Silicon analog components: device design, process integration, characterization, and reliability
Gespeichert in:
1. Verfasser: | |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
New York, NY [u.a.]
Springer
2015
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Schlagworte: | |
Online-Zugang: | BHS01 BTU01 FAB01 FAW01 FHA01 FHI01 FHN01 FHR01 FKE01 FRO01 FWS01 FWS02 UBY01 Volltext Inhaltsverzeichnis Abstract |
Beschreibung: | 1 Online-Ressource (XLI, 607 p. 454 illus) |
ISBN: | 9781493927517 |
DOI: | 10.1007/978-1-4939-2751-7 |
Internformat
MARC
LEADER | 00000nmm a2200000zc 4500 | ||
---|---|---|---|
001 | BV042669305 | ||
003 | DE-604 | ||
005 | 20150708 | ||
007 | cr|uuu---uuuuu | ||
008 | 150703s2015 |||| o||u| ||||||eng d | ||
020 | |a 9781493927517 |c Online |9 978-1-4939-2751-7 | ||
024 | 7 | |a 10.1007/978-1-4939-2751-7 |2 doi | |
035 | |a (OCoLC)915352801 | ||
035 | |a (DE-599)BVBBV042669305 | ||
040 | |a DE-604 |b ger |e aacr | ||
041 | 0 | |a eng | |
049 | |a DE-1046 |a DE-1043 |a DE-B768 |a DE-Aug4 |a DE-898 |a DE-573 |a DE-859 |a DE-863 |a DE-634 |a DE-92 |a DE-862 |a DE-861 |a DE-706 | ||
082 | 0 | |a 621.3815 |2 23 | |
084 | |a VN 6020 |0 (DE-625)147589:253 |2 rvk | ||
084 | |a ZN 4800 |0 (DE-625)157408: |2 rvk | ||
100 | 1 | |a El-Kareh, Badih |e Verfasser |4 aut | |
245 | 1 | 0 | |a Silicon analog components |b device design, process integration, characterization, and reliability |c Badih El-Kareh ; Lou N. Hutter |
264 | 1 | |a New York, NY [u.a.] |b Springer |c 2015 | |
300 | |a 1 Online-Ressource (XLI, 607 p. 454 illus) | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
650 | 4 | |a Engineering | |
650 | 4 | |a Systems engineering | |
650 | 4 | |a Optical materials | |
650 | 4 | |a Circuits and Systems | |
650 | 4 | |a Electronic Circuits and Devices | |
650 | 4 | |a Optical and Electronic Materials | |
650 | 4 | |a Ingenieurwissenschaften | |
700 | 1 | |a Hutter, Lou N. |e Sonstige |4 oth | |
776 | 0 | 8 | |i Erscheint auch als |n Druckausgabe |z 978-1-4939-2750-0 |
856 | 4 | 0 | |u https://doi.org/10.1007/978-1-4939-2751-7 |x Verlag |3 Volltext |
856 | 4 | 2 | |m Springer Fremddatenuebernahme |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=028101389&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Inhaltsverzeichnis |
856 | 4 | 2 | |m Springer Fremddatenuebernahme |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=028101389&sequence=000003&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA |3 Abstract |
912 | |a ZDB-2-ENG | ||
940 | 1 | |q ZDB-2-ENG_2015 | |
999 | |a oai:aleph.bib-bvb.de:BVB01-028101389 | ||
966 | e | |u https://doi.org/10.1007/978-1-4939-2751-7 |l BHS01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-1-4939-2751-7 |l BTU01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-1-4939-2751-7 |l FAB01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-1-4939-2751-7 |l FAW01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-1-4939-2751-7 |l FHA01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-1-4939-2751-7 |l FHI01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-1-4939-2751-7 |l FHN01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-1-4939-2751-7 |l FHR01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-1-4939-2751-7 |l FKE01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-1-4939-2751-7 |l FRO01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-1-4939-2751-7 |l FWS01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-1-4939-2751-7 |l FWS02 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-1-4939-2751-7 |l UBY01 |p ZDB-2-ENG |x Verlag |3 Volltext |
Datensatz im Suchindex
DE-BY-FWS_katkey | 568416 |
---|---|
_version_ | 1806179309594869760 |
adam_text | SILICON ANALOG COMPONENTS
/ EL-KAREH, BADIH
: 2015
TABLE OF CONTENTS / INHALTSVERZEICHNIS
THE WORLD IS ANALOG
REVIEW OF SINGLE-CRYSTAL SILICON PROPERTIES
PN JUNCTIONS
RECTIFYING AND OHMIC CONTACTS
BIPOLAR AND JUNCTION FIELD-EFFECT TRANSISTORS
HIGH-VOLTAGE AND POWER TRANSISTORS
PASSIVE COMPONENTS
PROCESS INTEGRATION
MISMATCH AND NOISE
CHIP RELIABILITY
DIESES SCHRIFTSTUECK WURDE MASCHINELL ERZEUGT.
SILICON ANALOG COMPONENTS
/ EL-KAREH, BADIH
: 2015
ABSTRACT / INHALTSTEXT
THIS BOOK COVERS MODERN ANALOG COMPONENTS, THEIR CHARACTERISTICS, AND
INTERACTIONS WITH PROCESS PARAMETERS. IT SERVES AS A COMPREHENSIVE
GUIDE, ADDRESSING BOTH THE THEORETICAL AND PRACTICAL ASPECTS OF MODERN
SILICON DEVICES AND THE RELATIONSHIP BETWEEN THEIR ELECTRICAL PROPERTIES
AND PROCESSING CONDITIONS. BASED ON THE AUTHORS’ EXTENSIVE EXPERIENCE
IN THE DEVELOPMENT OF ANALOG DEVICES, THIS BOOK IS INTENDED FOR
ENGINEERS AND SCIENTISTS IN SEMICONDUCTOR RESEARCH, DEVELOPMENT AND
MANUFACTURING. THE PROBLEMS AT THE END OF EACH CHAPTER AND THE NUMEROUS
CHARTS, FIGURES AND TABLES ALSO MAKE IT APPROPRIATE FOR USE AS A TEXT IN
GRADUATE AND ADVANCED UNDERGRADUATE COURSES IN ELECTRICAL ENGINEERING
AND MATERIALS SCIENCE
DIESES SCHRIFTSTUECK WURDE MASCHINELL ERZEUGT.
|
any_adam_object | 1 |
author | El-Kareh, Badih |
author_facet | El-Kareh, Badih |
author_role | aut |
author_sort | El-Kareh, Badih |
author_variant | b e k bek |
building | Verbundindex |
bvnumber | BV042669305 |
classification_rvk | VN 6020 ZN 4800 |
collection | ZDB-2-ENG |
ctrlnum | (OCoLC)915352801 (DE-599)BVBBV042669305 |
dewey-full | 621.3815 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.3815 |
dewey-search | 621.3815 |
dewey-sort | 3621.3815 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Chemie / Pharmazie Elektrotechnik / Elektronik / Nachrichtentechnik |
doi_str_mv | 10.1007/978-1-4939-2751-7 |
format | Electronic eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03345nmm a2200625zc 4500</leader><controlfield tag="001">BV042669305</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20150708 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">150703s2015 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781493927517</subfield><subfield code="c">Online</subfield><subfield code="9">978-1-4939-2751-7</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-1-4939-2751-7</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)915352801</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV042669305</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-1046</subfield><subfield code="a">DE-1043</subfield><subfield code="a">DE-B768</subfield><subfield code="a">DE-Aug4</subfield><subfield code="a">DE-898</subfield><subfield code="a">DE-573</subfield><subfield code="a">DE-859</subfield><subfield code="a">DE-863</subfield><subfield code="a">DE-634</subfield><subfield code="a">DE-92</subfield><subfield code="a">DE-862</subfield><subfield code="a">DE-861</subfield><subfield code="a">DE-706</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">VN 6020</subfield><subfield code="0">(DE-625)147589:253</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4800</subfield><subfield code="0">(DE-625)157408:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">El-Kareh, Badih</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Silicon analog components</subfield><subfield code="b">device design, process integration, characterization, and reliability</subfield><subfield code="c">Badih El-Kareh ; Lou N. Hutter</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York, NY [u.a.]</subfield><subfield code="b">Springer</subfield><subfield code="c">2015</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XLI, 607 p. 454 illus)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Systems engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Circuits and Systems</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic Circuits and Devices</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical and Electronic Materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Ingenieurwissenschaften</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Hutter, Lou N.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druckausgabe</subfield><subfield code="z">978-1-4939-2750-0</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-1-4939-2751-7</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">Springer Fremddatenuebernahme</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=028101389&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">Springer Fremddatenuebernahme</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=028101389&sequence=000003&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Abstract</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-ENG</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-ENG_2015</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-028101389</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4939-2751-7</subfield><subfield code="l">BHS01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4939-2751-7</subfield><subfield code="l">BTU01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4939-2751-7</subfield><subfield code="l">FAB01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4939-2751-7</subfield><subfield code="l">FAW01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4939-2751-7</subfield><subfield code="l">FHA01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4939-2751-7</subfield><subfield code="l">FHI01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4939-2751-7</subfield><subfield code="l">FHN01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4939-2751-7</subfield><subfield code="l">FHR01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4939-2751-7</subfield><subfield code="l">FKE01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4939-2751-7</subfield><subfield code="l">FRO01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4939-2751-7</subfield><subfield code="l">FWS01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4939-2751-7</subfield><subfield code="l">FWS02</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4939-2751-7</subfield><subfield code="l">UBY01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
id | DE-604.BV042669305 |
illustrated | Not Illustrated |
indexdate | 2024-08-01T12:06:57Z |
institution | BVB |
isbn | 9781493927517 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-028101389 |
oclc_num | 915352801 |
open_access_boolean | |
owner | DE-1046 DE-1043 DE-B768 DE-Aug4 DE-898 DE-BY-UBR DE-573 DE-859 DE-863 DE-BY-FWS DE-634 DE-92 DE-862 DE-BY-FWS DE-861 DE-706 |
owner_facet | DE-1046 DE-1043 DE-B768 DE-Aug4 DE-898 DE-BY-UBR DE-573 DE-859 DE-863 DE-BY-FWS DE-634 DE-92 DE-862 DE-BY-FWS DE-861 DE-706 |
physical | 1 Online-Ressource (XLI, 607 p. 454 illus) |
psigel | ZDB-2-ENG ZDB-2-ENG_2015 |
publishDate | 2015 |
publishDateSearch | 2015 |
publishDateSort | 2015 |
publisher | Springer |
record_format | marc |
spellingShingle | El-Kareh, Badih Silicon analog components device design, process integration, characterization, and reliability Engineering Systems engineering Optical materials Circuits and Systems Electronic Circuits and Devices Optical and Electronic Materials Ingenieurwissenschaften |
title | Silicon analog components device design, process integration, characterization, and reliability |
title_auth | Silicon analog components device design, process integration, characterization, and reliability |
title_exact_search | Silicon analog components device design, process integration, characterization, and reliability |
title_full | Silicon analog components device design, process integration, characterization, and reliability Badih El-Kareh ; Lou N. Hutter |
title_fullStr | Silicon analog components device design, process integration, characterization, and reliability Badih El-Kareh ; Lou N. Hutter |
title_full_unstemmed | Silicon analog components device design, process integration, characterization, and reliability Badih El-Kareh ; Lou N. Hutter |
title_short | Silicon analog components |
title_sort | silicon analog components device design process integration characterization and reliability |
title_sub | device design, process integration, characterization, and reliability |
topic | Engineering Systems engineering Optical materials Circuits and Systems Electronic Circuits and Devices Optical and Electronic Materials Ingenieurwissenschaften |
topic_facet | Engineering Systems engineering Optical materials Circuits and Systems Electronic Circuits and Devices Optical and Electronic Materials Ingenieurwissenschaften |
url | https://doi.org/10.1007/978-1-4939-2751-7 http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=028101389&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=028101389&sequence=000003&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA |
work_keys_str_mv | AT elkarehbadih siliconanalogcomponentsdevicedesignprocessintegrationcharacterizationandreliability AT hutterloun siliconanalogcomponentsdevicedesignprocessintegrationcharacterizationandreliability |