation, electrical and mechanical probing / Dmitri Golberg and Yoshio Bando -- ch. 7. In-situ ion and electron beam effects on the fabrication and analysis of nanomaterials / Kazuo Furuya, Minghui Song, and Masayuki Shimojo -- ch. 8. Electron irradiation of nanomaterials in the electron microscope / Florian Banhart -- ch. 9. In-situ observation of atomic defects in carbon nanostructures / Kazu Suenaga</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">In-situ high-resolution electron microscopy is a modern and powerful technique in materials research, physics, and chemistry. In-situ techniques are hardly treated in textbooks of electron microscopy. Thus, there is a need to collect the present knowledge about the techniques and achievements of in-situ electron microscopy in one book. Since high-resolution electron microscopes are available in most modern laboratories of materials science, more and more scientists or students are starting to work on this subject. In this comprehensive volume, the most important techniques and achievements of in-situ high-resolution electron microscopy will be reviewed by renowned experts. Applications in several fields of materials science will also be demonstrated</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">SCIENCE / Electron Microscopes & Microscopy</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Electron microscopy / Technique</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">High resolution electron microscopy</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron microscopy</subfield><subfield code="x">Technique</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">High resolution electron microscopy</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Hochauflösendes Verfahren</subfield><subfield code="0">(DE-588)4287503-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">In situ</subfield><subfield code="0">(DE-588)4293230-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">In situ</subfield><subfield code="0">(DE-588)4293230-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Hochauflösendes Verfahren</subfield><subfield code="0">(DE-588)4287503-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Banhart, Florian</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">World Scientific (Firm)</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=521202</subfield><subfield code="x">Aggregator</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-4-EBA</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-028494261</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=521202</subfield><subfield code="l">FAW01</subfield><subfield code="p">ZDB-4-EBA</subfield><subfield code="q">FAW_PDA_EBA</subfield><subfield code="x">Aggregator</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=521202</subfield><subfield code="l">FAW02</subfield><subfield code="p">ZDB-4-EBA</subfield><subfield code="q">FAW_PDA_EBA</subfield><subfield code="x">Aggregator</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV043070069 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:16:31Z |
| institution | BVB |
| isbn | 9789812797346 9812797343 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-028494261 |
| oclc_num | 747539683 |
| open_access_boolean | |
| owner | DE-1046 DE-1047 |
| owner_facet | DE-1046 DE-1047 |
| physical | 1 Online-Ressource (vi, 311 p.) |
| psigel | ZDB-4-EBA ZDB-4-EBA FAW_PDA_EBA |
| publishDate | 2008 |
| publishDateSearch | 2008 |
| publishDateSort | 2008 |
| publisher | World Scientific Pub. Co. |
| record_format | marc |
| spelling | In-situ electron microscopy at high resolution editor, Florian Banhart Singapore World Scientific Pub. Co. c2008 1 Online-Ressource (vi, 311 p.) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Ch. 1. Introduction to in-situ electron microscopy / Florian Banhart -- ch. 2. Observation of dynamic processes using environmental transmission or scanning transmission electron microscopy / Renu Sharma -- ch. 3. In-situ high-resolution observation of solid-solid, solid-liquid and solid-gas reactions / Hiroyasu Saka -- ch. 4. In-situ transmission electron microscopy: nanoindentation and straining experiments / Wouter A. Soer and Jeff T. De Hosson -- ch. 5. In-situ HRTEM studies of interface dynamics during solid-solid phase transformations in metal alloys / James M. Howe -- ch. 6. In-situ TEM of filled nanotubes: heating, electron irradiation, electrical and mechanical probing / Dmitri Golberg and Yoshio Bando -- ch. 7. In-situ ion and electron beam effects on the fabrication and analysis of nanomaterials / Kazuo Furuya, Minghui Song, and Masayuki Shimojo -- ch. 8. Electron irradiation of nanomaterials in the electron microscope / Florian Banhart -- ch. 9. In-situ observation of atomic defects in carbon nanostructures / Kazu Suenaga In-situ high-resolution electron microscopy is a modern and powerful technique in materials research, physics, and chemistry. In-situ techniques are hardly treated in textbooks of electron microscopy. Thus, there is a need to collect the present knowledge about the techniques and achievements of in-situ electron microscopy in one book. Since high-resolution electron microscopes are available in most modern laboratories of materials science, more and more scientists or students are starting to work on this subject. In this comprehensive volume, the most important techniques and achievements of in-situ high-resolution electron microscopy will be reviewed by renowned experts. Applications in several fields of materials science will also be demonstrated SCIENCE / Electron Microscopes & Microscopy bisacsh Electron microscopy / Technique fast High resolution electron microscopy fast Electron microscopy Technique High resolution electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Hochauflösendes Verfahren (DE-588)4287503-1 gnd rswk-swf In situ (DE-588)4293230-0 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s In situ (DE-588)4293230-0 s Hochauflösendes Verfahren (DE-588)4287503-1 s 1\p DE-604 Banhart, Florian Sonstige oth World Scientific (Firm) Sonstige oth http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=521202 Aggregator Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | In-situ electron microscopy at high resolution SCIENCE / Electron Microscopes & Microscopy bisacsh Electron microscopy / Technique fast High resolution electron microscopy fast Electron microscopy Technique High resolution electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd Hochauflösendes Verfahren (DE-588)4287503-1 gnd In situ (DE-588)4293230-0 gnd |
| subject_GND | (DE-588)4014327-2 (DE-588)4287503-1 (DE-588)4293230-0 |
| title | In-situ electron microscopy at high resolution |
| title_auth | In-situ electron microscopy at high resolution |
| title_exact_search | In-situ electron microscopy at high resolution |
| title_full | In-situ electron microscopy at high resolution editor, Florian Banhart |
| title_fullStr | In-situ electron microscopy at high resolution editor, Florian Banhart |
| title_full_unstemmed | In-situ electron microscopy at high resolution editor, Florian Banhart |
| title_short | In-situ electron microscopy at high resolution |
| title_sort | in situ electron microscopy at high resolution |
| topic | SCIENCE / Electron Microscopes & Microscopy bisacsh Electron microscopy / Technique fast High resolution electron microscopy fast Electron microscopy Technique High resolution electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd Hochauflösendes Verfahren (DE-588)4287503-1 gnd In situ (DE-588)4293230-0 gnd |
| topic_facet | SCIENCE / Electron Microscopes & Microscopy Electron microscopy / Technique High resolution electron microscopy Electron microscopy Technique Elektronenmikroskopie Hochauflösendes Verfahren In situ |
| url | http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=521202 |
| work_keys_str_mv | AT banhartflorian insituelectronmicroscopyathighresolution AT worldscientificfirm insituelectronmicroscopyathighresolution |