Testing of digital systems:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Cambridge
Cambridge University Press
2003
|
| Schlagworte: | |
| Online-Zugang: | FAW01 FAW02 Volltext |
| Beschreibung: | Includes bibliographical references and index 1 - Introduction - Ad van de Goor -- - 2 - Fault models -- - 3 - Combinational logic and fault simulation -- - 4 - Test generation for combinational circuits -- - 5 - Sequential ATPG -- - 6 - I[subscript DDQ] testing -- - 7 - Functional testing -- - 8 - Delay fault testing -- - 9 - CMOS testing -- - 10 - Fault diagnosis -- - 11 - Design for testability -- - 12 - Built-in-self-test -- - 13 - Synthesis for testability -- - 14 - Memory testing - Ad van de Goor -- - 15 - High-level test synthesis -- - 16 - System-on-a-chip test synthesis The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about how to test semiconductor devices and systems. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference |
| Beschreibung: | 1 Online-Ressource (xvi, 1000 pages) |
| ISBN: | 0511076169 0511077734 0511816324 0521773563 9780511076169 9780511077739 9780511816321 9780521773560 |
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Datensatz im Suchindex
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| dewey-full | 621.381548 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
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| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
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| indexdate | 2024-07-10T07:16:30Z |
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| language | English |
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| spelling | Jha, Niraj K. Verfasser aut Testing of digital systems N.K. Jha and S. Gupta Cambridge Cambridge University Press 2003 1 Online-Ressource (xvi, 1000 pages) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index 1 - Introduction - Ad van de Goor -- - 2 - Fault models -- - 3 - Combinational logic and fault simulation -- - 4 - Test generation for combinational circuits -- - 5 - Sequential ATPG -- - 6 - I[subscript DDQ] testing -- - 7 - Functional testing -- - 8 - Delay fault testing -- - 9 - CMOS testing -- - 10 - Fault diagnosis -- - 11 - Design for testability -- - 12 - Built-in-self-test -- - 13 - Synthesis for testability -- - 14 - Memory testing - Ad van de Goor -- - 15 - High-level test synthesis -- - 16 - System-on-a-chip test synthesis The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about how to test semiconductor devices and systems. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh Digital integrated circuits / Testing fast Digital integrated circuits Testing Test (DE-588)4059549-3 gnd rswk-swf Digitale integrierte Schaltung (DE-588)4113313-4 gnd rswk-swf Digitale integrierte Schaltung (DE-588)4113313-4 s Test (DE-588)4059549-3 s 1\p DE-604 Gupta, S. Sonstige oth http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=125045 Aggregator Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Jha, Niraj K. Testing of digital systems TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh Digital integrated circuits / Testing fast Digital integrated circuits Testing Test (DE-588)4059549-3 gnd Digitale integrierte Schaltung (DE-588)4113313-4 gnd |
| subject_GND | (DE-588)4059549-3 (DE-588)4113313-4 |
| title | Testing of digital systems |
| title_auth | Testing of digital systems |
| title_exact_search | Testing of digital systems |
| title_full | Testing of digital systems N.K. Jha and S. Gupta |
| title_fullStr | Testing of digital systems N.K. Jha and S. Gupta |
| title_full_unstemmed | Testing of digital systems N.K. Jha and S. Gupta |
| title_short | Testing of digital systems |
| title_sort | testing of digital systems |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh Digital integrated circuits / Testing fast Digital integrated circuits Testing Test (DE-588)4059549-3 gnd Digitale integrierte Schaltung (DE-588)4113313-4 gnd |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated TECHNOLOGY & ENGINEERING / Electronics / Circuits / General Digital integrated circuits / Testing Digital integrated circuits Testing Test Digitale integrierte Schaltung |
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