Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis:
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Buch |
Sprache: | English |
Veröffentlicht: |
New York, NY
Springer
2010
|
Schlagworte: | |
Beschreibung: | Literaturverz. S. 317 - 322 |
Beschreibung: | XI, 330 S. zahlr. Ill., graph. Darst. |
ISBN: | 9780387857312 9781441946744 |
Internformat
MARC
LEADER | 00000nam a2200000 c 4500 | ||
---|---|---|---|
001 | BV042912990 | ||
003 | DE-604 | ||
005 | 00000000000000.0 | ||
007 | t | ||
008 | 151007s2010 ad|| |||| 00||| eng d | ||
020 | |a 9780387857312 |9 978-0-387-85731-2 | ||
020 | |a 9781441946744 |9 978-1-4419-4674-4 | ||
035 | |a (OCoLC)928729790 | ||
035 | |a (DE-599)BVBBV042912990 | ||
040 | |a DE-604 |b ger |e aacr | ||
041 | 0 | |a eng | |
049 | |a DE-29 | ||
050 | 0 | |a QH212.S3 | |
082 | 0 | |a 502.285 |2 22 | |
084 | |a UH 6300 |0 (DE-625)159498: |2 rvk | ||
084 | |a UH 6310 |0 (DE-625)159500: |2 rvk | ||
100 | 1 | |a Echlin, Patrick |e Verfasser |4 aut | |
245 | 1 | 0 | |a Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis |c Patrick Echlin |
264 | 1 | |a New York, NY |b Springer |c 2010 | |
300 | |a XI, 330 S. |b zahlr. Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
500 | |a Literaturverz. S. 317 - 322 | ||
650 | 4 | |a Scanning electron microscopy | |
650 | 4 | |a X-ray microanalysis | |
650 | 0 | 7 | |a Rasterelektronenmikroskopie |0 (DE-588)4048455-5 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Elektronenstrahlmikroanalyse |0 (DE-588)4151898-6 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a Rasterelektronenmikroskopie |0 (DE-588)4048455-5 |D s |
689 | 0 | |5 DE-604 | |
689 | 1 | 0 | |a Elektronenstrahlmikroanalyse |0 (DE-588)4151898-6 |D s |
689 | 1 | |5 DE-604 | |
999 | |a oai:aleph.bib-bvb.de:BVB01-028340723 |
Datensatz im Suchindex
_version_ | 1804175211953651713 |
---|---|
any_adam_object | |
author | Echlin, Patrick |
author_facet | Echlin, Patrick |
author_role | aut |
author_sort | Echlin, Patrick |
author_variant | p e pe |
building | Verbundindex |
bvnumber | BV042912990 |
callnumber-first | Q - Science |
callnumber-label | QH212 |
callnumber-raw | QH212.S3 |
callnumber-search | QH212.S3 |
callnumber-sort | QH 3212 S3 |
callnumber-subject | QH - Natural History and Biology |
classification_rvk | UH 6300 UH 6310 |
ctrlnum | (OCoLC)928729790 (DE-599)BVBBV042912990 |
dewey-full | 502.285 |
dewey-hundreds | 500 - Natural sciences and mathematics |
dewey-ones | 502 - Miscellany |
dewey-raw | 502.285 |
dewey-search | 502.285 |
dewey-sort | 3502.285 |
dewey-tens | 500 - Natural sciences and mathematics |
discipline | Allgemeine Naturwissenschaft Physik |
format | Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01429nam a2200421 c 4500</leader><controlfield tag="001">BV042912990</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">151007s2010 ad|| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780387857312</subfield><subfield code="9">978-0-387-85731-2</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781441946744</subfield><subfield code="9">978-1-4419-4674-4</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)928729790</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV042912990</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-29</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">QH212.S3</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">502.285</subfield><subfield code="2">22</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6300</subfield><subfield code="0">(DE-625)159498:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6310</subfield><subfield code="0">(DE-625)159500:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Echlin, Patrick</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis</subfield><subfield code="c">Patrick Echlin</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York, NY</subfield><subfield code="b">Springer</subfield><subfield code="c">2010</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XI, 330 S.</subfield><subfield code="b">zahlr. Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Literaturverz. S. 317 - 322</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Scanning electron microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">X-ray microanalysis</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Rasterelektronenmikroskopie</subfield><subfield code="0">(DE-588)4048455-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenstrahlmikroanalyse</subfield><subfield code="0">(DE-588)4151898-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Rasterelektronenmikroskopie</subfield><subfield code="0">(DE-588)4048455-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Elektronenstrahlmikroanalyse</subfield><subfield code="0">(DE-588)4151898-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-028340723</subfield></datafield></record></collection> |
id | DE-604.BV042912990 |
illustrated | Illustrated |
indexdate | 2024-07-10T07:12:41Z |
institution | BVB |
isbn | 9780387857312 9781441946744 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-028340723 |
oclc_num | 928729790 |
open_access_boolean | |
owner | DE-29 |
owner_facet | DE-29 |
physical | XI, 330 S. zahlr. Ill., graph. Darst. |
publishDate | 2010 |
publishDateSearch | 2010 |
publishDateSort | 2010 |
publisher | Springer |
record_format | marc |
spelling | Echlin, Patrick Verfasser aut Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis Patrick Echlin New York, NY Springer 2010 XI, 330 S. zahlr. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturverz. S. 317 - 322 Scanning electron microscopy X-ray microanalysis Rasterelektronenmikroskopie (DE-588)4048455-5 gnd rswk-swf Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 s DE-604 Elektronenstrahlmikroanalyse (DE-588)4151898-6 s |
spellingShingle | Echlin, Patrick Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis Scanning electron microscopy X-ray microanalysis Rasterelektronenmikroskopie (DE-588)4048455-5 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd |
subject_GND | (DE-588)4048455-5 (DE-588)4151898-6 |
title | Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis |
title_auth | Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis |
title_exact_search | Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis |
title_full | Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis Patrick Echlin |
title_fullStr | Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis Patrick Echlin |
title_full_unstemmed | Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis Patrick Echlin |
title_short | Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis |
title_sort | handbook of sample preparation for scanning electron microscopy and x ray microanalysis |
topic | Scanning electron microscopy X-ray microanalysis Rasterelektronenmikroskopie (DE-588)4048455-5 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd |
topic_facet | Scanning electron microscopy X-ray microanalysis Rasterelektronenmikroskopie Elektronenstrahlmikroanalyse |
work_keys_str_mv | AT echlinpatrick handbookofsamplepreparationforscanningelectronmicroscopyandxraymicroanalysis |