High-resolution electron microscopy:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Oxford
Oxford University Press
2013
|
| Ausgabe: | Fourth edition |
| Schlagworte: | |
| Online-Zugang: | FAW01 FAW02 Volltext |
| Beschreibung: | Description based on print version record |
| Beschreibung: | 1 online resource (xix, 406 pages) illustrations (some color) |
| ISBN: | 0191508403 019174932X 0199668639 9780191508400 9780191749322 9780199668632 |
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| author | Spence, John C. H. |
| author_facet | Spence, John C. H. |
| author_role | aut |
| author_sort | Spence, John C. H. |
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| contents | In the 4th edition, applications sections have been updated including the semiconductor industry, superconductor research solid state chemistry and nanoscience, and metallurgy mineralogy, condensed matter physics, materials science and material on cryo-electron microscopy for structural biology. New or expanded sections have been added on electron holography aberration correction, field-emission guns, imaging filters super-resolution methods, Ptychography, Ronchigrams, tomography image quantification and simulation, and more |
| ctrlnum | (OCoLC)862086211 (DE-599)BVBBV043028950 |
| dewey-full | 502.825 |
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| dewey-ones | 502 - Miscellany |
| dewey-raw | 502.825 |
| dewey-search | 502.825 |
| dewey-sort | 3502.825 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft |
| edition | Fourth edition |
| format | Electronic eBook |
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| illustrated | Illustrated |
| indexdate | 2024-07-10T07:15:25Z |
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| isbn | 0191508403 019174932X 0199668639 9780191508400 9780191749322 9780199668632 |
| language | English |
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| spelling | Spence, John C. H. Verfasser aut Experimental high-resolution electron microscopy High-resolution electron microscopy John C.H. Spence, Department of Physics and Astronomy, Arizona State University/LBNL, California Fourth edition Oxford Oxford University Press 2013 1 online resource (xix, 406 pages) illustrations (some color) txt rdacontent c rdamedia cr rdacarrier Description based on print version record In the 4th edition, applications sections have been updated including the semiconductor industry, superconductor research solid state chemistry and nanoscience, and metallurgy mineralogy, condensed matter physics, materials science and material on cryo-electron microscopy for structural biology. New or expanded sections have been added on electron holography aberration correction, field-emission guns, imaging filters super-resolution methods, Ptychography, Ronchigrams, tomography image quantification and simulation, and more SCIENCE / General bisacsh High resolution electron microscopy fast Electron microscopy fast High resolution electron microscopy Electron microscopy Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Festkörper (DE-588)4016918-2 gnd rswk-swf Elektronenbeugung (DE-588)4151862-7 gnd rswk-swf Struktur (DE-588)4058125-1 gnd rswk-swf Hochauflösendes Verfahren (DE-588)4287503-1 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s Hochauflösendes Verfahren (DE-588)4287503-1 s 1\p DE-604 Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 s 2\p DE-604 Struktur (DE-588)4058125-1 s 3\p DE-604 Festkörper (DE-588)4016918-2 s 4\p DE-604 Elektronenbeugung (DE-588)4151862-7 s 5\p DE-604 Erscheint auch als Druck-Ausgabe Spence, John C H., author. High-resolution electron microscopy http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=644615 Aggregator Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 5\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Spence, John C. H. High-resolution electron microscopy In the 4th edition, applications sections have been updated including the semiconductor industry, superconductor research solid state chemistry and nanoscience, and metallurgy mineralogy, condensed matter physics, materials science and material on cryo-electron microscopy for structural biology. New or expanded sections have been added on electron holography aberration correction, field-emission guns, imaging filters super-resolution methods, Ptychography, Ronchigrams, tomography image quantification and simulation, and more SCIENCE / General bisacsh High resolution electron microscopy fast Electron microscopy fast High resolution electron microscopy Electron microscopy Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Festkörper (DE-588)4016918-2 gnd Elektronenbeugung (DE-588)4151862-7 gnd Struktur (DE-588)4058125-1 gnd Hochauflösendes Verfahren (DE-588)4287503-1 gnd |
| subject_GND | (DE-588)4215608-7 (DE-588)4014327-2 (DE-588)4016918-2 (DE-588)4151862-7 (DE-588)4058125-1 (DE-588)4287503-1 |
| title | High-resolution electron microscopy |
| title_alt | Experimental high-resolution electron microscopy |
| title_auth | High-resolution electron microscopy |
| title_exact_search | High-resolution electron microscopy |
| title_full | High-resolution electron microscopy John C.H. Spence, Department of Physics and Astronomy, Arizona State University/LBNL, California |
| title_fullStr | High-resolution electron microscopy John C.H. Spence, Department of Physics and Astronomy, Arizona State University/LBNL, California |
| title_full_unstemmed | High-resolution electron microscopy John C.H. Spence, Department of Physics and Astronomy, Arizona State University/LBNL, California |
| title_short | High-resolution electron microscopy |
| title_sort | high resolution electron microscopy |
| topic | SCIENCE / General bisacsh High resolution electron microscopy fast Electron microscopy fast High resolution electron microscopy Electron microscopy Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Festkörper (DE-588)4016918-2 gnd Elektronenbeugung (DE-588)4151862-7 gnd Struktur (DE-588)4058125-1 gnd Hochauflösendes Verfahren (DE-588)4287503-1 gnd |
| topic_facet | SCIENCE / General High resolution electron microscopy Electron microscopy Durchstrahlungselektronenmikroskopie Elektronenmikroskopie Festkörper Elektronenbeugung Struktur Hochauflösendes Verfahren |
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| work_keys_str_mv | AT spencejohnch experimentalhighresolutionelectronmicroscopy AT spencejohnch highresolutionelectronmicroscopy |