Testing for small-delay defects in nanoscale CMOS integrated circuits:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
2014
|
| Schriftenreihe: | Devices, circuits, and systems
|
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | XIV, 247 S. Ill., graph. Darst. 24 cm |
| ISBN: | 9781439829417 |
Internformat
MARC
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|---|---|---|---|
| 001 | BV042709292 | ||
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| 020 | |a 9781439829417 |9 978-1-4398-2941-7 | ||
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| 245 | 1 | 0 | |a Testing for small-delay defects in nanoscale CMOS integrated circuits |c ed. by Sandeep K. Goel ... |
| 264 | 1 | |c 2014 | |
| 300 | |a XIV, 247 S. |b Ill., graph. Darst. |c 24 cm | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
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| 490 | 0 | |a Devices, circuits, and systems | |
| 650 | 4 | |a Metal oxide semiconductors, Complementary |x Testing | |
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| 689 | 0 | 0 | |a CMOS |0 (DE-588)4010319-5 |D s |
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| 700 | 1 | |a Goel, Sandeep |e Sonstige |4 oth | |
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| 999 | |a oai:aleph.bib-bvb.de:BVB01-028140656 | ||
Datensatz im Suchindex
| _version_ | 1804174911736905728 |
|---|---|
| adam_text | Contents
Preface............................................................ix
About the Editors................................................xiii
Contributors.......................................................xv
1 Fundamentals of Small-Delay Defect Testing...................... 1
Sudhakar M. Reddy and Peter Maxxoell
Section I Timing-Aware ATPG
2 K Longest Paths................................................23
Duncan M. (Hank) Walker
3 Timing-Aware ATPG..............................................49
Mark Kassab, Benoit Nadeau-Dostie, and Xijiang Lin
Section II Faster-than-at-Speed
4 Faster-than-at-Speed Test for Screening Small-Delay Defects....73
Nisar Ahmed and Mohammad Tehranipoor
5 Circuit Path Grading Considering Layout, Process Variations,
and Cross Talk.................................................95
Ke Peng, Mahmut Yihnaz, and Mohammad Tehranipoor
Section III Alternative Methods
6 Output Deviations-Based SDD Testing......................... 119
Mahmut Yihnaz
7 Hybrid/Top-off Test Pattern Generation Schemes for
Small-Delay Defects....................................... 147
Sandeep K. Goel and Narendra Devta-Prasanna
8 Circuit Topology-Based Test Pattern Generation for
Small-Delay Defects....................................... 161
Sandeep K. Goel and Krish Chakrabarty
vii
viii
Coittents
Section IV SDD Metrics
9 Small-Delay Defect Coverage Metrics........................185
Narendra Devta-Prasanna and Sandeep K. Goel
10 Conclusion............................................... 211
References.....................................................215
Index..........................................................223
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| id | DE-604.BV042709292 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T07:07:55Z |
| institution | BVB |
| isbn | 9781439829417 |
| language | English |
| lccn | 013028538 |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-028140656 |
| oclc_num | 916408027 |
| open_access_boolean | |
| owner | DE-739 |
| owner_facet | DE-739 |
| physical | XIV, 247 S. Ill., graph. Darst. 24 cm |
| publishDate | 2014 |
| publishDateSearch | 2014 |
| publishDateSort | 2014 |
| record_format | marc |
| series2 | Devices, circuits, and systems |
| spelling | Testing for small-delay defects in nanoscale CMOS integrated circuits ed. by Sandeep K. Goel ... 2014 XIV, 247 S. Ill., graph. Darst. 24 cm txt rdacontent n rdamedia nc rdacarrier Devices, circuits, and systems Metal oxide semiconductors, Complementary Testing CMOS (DE-588)4010319-5 gnd rswk-swf CMOS (DE-588)4010319-5 s DE-604 Goel, Sandeep Sonstige oth Digitalisierung UB Passau - ADAM Catalogue Enrichment application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=028140656&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Testing for small-delay defects in nanoscale CMOS integrated circuits Metal oxide semiconductors, Complementary Testing CMOS (DE-588)4010319-5 gnd |
| subject_GND | (DE-588)4010319-5 |
| title | Testing for small-delay defects in nanoscale CMOS integrated circuits |
| title_auth | Testing for small-delay defects in nanoscale CMOS integrated circuits |
| title_exact_search | Testing for small-delay defects in nanoscale CMOS integrated circuits |
| title_full | Testing for small-delay defects in nanoscale CMOS integrated circuits ed. by Sandeep K. Goel ... |
| title_fullStr | Testing for small-delay defects in nanoscale CMOS integrated circuits ed. by Sandeep K. Goel ... |
| title_full_unstemmed | Testing for small-delay defects in nanoscale CMOS integrated circuits ed. by Sandeep K. Goel ... |
| title_short | Testing for small-delay defects in nanoscale CMOS integrated circuits |
| title_sort | testing for small delay defects in nanoscale cmos integrated circuits |
| topic | Metal oxide semiconductors, Complementary Testing CMOS (DE-588)4010319-5 gnd |
| topic_facet | Metal oxide semiconductors, Complementary Testing CMOS |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=028140656&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| work_keys_str_mv | AT goelsandeep testingforsmalldelaydefectsinnanoscalecmosintegratedcircuits |