Scanning probe microscopy: atomic force microscopy and scanning tunneling microscopy
Gespeichert in:
| Späterer Titel: | Voigtländer, Bert Atomic force microscopy |
|---|---|
| 1. Verfasser: | |
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Berlin ; Heidelberg
Springer
[2015]
|
| Schriftenreihe: | NanoScience and technology
|
| Schlagworte: | |
| Beschreibung: | ab 2. Aufl. u.d.T. "Atomic force microscopy" |
| Beschreibung: | xv, 382 Seiten Illustrationen, Diagramme |
| ISBN: | 9783662452394 |
| ISSN: | 1434-4904 |
Internformat
MARC
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| 245 | 1 | 0 | |a Scanning probe microscopy |b atomic force microscopy and scanning tunneling microscopy |c Bert Voigtländer |
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| 264 | 4 | |c © 2015 | |
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| 490 | 0 | |a NanoScience and technology |x 1434-4904 | |
| 500 | |a ab 2. Aufl. u.d.T. "Atomic force microscopy" | ||
| 650 | 4 | |a Engineering | |
| 650 | 4 | |a Nanotechnology | |
| 650 | 4 | |a Materials Science | |
| 650 | 4 | |a Nanotechnology and Microengineering | |
| 650 | 4 | |a Condensed Matter Physics | |
| 650 | 4 | |a Ingenieurwissenschaften | |
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| 999 | |a oai:aleph.bib-bvb.de:BVB01-027992395 | ||
Datensatz im Suchindex
| _version_ | 1804153331050872832 |
|---|---|
| any_adam_object | |
| author | Voigtländer, Bert |
| author_GND | (DE-588)1069225231 |
| author_facet | Voigtländer, Bert |
| author_role | aut |
| author_sort | Voigtländer, Bert |
| author_variant | b v bv |
| building | Verbundindex |
| bvnumber | BV042558657 |
| classification_rvk | UH 6320 |
| ctrlnum | (OCoLC)908621124 (DE-599)BVBBV042558657 |
| dewey-full | 620.115 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.115 |
| dewey-search | 620.115 |
| dewey-sort | 3620.115 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik |
| format | Book |
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| id | DE-604.BV042558657 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T01:24:54Z |
| institution | BVB |
| isbn | 9783662452394 |
| issn | 1434-4904 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027992395 |
| oclc_num | 908621124 |
| open_access_boolean | |
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| owner_facet | DE-703 DE-355 DE-BY-UBR DE-83 DE-634 DE-20 DE-29T |
| physical | xv, 382 Seiten Illustrationen, Diagramme |
| publishDate | 2015 |
| publishDateSearch | 2015 |
| publishDateSort | 2015 |
| publisher | Springer |
| record_format | marc |
| series2 | NanoScience and technology |
| spelling | Voigtländer, Bert Verfasser (DE-588)1069225231 aut Scanning probe microscopy atomic force microscopy and scanning tunneling microscopy Bert Voigtländer Berlin ; Heidelberg Springer [2015] © 2015 xv, 382 Seiten Illustrationen, Diagramme txt rdacontent n rdamedia nc rdacarrier NanoScience and technology 1434-4904 ab 2. Aufl. u.d.T. "Atomic force microscopy" Engineering Nanotechnology Materials Science Nanotechnology and Microengineering Condensed Matter Physics Ingenieurwissenschaften Rastersondenmikroskopie (DE-588)4330328-6 gnd rswk-swf Rastersondenmikroskopie (DE-588)4330328-6 s DE-604 Erscheint auch als Online-Ausgabe 978-3-662-45240-0 Aufgegangen in Voigtländer, Bert Atomic force microscopy 978-3-030-13653-6 |
| spellingShingle | Voigtländer, Bert Scanning probe microscopy atomic force microscopy and scanning tunneling microscopy Engineering Nanotechnology Materials Science Nanotechnology and Microengineering Condensed Matter Physics Ingenieurwissenschaften Rastersondenmikroskopie (DE-588)4330328-6 gnd |
| subject_GND | (DE-588)4330328-6 |
| title | Scanning probe microscopy atomic force microscopy and scanning tunneling microscopy |
| title_auth | Scanning probe microscopy atomic force microscopy and scanning tunneling microscopy |
| title_exact_search | Scanning probe microscopy atomic force microscopy and scanning tunneling microscopy |
| title_full | Scanning probe microscopy atomic force microscopy and scanning tunneling microscopy Bert Voigtländer |
| title_fullStr | Scanning probe microscopy atomic force microscopy and scanning tunneling microscopy Bert Voigtländer |
| title_full_unstemmed | Scanning probe microscopy atomic force microscopy and scanning tunneling microscopy Bert Voigtländer |
| title_new | Voigtländer, Bert Atomic force microscopy |
| title_short | Scanning probe microscopy |
| title_sort | scanning probe microscopy atomic force microscopy and scanning tunneling microscopy |
| title_sub | atomic force microscopy and scanning tunneling microscopy |
| topic | Engineering Nanotechnology Materials Science Nanotechnology and Microengineering Condensed Matter Physics Ingenieurwissenschaften Rastersondenmikroskopie (DE-588)4330328-6 gnd |
| topic_facet | Engineering Nanotechnology Materials Science Nanotechnology and Microengineering Condensed Matter Physics Ingenieurwissenschaften Rastersondenmikroskopie |
| work_keys_str_mv | AT voigtlanderbert scanningprobemicroscopyatomicforcemicroscopyandscanningtunnelingmicroscopy |