Principles of semiconductor network testing:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boston
Butterworth-Heinemann
c1995
|
| Schlagworte: | |
| Online-Zugang: | FAW01 FAW02 Volltext |
| Beschreibung: | Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002 Includes bibliographical references and index Front Cover; Principles of Semiconductor Network Testing; Copyright Page; Contents; Foreword; Preface; Chapter 1. Diode and Transistor Operation; Chapter 2. Integrated Circuit Test Basics; Chapter 3. Digital Logic Test; Chapter 4. Noise Identification; Chapter 5. Operational Amplifier; Chapter 6. Data Acquisition Devices; Chapter 7. Digital Signal Processing; Chapter 8. CODEC (Coder/Decoder); Index This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources |
| Beschreibung: | 1 Online-Ressource (xiv, 213 p.) |
| ISBN: | 0080539564 9780080539560 9780750694728 |
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| 500 | |a Includes bibliographical references and index | ||
| 500 | |a Front Cover; Principles of Semiconductor Network Testing; Copyright Page; Contents; Foreword; Preface; Chapter 1. Diode and Transistor Operation; Chapter 2. Integrated Circuit Test Basics; Chapter 3. Digital Logic Test; Chapter 4. Noise Identification; Chapter 5. Operational Amplifier; Chapter 6. Data Acquisition Devices; Chapter 7. Digital Signal Processing; Chapter 8. CODEC (Coder/Decoder); Index | ||
| 500 | |a This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources | ||
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| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
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| id | DE-604.BV043043878 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:15:49Z |
| institution | BVB |
| isbn | 0080539564 9780080539560 9780750694728 |
| language | English |
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| physical | 1 Online-Ressource (xiv, 213 p.) |
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| publishDate | 1995 |
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| publisher | Butterworth-Heinemann |
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| spelling | Afshar, Amir Verfasser aut Principles of semiconductor network testing Amir Afshar Boston Butterworth-Heinemann c1995 1 Online-Ressource (xiv, 213 p.) txt rdacontent c rdamedia cr rdacarrier Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002 Includes bibliographical references and index Front Cover; Principles of Semiconductor Network Testing; Copyright Page; Contents; Foreword; Preface; Chapter 1. Diode and Transistor Operation; Chapter 2. Integrated Circuit Test Basics; Chapter 3. Digital Logic Test; Chapter 4. Noise Identification; Chapter 5. Operational Amplifier; Chapter 6. Data Acquisition Devices; Chapter 7. Digital Signal Processing; Chapter 8. CODEC (Coder/Decoder); Index This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh Integrated circuits / Testing fast Semiconductors / Testing fast Integrated circuits Testing Semiconductors Testing Erscheint auch als Druckausgabe 0-7506-9472-6 http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=205737 Aggregator Volltext |
| spellingShingle | Afshar, Amir Principles of semiconductor network testing TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh Integrated circuits / Testing fast Semiconductors / Testing fast Integrated circuits Testing Semiconductors Testing |
| title | Principles of semiconductor network testing |
| title_auth | Principles of semiconductor network testing |
| title_exact_search | Principles of semiconductor network testing |
| title_full | Principles of semiconductor network testing Amir Afshar |
| title_fullStr | Principles of semiconductor network testing Amir Afshar |
| title_full_unstemmed | Principles of semiconductor network testing Amir Afshar |
| title_short | Principles of semiconductor network testing |
| title_sort | principles of semiconductor network testing |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh Integrated circuits / Testing fast Semiconductors / Testing fast Integrated circuits Testing Semiconductors Testing |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated TECHNOLOGY & ENGINEERING / Electronics / Circuits / General Integrated circuits / Testing Semiconductors / Testing Integrated circuits Testing Semiconductors Testing |
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