Noncontact Atomic Force Microscopy: Volume 3
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Cham [u.a.]
Springer International Publishing
2015
|
| Schriftenreihe: | NanoScience and Technology
|
| Schlagworte: | |
| Online-Zugang: | TUM01 Volltext Inhaltsverzeichnis Abstract |
| Beschreibung: | XXII, 527 p. 256 illus., 159 illus. in color |
| ISBN: | 9783319155883 |
| DOI: | 10.1007/978-3-319-15588-3 |
Internformat
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Datensatz im Suchindex
| _version_ | 1804174754807021568 |
|---|---|
| adam_text | NONCONTACT ATOMIC FORCE MICROSCOPY
/
: 2015
TABLE OF CONTENTS / INHALTSVERZEICHNIS
FROM THE CONTENTS: INTRODUCTION
3D FORCE-FIELD SPECTROSCOPY
SIMULTANEOUS NC-AFM/STM MEASUREMENTS OF ATOMIC-SIZED CONTACTS
SPECTROSCOPY AND MANIPULATION USING AFM/STM AT ROOM TEMPERATURE
THE PHANTOM FORCE - THE INFLUENCE OF A TUNNEL CURRENT ON FORCE
MICROSCOPY
NON-CONTACT FRICTION
MAGNETIC EXCHANGE FORCE SPECTROSCOPY
DIESES SCHRIFTSTUECK WURDE MASCHINELL ERZEUGT.
NONCONTACT ATOMIC FORCE MICROSCOPY
/
: 2015
ABSTRACT / INHALTSTEXT
THIS BOOK PRESENTS THE LATEST DEVELOPMENTS IN NONCONTACT ATOMIC FORCE
MICROSCOPY. IT DEALS WITH THE FOLLOWING OUTSTANDING FUNCTIONS AND
APPLICATIONS THAT HAVE BEEN OBTAINED WITH ATOMIC RESOLUTION AFTER THE
PUBLICATION OF VOLUME 2: (1) PAULI REPULSIVE FORCE IMAGING OF MOLECULAR
STRUCTURE, (2) APPLICATIONS OF FORCE SPECTROSCOPY AND FORCE MAPPING WITH
ATOMIC RESOLUTION, (3) APPLICATIONS OF TUNING FORKS, (4) APPLICATIONS OF
ATOMIC/MOLECULAR MANIPULATION, (5) APPLICATIONS OF MAGNETIC EXCHANGE
FORCE MICROSCOPY, (6) APPLICATIONS OF ATOMIC AND MOLECULAR IMAGING IN
LIQUIDS, (7) APPLICATIONS OF COMBINED AFM/STM WITH ATOMIC RESOLUTION,
AND (8) NEW TECHNOLOGIES IN DYNAMIC FORCE MICROSCOPY. THESE RESULTS AND
TECHNOLOGIES ARE NOW EXPANDING THE CAPACITY OF THE NC-AFM WITH IMAGING
FUNCTIONS ON AN ATOMIC SCALE TOWARD MAKING THEM CHARACTERIZATION AND
MANIPULATION TOOLS OF INDIVIDUAL ATOMS/MOLECULES AND NANOSTRUCTURES,
WITH OUTSTANDING CAPABILITY AT THE LEVEL OF MOLECULAR, ATOMIC, AND
SUBATOMIC RESOLUTION. SINCE THE PUBLICATION OF VOL. 2 OF THE BOOK
NONCONTACT ATOMIC FORCE MICROSCOPY IN 2009 THE NONCONTACT ATOMIC FORCE
MICROSCOPE, WHICH CAN IMAGE EVEN INSULATORS WITH ATOMIC RESOLUTION, HAS
ACHIEVED REMARKABLE PROGRESS. THE NC-AFM IS NOW BECOMING CRUCIAL FOR
NANOSCIENCE AND NANOTECHNOLOGY
DIESES SCHRIFTSTUECK WURDE MASCHINELL ERZEUGT.
|
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| dewey-full | 620.5 |
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| dewey-raw | 620.5 |
| dewey-search | 620.5 |
| dewey-sort | 3620.5 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik Chemie |
| doi_str_mv | 10.1007/978-3-319-15588-3 |
| format | Electronic eBook |
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| id | DE-604.BV042592129 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:05:25Z |
| institution | BVB |
| isbn | 9783319155883 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-028025341 |
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| physical | XXII, 527 p. 256 illus., 159 illus. in color |
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| spelling | Noncontact Atomic Force Microscopy Volume 3 Seizo Morita, Franz J. Giessibl, Ernst Meyer, Roland Wiesendanger, ed. Cham [u.a.] Springer International Publishing 2015 XXII, 527 p. 256 illus., 159 illus. in color txt rdacontent c rdamedia cr rdacarrier Online-Ressource NanoScience and Technology Physics Nanotechnology Surfaces (Physics) Nanoscale Science and Technology Surfaces and Interfaces, Thin Films Spectroscopy and Microscopy Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf Rasterkraftmikroskopie (DE-588)4274473-8 s DE-604 Morita, Seizō 1948- Sonstige (DE-588)123650178 oth Gießibl, Franz J. 1962- Sonstige (DE-588)1072088126 oth Meyer, Ernst Sonstige (DE-588)136997872 oth Wiesendanger, Roland 1961- Sonstige (DE-588)115858059 oth Erscheint auch als Druck-Ausgabe 978-3-319-15587-6 https://doi.org/10.1007/978-3-319-15588-3 Verlag URL des Erstveröffentlichers Volltext Springer Fremddatenuebernahme application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=028025341&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis Springer Fremddatenuebernahme application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=028025341&sequence=000003&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA Abstract |
| spellingShingle | Noncontact Atomic Force Microscopy Volume 3 Physics Nanotechnology Surfaces (Physics) Nanoscale Science and Technology Surfaces and Interfaces, Thin Films Spectroscopy and Microscopy Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| subject_GND | (DE-588)4274473-8 |
| title | Noncontact Atomic Force Microscopy Volume 3 |
| title_auth | Noncontact Atomic Force Microscopy Volume 3 |
| title_exact_search | Noncontact Atomic Force Microscopy Volume 3 |
| title_full | Noncontact Atomic Force Microscopy Volume 3 Seizo Morita, Franz J. Giessibl, Ernst Meyer, Roland Wiesendanger, ed. |
| title_fullStr | Noncontact Atomic Force Microscopy Volume 3 Seizo Morita, Franz J. Giessibl, Ernst Meyer, Roland Wiesendanger, ed. |
| title_full_unstemmed | Noncontact Atomic Force Microscopy Volume 3 Seizo Morita, Franz J. Giessibl, Ernst Meyer, Roland Wiesendanger, ed. |
| title_short | Noncontact Atomic Force Microscopy |
| title_sort | noncontact atomic force microscopy volume 3 |
| title_sub | Volume 3 |
| topic | Physics Nanotechnology Surfaces (Physics) Nanoscale Science and Technology Surfaces and Interfaces, Thin Films Spectroscopy and Microscopy Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| topic_facet | Physics Nanotechnology Surfaces (Physics) Nanoscale Science and Technology Surfaces and Interfaces, Thin Films Spectroscopy and Microscopy Rasterkraftmikroskopie |
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