Defects in semiconductors:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Amsterdam [u.a.]
Elsevier, Academic Press
2015
|
| Ausgabe: | 1. ed. |
| Schriftenreihe: | Semiconductors and semimetals
91 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | XII, 445 S. Ill., graph. Darst. |
| ISBN: | 9780128019351 |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV042609543 | ||
| 003 | DE-604 | ||
| 005 | 20160509 | ||
| 007 | t | ||
| 008 | 150611s2015 ad|| |||| 00||| eng d | ||
| 020 | |a 9780128019351 |9 978-0-12-801935-1 | ||
| 035 | |a (OCoLC)911198943 | ||
| 035 | |a (DE-599)BVBBV042609543 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-83 |a DE-384 |a DE-706 |a DE-29T |a DE-20 |a DE-703 | ||
| 084 | |a UP 1090 |0 (DE-625)146343: |2 rvk | ||
| 084 | |a UP 2800 |0 (DE-625)146366: |2 rvk | ||
| 245 | 1 | 0 | |a Defects in semiconductors |c ed. by Lucia Romano ... |
| 250 | |a 1. ed. | ||
| 264 | 1 | |a Amsterdam [u.a.] |b Elsevier, Academic Press |c 2015 | |
| 300 | |a XII, 445 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Semiconductors and semimetals |v 91 | |
| 650 | 0 | 7 | |a Halbleiter |0 (DE-588)4022993-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Gitterbaufehler |0 (DE-588)4125030-8 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Halbleiter |0 (DE-588)4022993-2 |D s |
| 689 | 0 | 1 | |a Gitterbaufehler |0 (DE-588)4125030-8 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Romano, Lucia |d 1977- |e Sonstige |0 (DE-588)1072395177 |4 oth | |
| 830 | 0 | |a Semiconductors and semimetals |v 91 |w (DE-604)BV002590004 |9 91 | |
| 856 | 4 | 2 | |m HBZ Datenaustausch |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=028042451&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Inhaltsverzeichnis |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-028042451 | ||
Datensatz im Suchindex
| _version_ | 1804174780309438464 |
|---|---|
| adam_text | Titel: Defects in semiconductors
Autor: Romano, Lucia
Jahr: 2015
CONTENTS
Contributors ix
Preface xi
1. Role of Defects in the Dopant Diffusion in Si 1
Peter Pichler
1. Introduction 1
2. The Framework of Diffusion-Reaction Equations 2
3. Diffusion of Substitutional Dopants via Intrinsic Point Defects 9
4. Dopants in Silicon and Their Diffusion Mechanisms 29
5. Nonequilibrium Processes 32
6. Precipitates, Clusters, and Complexes 35
7. Interface Segregation 39
References 41
2. Electron and Proton Irradiation of Silicon 47
Arne Nylandsted Larsen and Abdelmadjid Mesli
1. Introduction 47
2. Irradiation of Silicon: General Issues 49
3. The Elementary Act: Frenkel Pair 51
4. Branching Reactions: Basic Considerations 59
5. Complexes Consisting of the Native Defects 78
6. Summary 86
References 87
3. Ion Implantation Defects and Shallow Junctions
in Si and Ge 93
Enrico Napolitani and Giuliana Impellizzeri
1. Introduction 93
2. Generation and Accumulation of Ion Implantation Damage 96
3. Damage Evolution and Defect Agglomerates 98
4. Role of Defects in Shallow Junction Formation in Si 106
5. Role of Defects in Shallow Junction Formation in Ge 111
References 116
v
vi
Contents
4. Defective Solid-Phase Epitaxial Growth of Si 123
Nicholas G. Rudawski, Aaron G. Lind, and Thomas P. Martin
1. Introduction 124
2. Role of Initial Growth Interface Morphology 128
3. Buried Amorphous Layers 133
4. Substrate Orientation Effects 135
5. Stressed SPEG Resulting from Impurities 139
6. Externally Stressed SPEG 143
7. Interaction of the Growth Interface with A SiOx Region 146
8. Defects Occurring at Mask Edges 150
9. Summary 156
Acknowledgments 157
References 157
5. Nanoindentation of Silicon and Germanium 165
Mangalampalli S.R.N. Kiran, Bianca Haberl, Jodie E. Bradby,
and James S. Williams
1. Introduction and Background 165
2. Crystalline Si 170
3. Amorphous and Deposited Si Studies 179
4. Electrical Measurements 183
5. Ge Under Indentation 189
6. Summary and Conclusions 197
Acknowledgments 198
References 198
6. Analytical Techniques for Electrically Active
Defect Detection 205
Eddy Simoen, Johan Lauwaert, and Henk Vrielinck
1. Introduction 205
2. Basic Properties of Deep Level Defects 207
3. Resistivity-Based Deep Level Analysis 210
4. Deep Level Transient Spectroscopy 214
5. AS of Deep Levels 237
6. Diode Lifetime Analysis 240
7. Summary and Outlook 245
References 246
Contents
vii
7. Surface and Defect States in Semiconductors Investigated
by Surface Photovoltage 251
Daniela Cavalcoli, Beatrice Fraboni, and Anna Cavallini
1. Introduction 251
2. Physical Basis of the Method 252
3. Experimental Details 257
4. Applications of the SPV Method 259
5. Conclusions 275
References 276
8. Point Defects in ZnO 279
Matthew D. McCluskey
1. Introduction 280
2. Donor Impurities 282
3. Hydrogen Donors 285
4. Isoelectronic Centers 288
5. Copper 288
6. Lithium 290
7. Sodium 292
8. Nitrogen 293
9. Transition Metals 297
10. Native Defects 298
11. Nanocrystals 303
12. Unidentified Defects 304
13. Conclusions 306
Acknowledgments 306
References 307
9. Point Defects in GaN 315
Michael A. Reshchikov
1. Introduction 315
2. Theoretical Predictions 318
3. Growth Methods and SIMS Analysis 321
4. Defects Revealed by PL 322
5. Point Defects Revealed by DLTS and Other Capacitance
Techniques 346
6. Vacancy-Related Defects Revealed by PAS 355
viii Contents
7. Point Defects Revealed by Magnetic Resonance Techniques 357
8. Summary 359
Acknowledgments 360
References 360
10. Point Defects in Silicon Carbide 369
Naoya Iwamoto and Bengt G. Svensson
1. Introduction 369
2. The Silicon Vacancy (VSi) and the Carbon Vacancy (VJ 373
3. The Silicon Interstitial (Si|), the Carbon Interstitial (Q), and Antisite
Defects (CSi, Sic, QrVc) 384
4. Hydrogen 388
5. Transition Metal Impurities 395
6. Final Remarks 401
Acknowledgments 403
References 403
Index
Contents of Volumes in this Series
409
419
|
| any_adam_object | 1 |
| author_GND | (DE-588)1072395177 |
| building | Verbundindex |
| bvnumber | BV042609543 |
| classification_rvk | UP 1090 UP 2800 |
| ctrlnum | (OCoLC)911198943 (DE-599)BVBBV042609543 |
| discipline | Physik |
| edition | 1. ed. |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01537nam a2200385 cb4500</leader><controlfield tag="001">BV042609543</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20160509 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">150611s2015 ad|| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780128019351</subfield><subfield code="9">978-0-12-801935-1</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)911198943</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV042609543</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-83</subfield><subfield code="a">DE-384</subfield><subfield code="a">DE-706</subfield><subfield code="a">DE-29T</subfield><subfield code="a">DE-20</subfield><subfield code="a">DE-703</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 1090</subfield><subfield code="0">(DE-625)146343:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 2800</subfield><subfield code="0">(DE-625)146366:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Defects in semiconductors</subfield><subfield code="c">ed. by Lucia Romano ...</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1. ed.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Amsterdam [u.a.]</subfield><subfield code="b">Elsevier, Academic Press</subfield><subfield code="c">2015</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XII, 445 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Semiconductors and semimetals</subfield><subfield code="v">91</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleiter</subfield><subfield code="0">(DE-588)4022993-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Gitterbaufehler</subfield><subfield code="0">(DE-588)4125030-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Halbleiter</subfield><subfield code="0">(DE-588)4022993-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Gitterbaufehler</subfield><subfield code="0">(DE-588)4125030-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Romano, Lucia</subfield><subfield code="d">1977-</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)1072395177</subfield><subfield code="4">oth</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Semiconductors and semimetals</subfield><subfield code="v">91</subfield><subfield code="w">(DE-604)BV002590004</subfield><subfield code="9">91</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">HBZ Datenaustausch</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=028042451&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-028042451</subfield></datafield></record></collection> |
| id | DE-604.BV042609543 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T07:05:50Z |
| institution | BVB |
| isbn | 9780128019351 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-028042451 |
| oclc_num | 911198943 |
| open_access_boolean | |
| owner | DE-83 DE-384 DE-706 DE-29T DE-20 DE-703 |
| owner_facet | DE-83 DE-384 DE-706 DE-29T DE-20 DE-703 |
| physical | XII, 445 S. Ill., graph. Darst. |
| publishDate | 2015 |
| publishDateSearch | 2015 |
| publishDateSort | 2015 |
| publisher | Elsevier, Academic Press |
| record_format | marc |
| series | Semiconductors and semimetals |
| series2 | Semiconductors and semimetals |
| spelling | Defects in semiconductors ed. by Lucia Romano ... 1. ed. Amsterdam [u.a.] Elsevier, Academic Press 2015 XII, 445 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Semiconductors and semimetals 91 Halbleiter (DE-588)4022993-2 gnd rswk-swf Gitterbaufehler (DE-588)4125030-8 gnd rswk-swf Halbleiter (DE-588)4022993-2 s Gitterbaufehler (DE-588)4125030-8 s DE-604 Romano, Lucia 1977- Sonstige (DE-588)1072395177 oth Semiconductors and semimetals 91 (DE-604)BV002590004 91 HBZ Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=028042451&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Defects in semiconductors Semiconductors and semimetals Halbleiter (DE-588)4022993-2 gnd Gitterbaufehler (DE-588)4125030-8 gnd |
| subject_GND | (DE-588)4022993-2 (DE-588)4125030-8 |
| title | Defects in semiconductors |
| title_auth | Defects in semiconductors |
| title_exact_search | Defects in semiconductors |
| title_full | Defects in semiconductors ed. by Lucia Romano ... |
| title_fullStr | Defects in semiconductors ed. by Lucia Romano ... |
| title_full_unstemmed | Defects in semiconductors ed. by Lucia Romano ... |
| title_short | Defects in semiconductors |
| title_sort | defects in semiconductors |
| topic | Halbleiter (DE-588)4022993-2 gnd Gitterbaufehler (DE-588)4125030-8 gnd |
| topic_facet | Halbleiter Gitterbaufehler |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=028042451&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| volume_link | (DE-604)BV002590004 |
| work_keys_str_mv | AT romanolucia defectsinsemiconductors |