Surface science tools for nanomaterials characterization:
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Berlin [und 4 weiteren]
Springer
[2015]
|
| Schlagworte: | |
| Online-Zugang: | Inhaltstext Inhaltsverzeichnis |
| Beschreibung: | Literaturangaben. - Zusätzliches Online-Angebot unter www.springermaterials.com |
| Beschreibung: | x, 652 Seiten Illustrationen, Diagramme |
| ISBN: | 9783662445501 |
Internformat
MARC
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Datensatz im Suchindex
| _version_ | 1806331314092113920 |
|---|---|
| adam_text |
CONTENTS
1 SCANNING ELECTROCHEMICAL POTENTIAL MICROSCOPY (SECPM) AND
ELECTROCHEMICAL STM (EC-STM) 1
MAX HERPICH, JOCHEN FRIEDL, AND ULRICH STIMMING
2 RECOVERING TIME-RESOLVED IMAGING FORCES IN SOLUTION BY
SCANNING PROBE ACCELERATION MICROSCOPY:
THEORY AND APPLICATION 69
MAXMORE CHAIBVA, NICOLE SHAMITKO-KLINGENSMITH, AND
JUSTIN LEGLEITER
3 SCANNING PROBE MICROSCOPY FOR NANOLITHOGRAPHY 91
C. B. SAMANTARAY
4 KELVIN PROBE FORCE MICROSCOPY IN NANOSCIENCE AND
NANOTECHNOLOGY 117
DA LUO, HAO SUN, ARID YAN LI
5 FIELD ION MICROSCOPY FOR THE CHARACTERIZATION OF
SCANNING PROBES 159
WILLIAM PAUL AND PETER GRIITTER
6 SCANNING CONDUCTIVE TORSION MODE MICROSCOPY 199
LING SUN AND ELMAR BONACCURSO
7 FIELD ION AND FIELD DESORPTION MICROSCOPY: PRINCIPLES AND
APPLICATIONS 227
YURI SUCHORSKI
8 NONCONTACT ATOMIC FORCE MICROSCOPY FOR ATOMIC-SCALE
CHARACTERIZATION OF MATERIAL SURFACES 273
MEHMET Z. BAYKARA
9 APPLICATIONS OF SYNCHROTRON-BASED X-RAY PHOTOELECTRON
SPECTROSCOPY IN
THE
CHARACTERIZATION
OF NANOMATERIALS 317
W. H. DOH, V. PAPAEFTHIMIOU, AND S. ZAFEIRATOS
V
HTTP://D-NB.INFO/1053831528
VI CONTENTS
10 EXPLORATION INTO THE VALENCE BAND STRUCTURES OF ORGANIC
SEMICONDUCTORS BY ANGLE-RESOLVED PHOTOELECTRON
SPECTROSCOPY 367
YASUO NAKAYAMA AND HISAO ISHII
11 BAND BENDING AT METAL-SEMICONDUCTOR INTERFACES, FERROELECTRIC
SURFACES AND METAL-FERROELECTRIC INTERFACES INVESTIGATED BY
PHOTOELECTRON SPECTROSCOPY 405
NICOLETA GEORGIANA APOSTOL AND CRISTIAN-MIHAIL TEODORESCU
12 HIGHER RESOLUTION SCANNING PROBE METHODS FOR
MAGNETIC IMAGING 463
S. N. PIRAMANAYAGAM AND BINNI VARGHESE
13 IMAGING AND CHARACTERIZATION OF MAGNETIC MICRO- AND
NANOSTRUCTURES USING FORCE MICROSCOPY 489
STEPHAN BLOCK
14 COMBINING MICROMANIPULATION, KERR MAGNETOMETRY AND
MAGNETIC FORCE MICROSCOPY FOR CHARACTERIZATION OF
THREE-DIMENSIONAL
MAGNETIC
NANOSTRUCTURES 531
AMALIO FERNANDEZ-PACHECO, RUSSELL P. COWBURN,
LUIS E. SERRANO-RAMON, M. RICARDO IBARRA, AND JOSE M. DE TERESA
15 HIGH RESOLUTION STM IMAGING 561
ALEXANDER N. CHAIKA
16 NUMERICAL AND FINITE ELEMENT SIMULATIONS OF NANOTIPS FOR
FIM/FEM 621
MOH'D REZEQ, AHMED E. ALI, AND DIRAR HOMOUZ
INDEX 645 |
| any_adam_object | 1 |
| author2 | Kumar, Challa S. S. R. |
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| bvnumber | BV042560424 |
| classification_rvk | UP 7500 VE 9850 ZM 7605 |
| ctrlnum | (OCoLC)910583659 (DE-599)DNB1053831528 |
| dewey-full | 620.50287 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.50287 |
| dewey-search | 620.50287 |
| dewey-sort | 3620.50287 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Chemie / Pharmazie Maschinenbau / Maschinenwesen Physik Werkstoffwissenschaften / Fertigungstechnik |
| format | Book |
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| illustrated | Illustrated |
| indexdate | 2024-08-03T02:22:59Z |
| institution | BVB |
| isbn | 9783662445501 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027994131 |
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| physical | x, 652 Seiten Illustrationen, Diagramme |
| publishDate | 2015 |
| publishDateSearch | 2015 |
| publishDateSort | 2015 |
| publisher | Springer |
| record_format | marc |
| spelling | Surface science tools for nanomaterials characterization Challa S. S. R. Kumar, editor Berlin [und 4 weiteren] Springer [2015] x, 652 Seiten Illustrationen, Diagramme txt rdacontent n rdamedia nc rdacarrier Literaturangaben. - Zusätzliches Online-Angebot unter www.springermaterials.com Nanostrukturiertes Material (DE-588)4342626-8 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 gnd rswk-swf Research (DE-588)4143413-4 Aufsatzsammlung gnd-content Nanostrukturiertes Material (DE-588)4342626-8 s Oberflächenanalyse (DE-588)4172243-7 s DE-604 Kumar, Challa S. S. R. (DE-588)129740470 edt Erscheint auch als Online-Ausgabe 978-3-662-44551-8 X:MVB text/html http://deposit.dnb.de/cgi-bin/dokserv?id=4712556&prov=M&dok_var=1&dok_ext=htm Inhaltstext DNB Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=027994131&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Surface science tools for nanomaterials characterization Nanostrukturiertes Material (DE-588)4342626-8 gnd Oberflächenanalyse (DE-588)4172243-7 gnd |
| subject_GND | (DE-588)4342626-8 (DE-588)4172243-7 (DE-588)4143413-4 |
| title | Surface science tools for nanomaterials characterization |
| title_auth | Surface science tools for nanomaterials characterization |
| title_exact_search | Surface science tools for nanomaterials characterization |
| title_full | Surface science tools for nanomaterials characterization Challa S. S. R. Kumar, editor |
| title_fullStr | Surface science tools for nanomaterials characterization Challa S. S. R. Kumar, editor |
| title_full_unstemmed | Surface science tools for nanomaterials characterization Challa S. S. R. Kumar, editor |
| title_short | Surface science tools for nanomaterials characterization |
| title_sort | surface science tools for nanomaterials characterization |
| topic | Nanostrukturiertes Material (DE-588)4342626-8 gnd Oberflächenanalyse (DE-588)4172243-7 gnd |
| topic_facet | Nanostrukturiertes Material Oberflächenanalyse Aufsatzsammlung |
| url | http://deposit.dnb.de/cgi-bin/dokserv?id=4712556&prov=M&dok_var=1&dok_ext=htm http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=027994131&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| work_keys_str_mv | AT kumarchallassr surfacesciencetoolsfornanomaterialscharacterization |