Transmission Electron Microscopy and Diffractometry of Materials:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Berlin, Heidelberg
Springer Berlin Heidelberg
2001
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| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | This book teaches graduate students the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms and the formation and analysis of diffraction patterns. It also describes unique aspects of each technique, especially imaging and spectroscopy in the TEM. The textbook thoroughly develops both introductory and advanced-level material, using over 400 accompanying illustrations. Problems are provided at the end of each chapter to reinforce key concepts. Simple citatioins of rules are avoided as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sections/chapters are sorted according to difficulty and grouped for use in quarter and semester courses on TEM and XRD. |
| Beschreibung: | 1 Online-Ressource (XIX, 748 p) |
| ISBN: | 9783662045169 9783662045183 |
| DOI: | 10.1007/978-3-662-04516-9 |
Internformat
MARC
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| 500 | |a This book teaches graduate students the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms and the formation and analysis of diffraction patterns. It also describes unique aspects of each technique, especially imaging and spectroscopy in the TEM. The textbook thoroughly develops both introductory and advanced-level material, using over 400 accompanying illustrations. Problems are provided at the end of each chapter to reinforce key concepts. Simple citatioins of rules are avoided as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sections/chapters are sorted according to difficulty and grouped for use in quarter and semester courses on TEM and XRD. | ||
| 650 | 4 | |a Physics | |
| 650 | 4 | |a Surfaces (Physics) | |
| 650 | 4 | |a Spectroscopy and Microscopy | |
| 650 | 4 | |a Surface and Interface Science, Thin Films | |
| 650 | 4 | |a Solid State Physics | |
| 650 | 4 | |a Surfaces and Interfaces, Thin Films | |
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Datensatz im Suchindex
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| any_adam_object | |
| author | Fultz, Brent 1955- |
| author_GND | (DE-588)122354796 (DE-588)122354818 |
| author_facet | Fultz, Brent 1955- |
| author_role | aut |
| author_sort | Fultz, Brent 1955- |
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| building | Verbundindex |
| bvnumber | BV042414349 |
| classification_tum | PHY 000 |
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| ctrlnum | (OCoLC)1184503760 (DE-599)BVBBV042414349 |
| dewey-full | 621.36 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.36 |
| dewey-search | 621.36 |
| dewey-sort | 3621.36 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
| doi_str_mv | 10.1007/978-3-662-04516-9 |
| format | Electronic eBook |
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| id | DE-604.BV042414349 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:20:55Z |
| institution | BVB |
| isbn | 9783662045169 9783662045183 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027849842 |
| oclc_num | 1184503760 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-83 |
| owner_facet | DE-91 DE-BY-TUM DE-83 |
| physical | 1 Online-Ressource (XIX, 748 p) |
| psigel | ZDB-2-PHA ZDB-2-BAE ZDB-2-PHA_Archive |
| publishDate | 2001 |
| publishDateSearch | 2001 |
| publishDateSort | 2001 |
| publisher | Springer Berlin Heidelberg |
| record_format | marc |
| spelling | Fultz, Brent 1955- Verfasser (DE-588)122354796 aut Transmission Electron Microscopy and Diffractometry of Materials by Brent Fultz, James M. Howe Berlin, Heidelberg Springer Berlin Heidelberg 2001 1 Online-Ressource (XIX, 748 p) txt rdacontent c rdamedia cr rdacarrier This book teaches graduate students the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms and the formation and analysis of diffraction patterns. It also describes unique aspects of each technique, especially imaging and spectroscopy in the TEM. The textbook thoroughly develops both introductory and advanced-level material, using over 400 accompanying illustrations. Problems are provided at the end of each chapter to reinforce key concepts. Simple citatioins of rules are avoided as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sections/chapters are sorted according to difficulty and grouped for use in quarter and semester courses on TEM and XRD. Physics Surfaces (Physics) Spectroscopy and Microscopy Surface and Interface Science, Thin Films Solid State Physics Surfaces and Interfaces, Thin Films Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd rswk-swf Röntgendiffraktometrie (DE-588)4336833-5 gnd rswk-swf Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 s Röntgendiffraktometrie (DE-588)4336833-5 s 1\p DE-604 Howe, James M. 1955- Sonstige (DE-588)122354818 oth https://doi.org/10.1007/978-3-662-04516-9 Verlag Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Fultz, Brent 1955- Transmission Electron Microscopy and Diffractometry of Materials Physics Surfaces (Physics) Spectroscopy and Microscopy Surface and Interface Science, Thin Films Solid State Physics Surfaces and Interfaces, Thin Films Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Röntgendiffraktometrie (DE-588)4336833-5 gnd |
| subject_GND | (DE-588)4215608-7 (DE-588)4336833-5 |
| title | Transmission Electron Microscopy and Diffractometry of Materials |
| title_auth | Transmission Electron Microscopy and Diffractometry of Materials |
| title_exact_search | Transmission Electron Microscopy and Diffractometry of Materials |
| title_full | Transmission Electron Microscopy and Diffractometry of Materials by Brent Fultz, James M. Howe |
| title_fullStr | Transmission Electron Microscopy and Diffractometry of Materials by Brent Fultz, James M. Howe |
| title_full_unstemmed | Transmission Electron Microscopy and Diffractometry of Materials by Brent Fultz, James M. Howe |
| title_short | Transmission Electron Microscopy and Diffractometry of Materials |
| title_sort | transmission electron microscopy and diffractometry of materials |
| topic | Physics Surfaces (Physics) Spectroscopy and Microscopy Surface and Interface Science, Thin Films Solid State Physics Surfaces and Interfaces, Thin Films Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Röntgendiffraktometrie (DE-588)4336833-5 gnd |
| topic_facet | Physics Surfaces (Physics) Spectroscopy and Microscopy Surface and Interface Science, Thin Films Solid State Physics Surfaces and Interfaces, Thin Films Durchstrahlungselektronenmikroskopie Röntgendiffraktometrie |
| url | https://doi.org/10.1007/978-3-662-04516-9 |
| work_keys_str_mv | AT fultzbrent transmissionelectronmicroscopyanddiffractometryofmaterials AT howejamesm transmissionelectronmicroscopyanddiffractometryofmaterials |