X-Ray Spectroscopy: An Introduction
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Bibliographische Detailangaben
1. Verfasser: Agarwal, Bipin K. (VerfasserIn)
Format: Elektronisch E-Book
Sprache:English
Veröffentlicht: Berlin, Heidelberg Springer Berlin Heidelberg 1979
Schriftenreihe:Springer Series in Optical Sciences 15
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Beschreibung:Röntgen's discovery of X-rays in 1895 launched a subject which became central to the development of modern physics. The verification of many of the predictions of quantum theory by X-ray spectroscopy in the early part of the twentieth century stimulated great interest in this area, which has subsequently influenced fields as diverse as chemical physics, nuclear physics, and the study of the electronic properties of solids, and led to the development of techniques such as Auger, Raman, and X-ray photoelectron spectroscopy. The improvement of the theoretical understanding of the physics underlying X-ray spectroscopy has been accompanied by advances in experimental techniques, and the subject provides an instructive example of how progress on both these fronts can be mutually beneficial. This book strikes a balance between historical description, which illustrates this symbiosis, and the discussion of new developments. The application of X-ray spectroscopic methods to the investigation of chemical bonding receives special attention, and an up-to-date account is given of the use of extended X-ray absorption fine structure (EXAFS) in determining interatomic distances, which has attracted much attention during the last decade. This monograph is intended to be used as a basic text for a one-year course at postgraduate level, and aims to provide the general background that is essential to enable the reader to participate fruitfully in the growing research activity in this field
Beschreibung:1 Online-Ressource (XIII, 420 p)
ISBN:9783662144695
9783662144718
ISSN:0342-4111
DOI:10.1007/978-3-662-14469-5

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