Reliability and failure of electronic materials and devices:
Gespeichert in:
Hauptverfasser: | , |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Amsterdam [u.a.]
Elsevier
2015
|
Ausgabe: | 2. ed. |
Schlagworte: | |
Online-Zugang: | Volltext |
Beschreibung: | 1 Online-Ressource (XXIV, 734 S.) Ill., graph. Darst. |
ISBN: | 9780080575520 9780120885749 |
Internformat
MARC
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Datensatz im Suchindex
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adam_text | |
any_adam_object | |
author | Ohring, Milton Kasprzak, Lucian |
author_facet | Ohring, Milton Kasprzak, Lucian |
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author_variant | m o mo l k lk |
building | Verbundindex |
bvnumber | BV042546981 |
callnumber-first | T - Technology |
callnumber-label | TK7870 |
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callnumber-search | TK7870.23 |
callnumber-sort | TK 47870.23 |
callnumber-subject | TK - Electrical and Nuclear Engineering |
classification_rvk | UQ 8050 UX 2150 ZN 4040 |
classification_tum | ELT 240f |
collection | ZDB-10-ESC |
ctrlnum | (OCoLC)910490153 (DE-599)BVBBV042546981 |
dewey-full | 621.381 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.381 |
dewey-search | 621.381 |
dewey-sort | 3621.381 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Physik Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
edition | 2. ed. |
format | Electronic eBook |
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id | DE-604.BV042546981 |
illustrated | Illustrated |
indexdate | 2024-07-31T01:10:29Z |
institution | BVB |
isbn | 9780080575520 9780120885749 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027980943 |
oclc_num | 910490153 |
open_access_boolean | |
owner | DE-91 DE-BY-TUM |
owner_facet | DE-91 DE-BY-TUM |
physical | 1 Online-Ressource (XXIV, 734 S.) Ill., graph. Darst. |
psigel | ZDB-10-ESC |
publishDate | 2015 |
publishDateSearch | 2015 |
publishDateSort | 2015 |
publisher | Elsevier |
record_format | marc |
spelling | Ohring, Milton Verfasser aut Reliability and failure of electronic materials and devices Milton Ohring with Lucian Kasprzak Electronic materials and devices 2. ed. Amsterdam [u.a.] Elsevier 2015 1 Online-Ressource (XXIV, 734 S.) Ill., graph. Darst. txt rdacontent c rdamedia cr rdacarrier Electronic apparatus and appliances Reliability System failures (Engineering) Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf Elektronisches Bauelement (DE-588)4014360-0 gnd rswk-swf Elektronisches Bauelement (DE-588)4014360-0 s Zuverlässigkeit (DE-588)4059245-5 s DE-604 Kasprzak, Lucian Verfasser aut https://app.knovel.com/web/toc.v/cid:kpRFEMDE06/viewerType:toc/root_slug:reliability-failure-electronic Verlag Volltext |
spellingShingle | Ohring, Milton Kasprzak, Lucian Reliability and failure of electronic materials and devices Electronic apparatus and appliances Reliability System failures (Engineering) Zuverlässigkeit (DE-588)4059245-5 gnd Elektronisches Bauelement (DE-588)4014360-0 gnd |
subject_GND | (DE-588)4059245-5 (DE-588)4014360-0 |
title | Reliability and failure of electronic materials and devices |
title_alt | Electronic materials and devices |
title_auth | Reliability and failure of electronic materials and devices |
title_exact_search | Reliability and failure of electronic materials and devices |
title_full | Reliability and failure of electronic materials and devices Milton Ohring with Lucian Kasprzak |
title_fullStr | Reliability and failure of electronic materials and devices Milton Ohring with Lucian Kasprzak |
title_full_unstemmed | Reliability and failure of electronic materials and devices Milton Ohring with Lucian Kasprzak |
title_short | Reliability and failure of electronic materials and devices |
title_sort | reliability and failure of electronic materials and devices |
topic | Electronic apparatus and appliances Reliability System failures (Engineering) Zuverlässigkeit (DE-588)4059245-5 gnd Elektronisches Bauelement (DE-588)4014360-0 gnd |
topic_facet | Electronic apparatus and appliances Reliability System failures (Engineering) Zuverlässigkeit Elektronisches Bauelement |
url | https://app.knovel.com/web/toc.v/cid:kpRFEMDE06/viewerType:toc/root_slug:reliability-failure-electronic |
work_keys_str_mv | AT ohringmilton reliabilityandfailureofelectronicmaterialsanddevices AT kasprzaklucian reliabilityandfailureofelectronicmaterialsanddevices AT ohringmilton electronicmaterialsanddevices AT kasprzaklucian electronicmaterialsanddevices |