Lab-based in-situ X-ray microscopy: methodical developments and applications in materials science and microelectronics
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Abschlussarbeit Buch |
| Sprache: | English |
| Veröffentlicht: |
2015
|
| Schlagworte: | |
| Online-Zugang: | Volltext Volltext Volltext |
| Beschreibung: | XVI, 143 S. Ill., graph. Darst. |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV042827046 | ||
| 003 | DE-604 | ||
| 005 | 20160215 | ||
| 007 | t | ||
| 008 | 150911s2015 ad|| mm|| 00||| eng d | ||
| 035 | |a (OCoLC)923800094 | ||
| 035 | |a (DE-599)BVBBV042827046 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-634 |a DE-83 | ||
| 084 | |a ZM 3700 |0 (DE-625)157028: |2 rvk | ||
| 084 | |a ZM 3850 |0 (DE-625)157030: |2 rvk | ||
| 100 | 1 | |a Niese, Sven |e Verfasser |0 (DE-588)1082531235 |4 aut | |
| 245 | 1 | 0 | |a Lab-based in-situ X-ray microscopy |b methodical developments and applications in materials science and microelectronics |c vorgelegt von Sven Niese |
| 264 | 1 | |c 2015 | |
| 300 | |a XVI, 143 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 502 | |a Cottbus-Senftenberg, Techn. Univ., Diss., 2015 | ||
| 650 | 0 | 7 | |a Röntgenlinse |0 (DE-588)4252329-1 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Röntgenmikroskopie |0 (DE-588)4178315-3 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Rissausbreitung |0 (DE-588)4136911-7 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)4113937-9 |a Hochschulschrift |2 gnd-content | |
| 689 | 0 | 0 | |a Rissausbreitung |0 (DE-588)4136911-7 |D s |
| 689 | 0 | 1 | |a Röntgenlinse |0 (DE-588)4252329-1 |D s |
| 689 | 0 | 2 | |a Röntgenmikroskopie |0 (DE-588)4178315-3 |D s |
| 689 | 0 | |5 DE-604 | |
| 776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe |o urn:nbn:de:kobv:co1-opus4-35665 |
| 856 | 4 | 1 | |u https://opus4.kobv.de/opus4-btu/frontdoor/index/index/docId/3566 |x Verlag |z kostenfrei |3 Volltext |
| 856 | 4 | 1 | |u https://opus4.kobv.de/opus4-btu/files/3566/Sven_Niese_Dissertation.pdf |x pdf |z kostenfrei |3 Volltext |
| 856 | 4 | 1 | |u https://nbn-resolving.org/urn:nbn:de:kobv:co1-opus4-35665 |x Resolving-System |z kostenfrei |3 Volltext |
| 912 | |a ebook | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-028256348 | ||
Datensatz im Suchindex
| _version_ | 1804175078444761088 |
|---|---|
| any_adam_object | |
| author | Niese, Sven |
| author_GND | (DE-588)1082531235 |
| author_facet | Niese, Sven |
| author_role | aut |
| author_sort | Niese, Sven |
| author_variant | s n sn |
| building | Verbundindex |
| bvnumber | BV042827046 |
| classification_rvk | ZM 3700 ZM 3850 |
| collection | ebook |
| ctrlnum | (OCoLC)923800094 (DE-599)BVBBV042827046 |
| discipline | Werkstoffwissenschaften / Fertigungstechnik |
| format | Thesis Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01813nam a2200433 c 4500</leader><controlfield tag="001">BV042827046</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20160215 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">150911s2015 ad|| mm|| 00||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)923800094</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV042827046</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-634</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZM 3700</subfield><subfield code="0">(DE-625)157028:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZM 3850</subfield><subfield code="0">(DE-625)157030:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Niese, Sven</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)1082531235</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Lab-based in-situ X-ray microscopy</subfield><subfield code="b">methodical developments and applications in materials science and microelectronics</subfield><subfield code="c">vorgelegt von Sven Niese</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2015</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XVI, 143 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="502" ind1=" " ind2=" "><subfield code="a">Cottbus-Senftenberg, Techn. Univ., Diss., 2015</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Röntgenlinse</subfield><subfield code="0">(DE-588)4252329-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Röntgenmikroskopie</subfield><subfield code="0">(DE-588)4178315-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Rissausbreitung</subfield><subfield code="0">(DE-588)4136911-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)4113937-9</subfield><subfield code="a">Hochschulschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Rissausbreitung</subfield><subfield code="0">(DE-588)4136911-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Röntgenlinse</subfield><subfield code="0">(DE-588)4252329-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Röntgenmikroskopie</subfield><subfield code="0">(DE-588)4178315-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Online-Ausgabe</subfield><subfield code="o">urn:nbn:de:kobv:co1-opus4-35665</subfield></datafield><datafield tag="856" ind1="4" ind2="1"><subfield code="u">https://opus4.kobv.de/opus4-btu/frontdoor/index/index/docId/3566</subfield><subfield code="x">Verlag</subfield><subfield code="z">kostenfrei</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="856" ind1="4" ind2="1"><subfield code="u">https://opus4.kobv.de/opus4-btu/files/3566/Sven_Niese_Dissertation.pdf</subfield><subfield code="x">pdf</subfield><subfield code="z">kostenfrei</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="856" ind1="4" ind2="1"><subfield code="u">https://nbn-resolving.org/urn:nbn:de:kobv:co1-opus4-35665</subfield><subfield code="x">Resolving-System</subfield><subfield code="z">kostenfrei</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ebook</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-028256348</subfield></datafield></record></collection> |
| genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
| genre_facet | Hochschulschrift |
| id | DE-604.BV042827046 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T07:10:34Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-028256348 |
| oclc_num | 923800094 |
| open_access_boolean | 1 |
| owner | DE-634 DE-83 |
| owner_facet | DE-634 DE-83 |
| physical | XVI, 143 S. Ill., graph. Darst. |
| psigel | ebook |
| publishDate | 2015 |
| publishDateSearch | 2015 |
| publishDateSort | 2015 |
| record_format | marc |
| spelling | Niese, Sven Verfasser (DE-588)1082531235 aut Lab-based in-situ X-ray microscopy methodical developments and applications in materials science and microelectronics vorgelegt von Sven Niese 2015 XVI, 143 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Cottbus-Senftenberg, Techn. Univ., Diss., 2015 Röntgenlinse (DE-588)4252329-1 gnd rswk-swf Röntgenmikroskopie (DE-588)4178315-3 gnd rswk-swf Rissausbreitung (DE-588)4136911-7 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Rissausbreitung (DE-588)4136911-7 s Röntgenlinse (DE-588)4252329-1 s Röntgenmikroskopie (DE-588)4178315-3 s DE-604 Erscheint auch als Online-Ausgabe urn:nbn:de:kobv:co1-opus4-35665 https://opus4.kobv.de/opus4-btu/frontdoor/index/index/docId/3566 Verlag kostenfrei Volltext https://opus4.kobv.de/opus4-btu/files/3566/Sven_Niese_Dissertation.pdf pdf kostenfrei Volltext https://nbn-resolving.org/urn:nbn:de:kobv:co1-opus4-35665 Resolving-System kostenfrei Volltext |
| spellingShingle | Niese, Sven Lab-based in-situ X-ray microscopy methodical developments and applications in materials science and microelectronics Röntgenlinse (DE-588)4252329-1 gnd Röntgenmikroskopie (DE-588)4178315-3 gnd Rissausbreitung (DE-588)4136911-7 gnd |
| subject_GND | (DE-588)4252329-1 (DE-588)4178315-3 (DE-588)4136911-7 (DE-588)4113937-9 |
| title | Lab-based in-situ X-ray microscopy methodical developments and applications in materials science and microelectronics |
| title_auth | Lab-based in-situ X-ray microscopy methodical developments and applications in materials science and microelectronics |
| title_exact_search | Lab-based in-situ X-ray microscopy methodical developments and applications in materials science and microelectronics |
| title_full | Lab-based in-situ X-ray microscopy methodical developments and applications in materials science and microelectronics vorgelegt von Sven Niese |
| title_fullStr | Lab-based in-situ X-ray microscopy methodical developments and applications in materials science and microelectronics vorgelegt von Sven Niese |
| title_full_unstemmed | Lab-based in-situ X-ray microscopy methodical developments and applications in materials science and microelectronics vorgelegt von Sven Niese |
| title_short | Lab-based in-situ X-ray microscopy |
| title_sort | lab based in situ x ray microscopy methodical developments and applications in materials science and microelectronics |
| title_sub | methodical developments and applications in materials science and microelectronics |
| topic | Röntgenlinse (DE-588)4252329-1 gnd Röntgenmikroskopie (DE-588)4178315-3 gnd Rissausbreitung (DE-588)4136911-7 gnd |
| topic_facet | Röntgenlinse Röntgenmikroskopie Rissausbreitung Hochschulschrift |
| url | https://opus4.kobv.de/opus4-btu/frontdoor/index/index/docId/3566 https://opus4.kobv.de/opus4-btu/files/3566/Sven_Niese_Dissertation.pdf https://nbn-resolving.org/urn:nbn:de:kobv:co1-opus4-35665 |
| work_keys_str_mv | AT niesesven labbasedinsituxraymicroscopymethodicaldevelopmentsandapplicationsinmaterialsscienceandmicroelectronics |