Reliability prediction from burn-in data fit to reliability models:
Gespeichert in:
| 1. Verfasser: | |
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| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
London, [England]
Elsevier
2014
|
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | Includes bibliographical references and index This work will educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level. This book will combine the knowledge taught in many reliability publications and illustrate how to use the knowledge presented by the semiconductor manufacturing companies in combination with the HTOL end-of-life testing that is currently performed by the chip suppliers as part of their standard qualification procedure and make accurate reliability predictions |
| Beschreibung: | 1 Online-Ressource (108 pages) |
| ISBN: | 9780128008195 0128008199 9780128007471 1306490383 9781306490382 |
Internformat
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| 100 | 1 | |a Bernstein, Joseph B. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Reliability prediction from burn-in data fit to reliability models |c Joseph B. Bernstein |
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| 500 | |a Includes bibliographical references and index | ||
| 500 | |a This work will educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level. This book will combine the knowledge taught in many reliability publications and illustrate how to use the knowledge presented by the semiconductor manufacturing companies in combination with the HTOL end-of-life testing that is currently performed by the chip suppliers as part of their standard qualification procedure and make accurate reliability predictions | ||
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Datensatz im Suchindex
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| author | Bernstein, Joseph B. |
| author_facet | Bernstein, Joseph B. |
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| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 628 - Sanitary engineering |
| dewey-raw | 628.3815 |
| dewey-search | 628.3815 |
| dewey-sort | 3628.3815 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Bauingenieurwesen |
| format | Electronic eBook |
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| id | DE-604.BV042973468 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:14:10Z |
| institution | BVB |
| isbn | 9780128008195 0128008199 9780128007471 1306490383 9781306490382 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-028399223 |
| oclc_num | 878140693 |
| open_access_boolean | |
| physical | 1 Online-Ressource (108 pages) |
| psigel | ZDB-33-ESD ZDB-33-EBS FLA_PDA_ESD |
| publishDate | 2014 |
| publishDateSearch | 2014 |
| publishDateSort | 2014 |
| publisher | Elsevier |
| record_format | marc |
| spelling | Bernstein, Joseph B. Verfasser aut Reliability prediction from burn-in data fit to reliability models Joseph B. Bernstein London, [England] Elsevier 2014 1 Online-Ressource (108 pages) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index This work will educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level. This book will combine the knowledge taught in many reliability publications and illustrate how to use the knowledge presented by the semiconductor manufacturing companies in combination with the HTOL end-of-life testing that is currently performed by the chip suppliers as part of their standard qualification procedure and make accurate reliability predictions TECHNOLOGY & ENGINEERING / Environmental / General bisacsh Constraint programming (Computer science) fast Database management fast Logic programming fast Reliability (Engineering) fast Constraint programming (Computer science) Database management Logic programming Reliability (Engineering) http://www.sciencedirect.com/science/book/9780128007471 Verlag Volltext |
| spellingShingle | Bernstein, Joseph B. Reliability prediction from burn-in data fit to reliability models TECHNOLOGY & ENGINEERING / Environmental / General bisacsh Constraint programming (Computer science) fast Database management fast Logic programming fast Reliability (Engineering) fast Constraint programming (Computer science) Database management Logic programming Reliability (Engineering) |
| title | Reliability prediction from burn-in data fit to reliability models |
| title_auth | Reliability prediction from burn-in data fit to reliability models |
| title_exact_search | Reliability prediction from burn-in data fit to reliability models |
| title_full | Reliability prediction from burn-in data fit to reliability models Joseph B. Bernstein |
| title_fullStr | Reliability prediction from burn-in data fit to reliability models Joseph B. Bernstein |
| title_full_unstemmed | Reliability prediction from burn-in data fit to reliability models Joseph B. Bernstein |
| title_short | Reliability prediction from burn-in data fit to reliability models |
| title_sort | reliability prediction from burn in data fit to reliability models |
| topic | TECHNOLOGY & ENGINEERING / Environmental / General bisacsh Constraint programming (Computer science) fast Database management fast Logic programming fast Reliability (Engineering) fast Constraint programming (Computer science) Database management Logic programming Reliability (Engineering) |
| topic_facet | TECHNOLOGY & ENGINEERING / Environmental / General Constraint programming (Computer science) Database management Logic programming Reliability (Engineering) |
| url | http://www.sciencedirect.com/science/book/9780128007471 |
| work_keys_str_mv | AT bernsteinjosephb reliabilitypredictionfromburnindatafittoreliabilitymodels |