Optical and Electronic Process of Nano-Matters:
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Dordrecht
Springer Netherlands
2001
|
Schriftenreihe: | Advances in Optoelectronics (ADOP)
8 |
Schlagworte: | |
Online-Zugang: | Volltext |
Beschreibung: | Sizes of electronic and photonic devices are decreasing drastically in order to increase the degree of integration for large-capacity and ultrahigh speed signal transmission and information processing. This miniaturization must be rapidly progressed from now onward. For this progress, the sizes of materials for composing these devices will be also decreased to several nanometers. If such a nanometer-sized material is combined with the photons and/or some other fields, it can exhibit specific characters, which are considerably different from those ofbulky macroscopic systems. This combined system has been called as a mesoscopic system. The first purpose of this book is to study the physics of the mesoscopic system. For this study, it is essential to diagnose the characteristics of miniaturized devices and materials with the spatial resolution as high as several nanometers or even higher. Therefore, novel methods, e.g., scanning probe microscopy, should be developed for such the high-resolution diagnostics. The second purpose of this book is to explore the possibility of developing new methods for these diagnostics by utilizing local interaction between materials and electron, photon, atomic force, and so on. Conformation and structure of the materials of the mesoscopic system can be modified by enhancing the local interaction between the materials and electromagnetic field. This modification can suggest the possibility of novel nano-fabrication methods. The third purpose of this book is to explore the methods for such nano-fabrication |
Beschreibung: | 1 Online-Ressource (XII, 334 p) |
ISBN: | 9789401724821 9789048157075 |
DOI: | 10.1007/978-94-017-2482-1 |
Internformat
MARC
LEADER | 00000nmm a2200000zcb4500 | ||
---|---|---|---|
001 | BV042416317 | ||
003 | DE-604 | ||
005 | 00000000000000.0 | ||
007 | cr|uuu---uuuuu | ||
008 | 150316s2001 |||| o||u| ||||||eng d | ||
020 | |a 9789401724821 |c Online |9 978-94-017-2482-1 | ||
020 | |a 9789048157075 |c Print |9 978-90-481-5707-5 | ||
024 | 7 | |a 10.1007/978-94-017-2482-1 |2 doi | |
035 | |a (OCoLC)864002576 | ||
035 | |a (DE-599)BVBBV042416317 | ||
040 | |a DE-604 |b ger |e aacr | ||
041 | 0 | |a eng | |
049 | |a DE-91 |a DE-83 | ||
082 | 0 | |a 620.11 |2 23 | |
084 | |a PHY 000 |2 stub | ||
100 | 1 | |a Ohtsu, Motoichi |e Verfasser |4 aut | |
245 | 1 | 0 | |a Optical and Electronic Process of Nano-Matters |c edited by Motoichi Ohtsu |
264 | 1 | |a Dordrecht |b Springer Netherlands |c 2001 | |
300 | |a 1 Online-Ressource (XII, 334 p) | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
490 | 0 | |a Advances in Optoelectronics (ADOP) |v 8 | |
500 | |a Sizes of electronic and photonic devices are decreasing drastically in order to increase the degree of integration for large-capacity and ultrahigh speed signal transmission and information processing. This miniaturization must be rapidly progressed from now onward. For this progress, the sizes of materials for composing these devices will be also decreased to several nanometers. If such a nanometer-sized material is combined with the photons and/or some other fields, it can exhibit specific characters, which are considerably different from those ofbulky macroscopic systems. This combined system has been called as a mesoscopic system. The first purpose of this book is to study the physics of the mesoscopic system. For this study, it is essential to diagnose the characteristics of miniaturized devices and materials with the spatial resolution as high as several nanometers or even higher. Therefore, novel methods, e.g., scanning probe microscopy, should be developed for such the high-resolution diagnostics. The second purpose of this book is to explore the possibility of developing new methods for these diagnostics by utilizing local interaction between materials and electron, photon, atomic force, and so on. Conformation and structure of the materials of the mesoscopic system can be modified by enhancing the local interaction between the materials and electromagnetic field. This modification can suggest the possibility of novel nano-fabrication methods. The third purpose of this book is to explore the methods for such nano-fabrication | ||
650 | 4 | |a Computer engineering | |
650 | 4 | |a Optical materials | |
650 | 4 | |a Surfaces (Physics) | |
650 | 4 | |a Materials Science | |
650 | 4 | |a Characterization and Evaluation of Materials | |
650 | 4 | |a Surfaces and Interfaces, Thin Films | |
650 | 4 | |a Optics, Optoelectronics, Plasmonics and Optical Devices | |
650 | 4 | |a Optical and Electronic Materials | |
650 | 4 | |a Electrical Engineering | |
650 | 0 | 7 | |a Elektronische Eigenschaft |0 (DE-588)4235053-0 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Mesoskopisches System |0 (DE-588)4280799-2 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a Mesoskopisches System |0 (DE-588)4280799-2 |D s |
689 | 0 | 1 | |a Elektronische Eigenschaft |0 (DE-588)4235053-0 |D s |
689 | 0 | |8 1\p |5 DE-604 | |
856 | 4 | 0 | |u https://doi.org/10.1007/978-94-017-2482-1 |x Verlag |3 Volltext |
912 | |a ZDB-2-PHA |a ZDB-2-BAE | ||
940 | 1 | |q ZDB-2-PHA_Archive | |
999 | |a oai:aleph.bib-bvb.de:BVB01-027851810 | ||
883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk |
Datensatz im Suchindex
_version_ | 1804153084628172800 |
---|---|
any_adam_object | |
author | Ohtsu, Motoichi |
author_facet | Ohtsu, Motoichi |
author_role | aut |
author_sort | Ohtsu, Motoichi |
author_variant | m o mo |
building | Verbundindex |
bvnumber | BV042416317 |
classification_tum | PHY 000 |
collection | ZDB-2-PHA ZDB-2-BAE |
ctrlnum | (OCoLC)864002576 (DE-599)BVBBV042416317 |
dewey-full | 620.11 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 620 - Engineering and allied operations |
dewey-raw | 620.11 |
dewey-search | 620.11 |
dewey-sort | 3620.11 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Physik |
doi_str_mv | 10.1007/978-94-017-2482-1 |
format | Electronic eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03511nmm a2200541zcb4500</leader><controlfield tag="001">BV042416317</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">150316s2001 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9789401724821</subfield><subfield code="c">Online</subfield><subfield code="9">978-94-017-2482-1</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9789048157075</subfield><subfield code="c">Print</subfield><subfield code="9">978-90-481-5707-5</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-94-017-2482-1</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)864002576</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV042416317</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">620.11</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Ohtsu, Motoichi</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Optical and Electronic Process of Nano-Matters</subfield><subfield code="c">edited by Motoichi Ohtsu</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Dordrecht</subfield><subfield code="b">Springer Netherlands</subfield><subfield code="c">2001</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XII, 334 p)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Advances in Optoelectronics (ADOP)</subfield><subfield code="v">8</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Sizes of electronic and photonic devices are decreasing drastically in order to increase the degree of integration for large-capacity and ultrahigh speed signal transmission and information processing. This miniaturization must be rapidly progressed from now onward. For this progress, the sizes of materials for composing these devices will be also decreased to several nanometers. If such a nanometer-sized material is combined with the photons and/or some other fields, it can exhibit specific characters, which are considerably different from those ofbulky macroscopic systems. This combined system has been called as a mesoscopic system. The first purpose of this book is to study the physics of the mesoscopic system. For this study, it is essential to diagnose the characteristics of miniaturized devices and materials with the spatial resolution as high as several nanometers or even higher. Therefore, novel methods, e.g., scanning probe microscopy, should be developed for such the high-resolution diagnostics. The second purpose of this book is to explore the possibility of developing new methods for these diagnostics by utilizing local interaction between materials and electron, photon, atomic force, and so on. Conformation and structure of the materials of the mesoscopic system can be modified by enhancing the local interaction between the materials and electromagnetic field. This modification can suggest the possibility of novel nano-fabrication methods. The third purpose of this book is to explore the methods for such nano-fabrication</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Computer engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Surfaces (Physics)</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Materials Science</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Characterization and Evaluation of Materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Surfaces and Interfaces, Thin Films</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optics, Optoelectronics, Plasmonics and Optical Devices</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical and Electronic Materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electrical Engineering</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronische Eigenschaft</subfield><subfield code="0">(DE-588)4235053-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mesoskopisches System</subfield><subfield code="0">(DE-588)4280799-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Mesoskopisches System</subfield><subfield code="0">(DE-588)4280799-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Elektronische Eigenschaft</subfield><subfield code="0">(DE-588)4235053-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-94-017-2482-1</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-PHA</subfield><subfield code="a">ZDB-2-BAE</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-PHA_Archive</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-027851810</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
id | DE-604.BV042416317 |
illustrated | Not Illustrated |
indexdate | 2024-07-10T01:20:59Z |
institution | BVB |
isbn | 9789401724821 9789048157075 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027851810 |
oclc_num | 864002576 |
open_access_boolean | |
owner | DE-91 DE-BY-TUM DE-83 |
owner_facet | DE-91 DE-BY-TUM DE-83 |
physical | 1 Online-Ressource (XII, 334 p) |
psigel | ZDB-2-PHA ZDB-2-BAE ZDB-2-PHA_Archive |
publishDate | 2001 |
publishDateSearch | 2001 |
publishDateSort | 2001 |
publisher | Springer Netherlands |
record_format | marc |
series2 | Advances in Optoelectronics (ADOP) |
spelling | Ohtsu, Motoichi Verfasser aut Optical and Electronic Process of Nano-Matters edited by Motoichi Ohtsu Dordrecht Springer Netherlands 2001 1 Online-Ressource (XII, 334 p) txt rdacontent c rdamedia cr rdacarrier Advances in Optoelectronics (ADOP) 8 Sizes of electronic and photonic devices are decreasing drastically in order to increase the degree of integration for large-capacity and ultrahigh speed signal transmission and information processing. This miniaturization must be rapidly progressed from now onward. For this progress, the sizes of materials for composing these devices will be also decreased to several nanometers. If such a nanometer-sized material is combined with the photons and/or some other fields, it can exhibit specific characters, which are considerably different from those ofbulky macroscopic systems. This combined system has been called as a mesoscopic system. The first purpose of this book is to study the physics of the mesoscopic system. For this study, it is essential to diagnose the characteristics of miniaturized devices and materials with the spatial resolution as high as several nanometers or even higher. Therefore, novel methods, e.g., scanning probe microscopy, should be developed for such the high-resolution diagnostics. The second purpose of this book is to explore the possibility of developing new methods for these diagnostics by utilizing local interaction between materials and electron, photon, atomic force, and so on. Conformation and structure of the materials of the mesoscopic system can be modified by enhancing the local interaction between the materials and electromagnetic field. This modification can suggest the possibility of novel nano-fabrication methods. The third purpose of this book is to explore the methods for such nano-fabrication Computer engineering Optical materials Surfaces (Physics) Materials Science Characterization and Evaluation of Materials Surfaces and Interfaces, Thin Films Optics, Optoelectronics, Plasmonics and Optical Devices Optical and Electronic Materials Electrical Engineering Elektronische Eigenschaft (DE-588)4235053-0 gnd rswk-swf Mesoskopisches System (DE-588)4280799-2 gnd rswk-swf Mesoskopisches System (DE-588)4280799-2 s Elektronische Eigenschaft (DE-588)4235053-0 s 1\p DE-604 https://doi.org/10.1007/978-94-017-2482-1 Verlag Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Ohtsu, Motoichi Optical and Electronic Process of Nano-Matters Computer engineering Optical materials Surfaces (Physics) Materials Science Characterization and Evaluation of Materials Surfaces and Interfaces, Thin Films Optics, Optoelectronics, Plasmonics and Optical Devices Optical and Electronic Materials Electrical Engineering Elektronische Eigenschaft (DE-588)4235053-0 gnd Mesoskopisches System (DE-588)4280799-2 gnd |
subject_GND | (DE-588)4235053-0 (DE-588)4280799-2 |
title | Optical and Electronic Process of Nano-Matters |
title_auth | Optical and Electronic Process of Nano-Matters |
title_exact_search | Optical and Electronic Process of Nano-Matters |
title_full | Optical and Electronic Process of Nano-Matters edited by Motoichi Ohtsu |
title_fullStr | Optical and Electronic Process of Nano-Matters edited by Motoichi Ohtsu |
title_full_unstemmed | Optical and Electronic Process of Nano-Matters edited by Motoichi Ohtsu |
title_short | Optical and Electronic Process of Nano-Matters |
title_sort | optical and electronic process of nano matters |
topic | Computer engineering Optical materials Surfaces (Physics) Materials Science Characterization and Evaluation of Materials Surfaces and Interfaces, Thin Films Optics, Optoelectronics, Plasmonics and Optical Devices Optical and Electronic Materials Electrical Engineering Elektronische Eigenschaft (DE-588)4235053-0 gnd Mesoskopisches System (DE-588)4280799-2 gnd |
topic_facet | Computer engineering Optical materials Surfaces (Physics) Materials Science Characterization and Evaluation of Materials Surfaces and Interfaces, Thin Films Optics, Optoelectronics, Plasmonics and Optical Devices Optical and Electronic Materials Electrical Engineering Elektronische Eigenschaft Mesoskopisches System |
url | https://doi.org/10.1007/978-94-017-2482-1 |
work_keys_str_mv | AT ohtsumotoichi opticalandelectronicprocessofnanomatters |