On-Chip Electro-Static Discharge (ESD) protection for radio-frequency integrated circuits:
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Cham [u.a.]
Springer
2015
|
| Schlagworte: | |
| Online-Zugang: | TUM01 URL des Erstveröffentlichers Inhaltsverzeichnis Abstract |
| Beschreibung: | XVII, 86 p. 59 illus., 42 illus. in color |
| ISBN: | 9783319108193 9783319108186 |
| DOI: | 10.1007/978-3-319-10819-3 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV042481711 | ||
| 003 | DE-604 | ||
| 005 | 20160413 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 150402s2015 |||| o||u| ||||||eng d | ||
| 020 | |a 9783319108193 |c Online |9 978-3-319-10819-3 | ||
| 020 | |a 9783319108186 |c Print |9 978-3-319-10818-6 | ||
| 024 | 7 | |a 10.1007/978-3-319-10819-3 |2 doi | |
| 035 | |a (OCoLC)906188406 | ||
| 035 | |a (DE-599)BVBBV042481711 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-1046 |a DE-1043 |a DE-B768 |a DE-Aug4 |a DE-898 |a DE-573 |a DE-859 |a DE-863 |a DE-634 |a DE-92 |a DE-862 |a DE-861 |a DE-91 |a DE-706 | ||
| 082 | 0 | |a 621.3815 |2 23 | |
| 084 | |a MAS 000 |2 stub | ||
| 084 | |a ELT 000 |2 stub | ||
| 245 | 1 | 0 | |a On-Chip Electro-Static Discharge (ESD) protection for radio-frequency integrated circuits |c Qiang Cui ... |
| 264 | 1 | |a Cham [u.a.] |b Springer |c 2015 | |
| 300 | |a XVII, 86 p. 59 illus., 42 illus. in color | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 650 | 4 | |a Engineering | |
| 650 | 4 | |a Electronics | |
| 650 | 4 | |a Systems engineering | |
| 650 | 4 | |a Circuits and Systems | |
| 650 | 4 | |a Electronic Circuits and Devices | |
| 650 | 4 | |a Electronics and Microelectronics, Instrumentation | |
| 650 | 4 | |a Ingenieurwissenschaften | |
| 700 | 1 | |a Cui, Qiang |e Sonstige |0 (DE-588)136221947 |4 oth | |
| 856 | 4 | 0 | |u https://doi.org/10.1007/978-3-319-10819-3 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 856 | 4 | 2 | |m Springer Fremddatenuebernahme |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=027916670&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Inhaltsverzeichnis |
| 856 | 4 | 2 | |m Springer Fremddatenuebernahme |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=027916670&sequence=000003&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA |3 Abstract |
| 912 | |a ZDB-2-ENG |a ZDB-26-MYL | ||
| 940 | 1 | |q ZDB-2-ENG_2015 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-027916670 | ||
| 966 | e | |u https://ebookcentral.proquest.com/lib/munchentech/detail.action?docID=1998663 |l TUM01 |p ZDB-26-MYL |q TUM_PDA_MIL_gekauft |x Aggregator |3 Volltext | |
Datensatz im Suchindex
| DE-BY-FWS_katkey | 554320 |
|---|---|
| _version_ | 1824554416013836288 |
| adam_text | ON-CHIP ELECTRO-STATIC DISCHARGE (ESD) PROTECTION FOR RADIO-FREQUENCY
INTEGRATED CIRCUITS
/ CUI, QIANG
: 2015
TABLE OF CONTENTS / INHALTSVERZEICHNIS
BASICS IN ESD PROTECTION OF RADIO FREQUENCY INTEGRATED CIRCUITS
ON-CHIP PROTECTION SOLUTION FOR RADIO FREQUENCY INTEGRATED CIRCUITS IN
STANDARD CMOS PROCESS
DESIGN OF SIGE SCR DEVICES FOR RADIO FREQUENCY INTEGRATED CIRCUITS IN
SIGE BICMOS PROCESS
ON-CHIP RADIO FREQUENCY ESD PROTECTION SOLUTION IN GAAS PHEMT PROCESS
CONCLUSION
DIESES SCHRIFTSTUECK WURDE MASCHINELL ERZEUGT.
ON-CHIP ELECTRO-STATIC DISCHARGE (ESD) PROTECTION FOR RADIO-FREQUENCY
INTEGRATED CIRCUITS
/ CUI, QIANG
: 2015
ABSTRACT / INHALTSTEXT
THIS BOOK ENABLES READERS TO DESIGN EFFECTIVE ESD PROTECTION SOLUTIONS
FOR ALL MAINSTREAM RF FABRICATION PROCESSES (GAAS PHEMT, SIGE HBT,
CMOS). THE NEW TECHNIQUES INTRODUCED BY THE AUTHORS HAVE MUCH HIGHER
PROTECTION LEVELS AND MUCH LOWER PARASITIC EFFECTS THAN THOSE OF
EXISTING ESD PROTECTION DEVICES. THE AUTHORS DESCRIBE IN DETAIL THE ESD
PHENOMENON, AS WELL AS ESD PROTECTION FUNDAMENTALS, STANDARDS, TEST
EQUIPMENT, AND BASIC DESIGN STRATEGIES. READERS WILL BENEFIT FROM
REALISTIC CASE STUDIES OF ESD PROTECTION FOR RFICS AND WILL LEARN TO
INCREASE SIGNIFICANTLY MODERN RFICS’ ESD SAFETY LEVEL, WHILE
MAXIMIZING RF PERFORMANCE. DESCRIBES IN DETAIL THE ESD PHENOMENON, AS
WELL AS ESD PROTECTION FUNDAMENTALS, STANDARDS, TEST EQUIPMENT, AND
BASIC DESIGN STRATEGIES; ENABLES READERS TO DESIGN EFFECTIVE ESD
PROTECTION SOLUTIONS FOR ALL MAINSTREAM RF FABRICATION PROCESSES (GAAS
PHEMT, SIGE HBT, CMOS); INCLUDES REALISTIC CASE STUDIES OF ESD
PROTECTION FOR RFICS THAT RESULTED IN SIGNIFICANTLY INCREASED ESD SAFETY
LEVEL, WHILE MAXIMIZING RF PERFORMANCE
DIESES SCHRIFTSTUECK WURDE MASCHINELL ERZEUGT.
|
| any_adam_object | 1 |
| author_GND | (DE-588)136221947 |
| building | Verbundindex |
| bvnumber | BV042481711 |
| classification_tum | MAS 000 ELT 000 |
| collection | ZDB-2-ENG ZDB-26-MYL |
| ctrlnum | (OCoLC)906188406 (DE-599)BVBBV042481711 |
| dewey-full | 621.3815 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815 |
| dewey-search | 621.3815 |
| dewey-sort | 3621.3815 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik Maschinenbau |
| doi_str_mv | 10.1007/978-3-319-10819-3 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02226nmm a2200469zc 4500</leader><controlfield tag="001">BV042481711</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20160413 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">150402s2015 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783319108193</subfield><subfield code="c">Online</subfield><subfield code="9">978-3-319-10819-3</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783319108186</subfield><subfield code="c">Print</subfield><subfield code="9">978-3-319-10818-6</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-3-319-10819-3</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)906188406</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV042481711</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-1046</subfield><subfield code="a">DE-1043</subfield><subfield code="a">DE-B768</subfield><subfield code="a">DE-Aug4</subfield><subfield code="a">DE-898</subfield><subfield code="a">DE-573</subfield><subfield code="a">DE-859</subfield><subfield code="a">DE-863</subfield><subfield code="a">DE-634</subfield><subfield code="a">DE-92</subfield><subfield code="a">DE-862</subfield><subfield code="a">DE-861</subfield><subfield code="a">DE-91</subfield><subfield code="a">DE-706</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">MAS 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">On-Chip Electro-Static Discharge (ESD) protection for radio-frequency integrated circuits</subfield><subfield code="c">Qiang Cui ...</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cham [u.a.]</subfield><subfield code="b">Springer</subfield><subfield code="c">2015</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XVII, 86 p. 59 illus., 42 illus. in color</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Systems engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Circuits and Systems</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic Circuits and Devices</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics and Microelectronics, Instrumentation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Ingenieurwissenschaften</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Cui, Qiang</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)136221947</subfield><subfield code="4">oth</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-3-319-10819-3</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">Springer Fremddatenuebernahme</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=027916670&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">Springer Fremddatenuebernahme</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=027916670&sequence=000003&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Abstract</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-ENG</subfield><subfield code="a">ZDB-26-MYL</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-ENG_2015</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-027916670</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://ebookcentral.proquest.com/lib/munchentech/detail.action?docID=1998663</subfield><subfield code="l">TUM01</subfield><subfield code="p">ZDB-26-MYL</subfield><subfield code="q">TUM_PDA_MIL_gekauft</subfield><subfield code="x">Aggregator</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV042481711 |
| illustrated | Not Illustrated |
| indexdate | 2025-02-20T06:51:25Z |
| institution | BVB |
| isbn | 9783319108193 9783319108186 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027916670 |
| oclc_num | 906188406 |
| open_access_boolean | |
| owner | DE-1046 DE-1043 DE-B768 DE-Aug4 DE-898 DE-BY-UBR DE-573 DE-859 DE-863 DE-BY-FWS DE-634 DE-92 DE-862 DE-BY-FWS DE-861 DE-91 DE-BY-TUM DE-706 |
| owner_facet | DE-1046 DE-1043 DE-B768 DE-Aug4 DE-898 DE-BY-UBR DE-573 DE-859 DE-863 DE-BY-FWS DE-634 DE-92 DE-862 DE-BY-FWS DE-861 DE-91 DE-BY-TUM DE-706 |
| physical | XVII, 86 p. 59 illus., 42 illus. in color |
| psigel | ZDB-2-ENG ZDB-26-MYL ZDB-2-ENG_2015 ZDB-26-MYL TUM_PDA_MIL_gekauft |
| publishDate | 2015 |
| publishDateSearch | 2015 |
| publishDateSort | 2015 |
| publisher | Springer |
| record_format | marc |
| spellingShingle | On-Chip Electro-Static Discharge (ESD) protection for radio-frequency integrated circuits Engineering Electronics Systems engineering Circuits and Systems Electronic Circuits and Devices Electronics and Microelectronics, Instrumentation Ingenieurwissenschaften |
| title | On-Chip Electro-Static Discharge (ESD) protection for radio-frequency integrated circuits |
| title_auth | On-Chip Electro-Static Discharge (ESD) protection for radio-frequency integrated circuits |
| title_exact_search | On-Chip Electro-Static Discharge (ESD) protection for radio-frequency integrated circuits |
| title_full | On-Chip Electro-Static Discharge (ESD) protection for radio-frequency integrated circuits Qiang Cui ... |
| title_fullStr | On-Chip Electro-Static Discharge (ESD) protection for radio-frequency integrated circuits Qiang Cui ... |
| title_full_unstemmed | On-Chip Electro-Static Discharge (ESD) protection for radio-frequency integrated circuits Qiang Cui ... |
| title_short | On-Chip Electro-Static Discharge (ESD) protection for radio-frequency integrated circuits |
| title_sort | on chip electro static discharge esd protection for radio frequency integrated circuits |
| topic | Engineering Electronics Systems engineering Circuits and Systems Electronic Circuits and Devices Electronics and Microelectronics, Instrumentation Ingenieurwissenschaften |
| topic_facet | Engineering Electronics Systems engineering Circuits and Systems Electronic Circuits and Devices Electronics and Microelectronics, Instrumentation Ingenieurwissenschaften |
| url | https://doi.org/10.1007/978-3-319-10819-3 http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=027916670&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=027916670&sequence=000003&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA |
| work_keys_str_mv | AT cuiqiang onchipelectrostaticdischargeesdprotectionforradiofrequencyintegratedcircuits |