Diffraction Analysis of the Microstructure of Materials:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Berlin, Heidelberg
Springer Berlin Heidelberg
2004
|
| Schriftenreihe: | Springer Series in Materials Science
68 |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | Diffraction Analysis of the Microstructure of Materials provides an overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves |
| Beschreibung: | 1 Online-Ressource (XXV, 554 p) |
| ISBN: | 9783662067239 9783642073526 |
| ISSN: | 0933-033X |
| DOI: | 10.1007/978-3-662-06723-9 |
Internformat
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| 500 | |a Diffraction Analysis of the Microstructure of Materials provides an overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves | ||
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Datensatz im Suchindex
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| author | Mittemeijer, Eric J. |
| author_facet | Mittemeijer, Eric J. |
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| author_sort | Mittemeijer, Eric J. |
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| bvnumber | BV042414461 |
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| dewey-full | 530.41 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 530 - Physics |
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| discipline | Physik |
| doi_str_mv | 10.1007/978-3-662-06723-9 |
| format | Electronic eBook |
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| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:20:55Z |
| institution | BVB |
| isbn | 9783662067239 9783642073526 |
| issn | 0933-033X |
| language | English |
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| spelling | Mittemeijer, Eric J. Verfasser aut Diffraction Analysis of the Microstructure of Materials edited by Eric J. Mittemeijer, Paolo Scardi Berlin, Heidelberg Springer Berlin Heidelberg 2004 1 Online-Ressource (XXV, 554 p) txt rdacontent c rdamedia cr rdacarrier Springer Series in Materials Science 68 0933-033X Diffraction Analysis of the Microstructure of Materials provides an overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves Physics Crystallography Engineering Nanotechnology Surfaces (Physics) Condensed Matter Physics Characterization and Evaluation of Materials Surfaces and Interfaces, Thin Films Engineering, general Ingenieurwissenschaften Röntgendiffraktometrie (DE-588)4336833-5 gnd rswk-swf Werkstoff (DE-588)4065579-9 gnd rswk-swf Mikrostruktur (DE-588)4131028-7 gnd rswk-swf Werkstoff (DE-588)4065579-9 s Mikrostruktur (DE-588)4131028-7 s Röntgendiffraktometrie (DE-588)4336833-5 s 1\p DE-604 Scardi, Paolo Sonstige oth https://doi.org/10.1007/978-3-662-06723-9 Verlag Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Mittemeijer, Eric J. Diffraction Analysis of the Microstructure of Materials Physics Crystallography Engineering Nanotechnology Surfaces (Physics) Condensed Matter Physics Characterization and Evaluation of Materials Surfaces and Interfaces, Thin Films Engineering, general Ingenieurwissenschaften Röntgendiffraktometrie (DE-588)4336833-5 gnd Werkstoff (DE-588)4065579-9 gnd Mikrostruktur (DE-588)4131028-7 gnd |
| subject_GND | (DE-588)4336833-5 (DE-588)4065579-9 (DE-588)4131028-7 |
| title | Diffraction Analysis of the Microstructure of Materials |
| title_auth | Diffraction Analysis of the Microstructure of Materials |
| title_exact_search | Diffraction Analysis of the Microstructure of Materials |
| title_full | Diffraction Analysis of the Microstructure of Materials edited by Eric J. Mittemeijer, Paolo Scardi |
| title_fullStr | Diffraction Analysis of the Microstructure of Materials edited by Eric J. Mittemeijer, Paolo Scardi |
| title_full_unstemmed | Diffraction Analysis of the Microstructure of Materials edited by Eric J. Mittemeijer, Paolo Scardi |
| title_short | Diffraction Analysis of the Microstructure of Materials |
| title_sort | diffraction analysis of the microstructure of materials |
| topic | Physics Crystallography Engineering Nanotechnology Surfaces (Physics) Condensed Matter Physics Characterization and Evaluation of Materials Surfaces and Interfaces, Thin Films Engineering, general Ingenieurwissenschaften Röntgendiffraktometrie (DE-588)4336833-5 gnd Werkstoff (DE-588)4065579-9 gnd Mikrostruktur (DE-588)4131028-7 gnd |
| topic_facet | Physics Crystallography Engineering Nanotechnology Surfaces (Physics) Condensed Matter Physics Characterization and Evaluation of Materials Surfaces and Interfaces, Thin Films Engineering, general Ingenieurwissenschaften Röntgendiffraktometrie Werkstoff Mikrostruktur |
| url | https://doi.org/10.1007/978-3-662-06723-9 |
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