Transmission electron microscopy: physics of image formation and microanalysis
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Berlin, Heidelberg
Springer Berlin Heidelberg
1997
|
| Ausgabe: | Fourth Edition |
| Schriftenreihe: | Springer Series in Optical Sciences
36 |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | Transmission Electron Microscopy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fourth edition includes discussion of recent progress, especially in the area of Schottky emission guns, convergent-beam electron diffraction, electron tomography, holography and the high resolution of crystal lattices |
| Beschreibung: | 1 Online-Ressource (XVI, 587 p) |
| ISBN: | 9783662148242 9783662148266 |
| DOI: | 10.1007/978-3-662-14824-2 |
Internformat
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Datensatz im Suchindex
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| discipline | Physik |
| doi_str_mv | 10.1007/978-3-662-14824-2 |
| edition | Fourth Edition |
| format | Electronic eBook |
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| indexdate | 2024-07-10T01:20:55Z |
| institution | BVB |
| isbn | 9783662148242 9783662148266 |
| language | English |
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| physical | 1 Online-Ressource (XVI, 587 p) |
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| publishDate | 1997 |
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| series | Springer Series in Optical Sciences |
| series2 | Springer Series in Optical Sciences |
| spelling | Reimer, Ludwig 1928- Verfasser (DE-588)13230130X aut Transmission electron microscopy physics of image formation and microanalysis Ludwig Reimer Fourth Edition Berlin, Heidelberg Springer Berlin Heidelberg 1997 1 Online-Ressource (XVI, 587 p) txt rdacontent c rdamedia cr rdacarrier Springer Series in Optical Sciences 36 Transmission Electron Microscopy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fourth edition includes discussion of recent progress, especially in the area of Schottky emission guns, convergent-beam electron diffraction, electron tomography, holography and the high resolution of crystal lattices Physics Cytology Measurement Science and Instrumentation Cell Biology Kristallstruktur (DE-588)4136176-3 gnd rswk-swf Mikroanalyse (DE-588)4169804-6 gnd rswk-swf Physik (DE-588)4045956-1 gnd rswk-swf Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Beugung (DE-588)4145094-2 gnd rswk-swf Elektron (DE-588)4125978-6 gnd rswk-swf Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 s DE-604 Elektron (DE-588)4125978-6 s 1\p DE-604 Physik (DE-588)4045956-1 s 2\p DE-604 Beugung (DE-588)4145094-2 s 3\p DE-604 Mikroanalyse (DE-588)4169804-6 s 4\p DE-604 Kristallstruktur (DE-588)4136176-3 s 5\p DE-604 Elektronenmikroskopie (DE-588)4014327-2 s 6\p DE-604 Springer Series in Optical Sciences 36 (DE-604)BV000000237 36 https://doi.org/10.1007/978-3-662-14824-2 Verlag Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 5\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 6\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Reimer, Ludwig 1928- Transmission electron microscopy physics of image formation and microanalysis Springer Series in Optical Sciences Physics Cytology Measurement Science and Instrumentation Cell Biology Kristallstruktur (DE-588)4136176-3 gnd Mikroanalyse (DE-588)4169804-6 gnd Physik (DE-588)4045956-1 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Beugung (DE-588)4145094-2 gnd Elektron (DE-588)4125978-6 gnd |
| subject_GND | (DE-588)4136176-3 (DE-588)4169804-6 (DE-588)4045956-1 (DE-588)4215608-7 (DE-588)4014327-2 (DE-588)4145094-2 (DE-588)4125978-6 |
| title | Transmission electron microscopy physics of image formation and microanalysis |
| title_auth | Transmission electron microscopy physics of image formation and microanalysis |
| title_exact_search | Transmission electron microscopy physics of image formation and microanalysis |
| title_full | Transmission electron microscopy physics of image formation and microanalysis Ludwig Reimer |
| title_fullStr | Transmission electron microscopy physics of image formation and microanalysis Ludwig Reimer |
| title_full_unstemmed | Transmission electron microscopy physics of image formation and microanalysis Ludwig Reimer |
| title_short | Transmission electron microscopy |
| title_sort | transmission electron microscopy physics of image formation and microanalysis |
| title_sub | physics of image formation and microanalysis |
| topic | Physics Cytology Measurement Science and Instrumentation Cell Biology Kristallstruktur (DE-588)4136176-3 gnd Mikroanalyse (DE-588)4169804-6 gnd Physik (DE-588)4045956-1 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Beugung (DE-588)4145094-2 gnd Elektron (DE-588)4125978-6 gnd |
| topic_facet | Physics Cytology Measurement Science and Instrumentation Cell Biology Kristallstruktur Mikroanalyse Physik Durchstrahlungselektronenmikroskopie Elektronenmikroskopie Beugung Elektron |
| url | https://doi.org/10.1007/978-3-662-14824-2 |
| volume_link | (DE-604)BV000000237 |
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