Scanning Probe Microscopy: The Lab on a Tip
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Berlin, Heidelberg
Springer Berlin Heidelberg
2004
|
| Schriftenreihe: | Advanced Texts in Physics
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| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques |
| Beschreibung: | 1 Online-Ressource (X, 210 p) |
| ISBN: | 9783662098011 9783642077371 |
| ISSN: | 1439-2674 |
| DOI: | 10.1007/978-3-662-09801-1 |
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Datensatz im Suchindex
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| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
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| dewey-search | 620.44 |
| dewey-sort | 3620.44 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik |
| doi_str_mv | 10.1007/978-3-662-09801-1 |
| format | Electronic eBook |
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| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:20:55Z |
| institution | BVB |
| isbn | 9783662098011 9783642077371 |
| issn | 1439-2674 |
| language | English |
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| spelling | Meyer, Ernst Verfasser aut Scanning Probe Microscopy The Lab on a Tip by Ernst Meyer, Hans Josef Hug, Roland Bennewitz Berlin, Heidelberg Springer Berlin Heidelberg 2004 1 Online-Ressource (X, 210 p) txt rdacontent c rdamedia cr rdacarrier Advanced Texts in Physics 1439-2674 Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques Nanotechnology Surfaces (Physics) Materials Science Surfaces and Interfaces, Thin Films Measurement Science and Instrumentation Solid State Physics Spectroscopy and Microscopy Condensed Matter Physics Rastersondenmikroskopie (DE-588)4330328-6 gnd rswk-swf Rastersondenmikroskopie (DE-588)4330328-6 s 1\p DE-604 Hug, Hans Josef Sonstige oth Bennewitz, Roland Sonstige oth https://doi.org/10.1007/978-3-662-09801-1 Verlag Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Meyer, Ernst Scanning Probe Microscopy The Lab on a Tip Nanotechnology Surfaces (Physics) Materials Science Surfaces and Interfaces, Thin Films Measurement Science and Instrumentation Solid State Physics Spectroscopy and Microscopy Condensed Matter Physics Rastersondenmikroskopie (DE-588)4330328-6 gnd |
| subject_GND | (DE-588)4330328-6 |
| title | Scanning Probe Microscopy The Lab on a Tip |
| title_auth | Scanning Probe Microscopy The Lab on a Tip |
| title_exact_search | Scanning Probe Microscopy The Lab on a Tip |
| title_full | Scanning Probe Microscopy The Lab on a Tip by Ernst Meyer, Hans Josef Hug, Roland Bennewitz |
| title_fullStr | Scanning Probe Microscopy The Lab on a Tip by Ernst Meyer, Hans Josef Hug, Roland Bennewitz |
| title_full_unstemmed | Scanning Probe Microscopy The Lab on a Tip by Ernst Meyer, Hans Josef Hug, Roland Bennewitz |
| title_short | Scanning Probe Microscopy |
| title_sort | scanning probe microscopy the lab on a tip |
| title_sub | The Lab on a Tip |
| topic | Nanotechnology Surfaces (Physics) Materials Science Surfaces and Interfaces, Thin Films Measurement Science and Instrumentation Solid State Physics Spectroscopy and Microscopy Condensed Matter Physics Rastersondenmikroskopie (DE-588)4330328-6 gnd |
| topic_facet | Nanotechnology Surfaces (Physics) Materials Science Surfaces and Interfaces, Thin Films Measurement Science and Instrumentation Solid State Physics Spectroscopy and Microscopy Condensed Matter Physics Rastersondenmikroskopie |
| url | https://doi.org/10.1007/978-3-662-09801-1 |
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