Scanning Tunneling Microscopy II: Further Applications and Related Scanning Techniques
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Berlin, Heidelberg
Springer Berlin Heidelberg
1995
|
| Ausgabe: | Second Edition |
| Schriftenreihe: | Springer Series in Surface Sciences
28 |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and broad range of applications of STM and related scanning probe techniques. The applications discussed in this volume come predominantly from the fields of electrochemistry and biology. In contrast to those described in STM I, these studies may be performed in air and in liquids. The extensions of the basic technique to map other interactions are described in chapters on scanning force microscopy, magnetic force microscopy, and scanning near-field optical microscopy, together with a survey of other related techniques. Also described here is the use of a scanning proximal probe for surface modification. Together, the two volumes give a comprehensive account of experimental aspects of STM. They provide essential reading and reference material for all students and researchers involved in this field. In this second edition the text has been updated and new methods are discussed |
| Beschreibung: | 1 Online-Ressource (XIV, 349p. 167 illus., 2 illus. in color) |
| ISBN: | 9783642793660 9783540585893 |
| ISSN: | 0931-5195 |
| DOI: | 10.1007/978-3-642-79366-0 |
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Datensatz im Suchindex
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| author | Wiesendanger, Roland |
| author_facet | Wiesendanger, Roland |
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| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 530 - Physics |
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| dewey-search | 530.41 |
| dewey-sort | 3530.41 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| doi_str_mv | 10.1007/978-3-642-79366-0 |
| edition | Second Edition |
| format | Electronic eBook |
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| id | DE-604.BV042413662 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:20:53Z |
| institution | BVB |
| isbn | 9783642793660 9783540585893 |
| issn | 0931-5195 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027849155 |
| oclc_num | 863818692 |
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| owner_facet | DE-91 DE-BY-TUM DE-83 |
| physical | 1 Online-Ressource (XIV, 349p. 167 illus., 2 illus. in color) |
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| publishDate | 1995 |
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| publisher | Springer Berlin Heidelberg |
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| series2 | Springer Series in Surface Sciences |
| spelling | Wiesendanger, Roland Verfasser aut Scanning Tunneling Microscopy II Further Applications and Related Scanning Techniques edited by Roland Wiesendanger, Hans-Joachim Güntherodt Second Edition Berlin, Heidelberg Springer Berlin Heidelberg 1995 1 Online-Ressource (XIV, 349p. 167 illus., 2 illus. in color) txt rdacontent c rdamedia cr rdacarrier Springer Series in Surface Sciences 28 0931-5195 Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and broad range of applications of STM and related scanning probe techniques. The applications discussed in this volume come predominantly from the fields of electrochemistry and biology. In contrast to those described in STM I, these studies may be performed in air and in liquids. The extensions of the basic technique to map other interactions are described in chapters on scanning force microscopy, magnetic force microscopy, and scanning near-field optical microscopy, together with a survey of other related techniques. Also described here is the use of a scanning proximal probe for surface modification. Together, the two volumes give a comprehensive account of experimental aspects of STM. They provide essential reading and reference material for all students and researchers involved in this field. In this second edition the text has been updated and new methods are discussed Physics Chemistry, Physical organic Cytology Engineering Surfaces (Physics) Solid State Physics Spectroscopy and Microscopy Surfaces and Interfaces, Thin Films Cell Biology Physical Chemistry Engineering, general Ingenieurwissenschaften Güntherodt, Hans-Joachim Sonstige oth https://doi.org/10.1007/978-3-642-79366-0 Verlag Volltext |
| spellingShingle | Wiesendanger, Roland Scanning Tunneling Microscopy II Further Applications and Related Scanning Techniques Physics Chemistry, Physical organic Cytology Engineering Surfaces (Physics) Solid State Physics Spectroscopy and Microscopy Surfaces and Interfaces, Thin Films Cell Biology Physical Chemistry Engineering, general Ingenieurwissenschaften |
| title | Scanning Tunneling Microscopy II Further Applications and Related Scanning Techniques |
| title_auth | Scanning Tunneling Microscopy II Further Applications and Related Scanning Techniques |
| title_exact_search | Scanning Tunneling Microscopy II Further Applications and Related Scanning Techniques |
| title_full | Scanning Tunneling Microscopy II Further Applications and Related Scanning Techniques edited by Roland Wiesendanger, Hans-Joachim Güntherodt |
| title_fullStr | Scanning Tunneling Microscopy II Further Applications and Related Scanning Techniques edited by Roland Wiesendanger, Hans-Joachim Güntherodt |
| title_full_unstemmed | Scanning Tunneling Microscopy II Further Applications and Related Scanning Techniques edited by Roland Wiesendanger, Hans-Joachim Güntherodt |
| title_short | Scanning Tunneling Microscopy II |
| title_sort | scanning tunneling microscopy ii further applications and related scanning techniques |
| title_sub | Further Applications and Related Scanning Techniques |
| topic | Physics Chemistry, Physical organic Cytology Engineering Surfaces (Physics) Solid State Physics Spectroscopy and Microscopy Surfaces and Interfaces, Thin Films Cell Biology Physical Chemistry Engineering, general Ingenieurwissenschaften |
| topic_facet | Physics Chemistry, Physical organic Cytology Engineering Surfaces (Physics) Solid State Physics Spectroscopy and Microscopy Surfaces and Interfaces, Thin Films Cell Biology Physical Chemistry Engineering, general Ingenieurwissenschaften |
| url | https://doi.org/10.1007/978-3-642-79366-0 |
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