Secondary ion mass spectroscopy of solid surfaces:
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Buch |
Sprache: | English |
Veröffentlicht: |
Utrecht
VNU Science Press
1987
|
Ausgabe: | 1. Engl. ed. |
Schlagworte: | |
Beschreibung: | Literaturangaben |
Beschreibung: | VIII, 141 S. graph. Darst. |
ISBN: | 9067640786 |
Internformat
MARC
LEADER | 00000nam a2200000 c 4500 | ||
---|---|---|---|
001 | BV042667722 | ||
003 | DE-604 | ||
005 | 00000000000000.0 | ||
007 | t | ||
008 | 150702s1987 d||| |||| 00||| eng d | ||
020 | |a 9067640786 |9 90-6764-078-6 | ||
035 | |a (OCoLC)246674936 | ||
035 | |a (DE-599)OBVAC05664824 | ||
040 | |a DE-604 |b ger |e rakwb | ||
041 | 0 | |a eng | |
049 | |a DE-188 | ||
084 | |a UP 7500 |0 (DE-625)146433: |2 rvk | ||
100 | 1 | |a Čerepin, Valentin T. |e Verfasser |4 aut | |
245 | 1 | 0 | |a Secondary ion mass spectroscopy of solid surfaces |c V. Cherepin |
250 | |a 1. Engl. ed. | ||
264 | 1 | |a Utrecht |b VNU Science Press |c 1987 | |
300 | |a VIII, 141 S. |b graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
500 | |a Literaturangaben | ||
546 | |a Aus d. Russ. übers | ||
650 | 0 | 7 | |a Sekundärionenemission |0 (DE-588)4180799-6 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Festkörperoberfläche |0 (DE-588)4127823-9 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a Sekundärionenemission |0 (DE-588)4180799-6 |D s |
689 | 0 | 1 | |a Festkörperoberfläche |0 (DE-588)4127823-9 |D s |
689 | 0 | |5 DE-604 | |
999 | |a oai:aleph.bib-bvb.de:BVB01-028099830 |
Datensatz im Suchindex
_version_ | 1804174856453881856 |
---|---|
any_adam_object | |
author | Čerepin, Valentin T. |
author_facet | Čerepin, Valentin T. |
author_role | aut |
author_sort | Čerepin, Valentin T. |
author_variant | v t č vt vtč |
building | Verbundindex |
bvnumber | BV042667722 |
classification_rvk | UP 7500 |
ctrlnum | (OCoLC)246674936 (DE-599)OBVAC05664824 |
discipline | Physik |
edition | 1. Engl. ed. |
format | Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01161nam a2200361 c 4500</leader><controlfield tag="001">BV042667722</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">150702s1987 d||| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9067640786</subfield><subfield code="9">90-6764-078-6</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)246674936</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)OBVAC05664824</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-188</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 7500</subfield><subfield code="0">(DE-625)146433:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Čerepin, Valentin T.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Secondary ion mass spectroscopy of solid surfaces</subfield><subfield code="c">V. Cherepin</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1. Engl. ed.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Utrecht</subfield><subfield code="b">VNU Science Press</subfield><subfield code="c">1987</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">VIII, 141 S.</subfield><subfield code="b">graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Literaturangaben</subfield></datafield><datafield tag="546" ind1=" " ind2=" "><subfield code="a">Aus d. Russ. übers</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Sekundärionenemission</subfield><subfield code="0">(DE-588)4180799-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Festkörperoberfläche</subfield><subfield code="0">(DE-588)4127823-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Sekundärionenemission</subfield><subfield code="0">(DE-588)4180799-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Festkörperoberfläche</subfield><subfield code="0">(DE-588)4127823-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-028099830</subfield></datafield></record></collection> |
id | DE-604.BV042667722 |
illustrated | Illustrated |
indexdate | 2024-07-10T07:07:02Z |
institution | BVB |
isbn | 9067640786 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-028099830 |
oclc_num | 246674936 |
open_access_boolean | |
owner | DE-188 |
owner_facet | DE-188 |
physical | VIII, 141 S. graph. Darst. |
publishDate | 1987 |
publishDateSearch | 1987 |
publishDateSort | 1987 |
publisher | VNU Science Press |
record_format | marc |
spelling | Čerepin, Valentin T. Verfasser aut Secondary ion mass spectroscopy of solid surfaces V. Cherepin 1. Engl. ed. Utrecht VNU Science Press 1987 VIII, 141 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturangaben Aus d. Russ. übers Sekundärionenemission (DE-588)4180799-6 gnd rswk-swf Festkörperoberfläche (DE-588)4127823-9 gnd rswk-swf Sekundärionenemission (DE-588)4180799-6 s Festkörperoberfläche (DE-588)4127823-9 s DE-604 |
spellingShingle | Čerepin, Valentin T. Secondary ion mass spectroscopy of solid surfaces Sekundärionenemission (DE-588)4180799-6 gnd Festkörperoberfläche (DE-588)4127823-9 gnd |
subject_GND | (DE-588)4180799-6 (DE-588)4127823-9 |
title | Secondary ion mass spectroscopy of solid surfaces |
title_auth | Secondary ion mass spectroscopy of solid surfaces |
title_exact_search | Secondary ion mass spectroscopy of solid surfaces |
title_full | Secondary ion mass spectroscopy of solid surfaces V. Cherepin |
title_fullStr | Secondary ion mass spectroscopy of solid surfaces V. Cherepin |
title_full_unstemmed | Secondary ion mass spectroscopy of solid surfaces V. Cherepin |
title_short | Secondary ion mass spectroscopy of solid surfaces |
title_sort | secondary ion mass spectroscopy of solid surfaces |
topic | Sekundärionenemission (DE-588)4180799-6 gnd Festkörperoberfläche (DE-588)4127823-9 gnd |
topic_facet | Sekundärionenemission Festkörperoberfläche |
work_keys_str_mv | AT cerepinvalentint secondaryionmassspectroscopyofsolidsurfaces |