Pattern Analysis and Understanding:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Berlin, Heidelberg
Springer Berlin Heidelberg
1990
|
| Ausgabe: | Second Edition |
| Schriftenreihe: | Springer Series in Information Sciences
4 |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | In this second edition every chapter of the first edition of Pattern Analysis has been updated and expanded. The general view of a system for pattern analysis and understanding has remained unchanged, but many details have been revised. A short account of light and sound has been added to the introduction, some normalization techniques and a basic introduction to morphological operations have been added to the second chapter. Chapter 3 has been expanded significantly by topics like motion, depth, and shape from shading; additional material has also been added to the already existing sections of this chapter. The old sections of Chap. 4 have been reorganized, a general view of the classification problem has been added and material provided to incorporate techniques of word and object recognition and to give a short account of some types of neural nets. Almost no changes have been made in Chap. 5. The part on representation of control structures in Chap. 6 has been shortened, a section on the judgement of results has been added. Chapter 7 has been rewritten almost completely; the section on formal grammars has been reduced, the sections on production systems, semantic networks, and knowledge acquisition have been expanded, and sections on logic and explanation added. The old Chaps. 8 and 9 have been omitted. In summary, the new edition is a thorough revision and extensive update of the first one taking into account the progress in the field during recent years |
| Beschreibung: | 1 Online-Ressource (XIV, 371 p) |
| ISBN: | 9783642748998 9783540513780 |
| ISSN: | 0720-678X |
| DOI: | 10.1007/978-3-642-74899-8 |
Internformat
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Datensatz im Suchindex
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| dewey-full | 621.36 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
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| discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
| doi_str_mv | 10.1007/978-3-642-74899-8 |
| edition | Second Edition |
| format | Electronic eBook |
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| isbn | 9783642748998 9783540513780 |
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| language | English |
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| spelling | Niemann, Heinrich Verfasser aut Pattern Analysis and Understanding by Heinrich Niemann Second Edition Berlin, Heidelberg Springer Berlin Heidelberg 1990 1 Online-Ressource (XIV, 371 p) txt rdacontent c rdamedia cr rdacarrier Springer Series in Information Sciences 4 0720-678X In this second edition every chapter of the first edition of Pattern Analysis has been updated and expanded. The general view of a system for pattern analysis and understanding has remained unchanged, but many details have been revised. A short account of light and sound has been added to the introduction, some normalization techniques and a basic introduction to morphological operations have been added to the second chapter. Chapter 3 has been expanded significantly by topics like motion, depth, and shape from shading; additional material has also been added to the already existing sections of this chapter. The old sections of Chap. 4 have been reorganized, a general view of the classification problem has been added and material provided to incorporate techniques of word and object recognition and to give a short account of some types of neural nets. Almost no changes have been made in Chap. 5. The part on representation of control structures in Chap. 6 has been shortened, a section on the judgement of results has been added. Chapter 7 has been rewritten almost completely; the section on formal grammars has been reduced, the sections on production systems, semantic networks, and knowledge acquisition have been expanded, and sections on logic and explanation added. The old Chaps. 8 and 9 have been omitted. In summary, the new edition is a thorough revision and extensive update of the first one taking into account the progress in the field during recent years Physics Computer hardware Software engineering Computer vision Optical pattern recognition Acoustics Optics, Optoelectronics, Plasmonics and Optical Devices Image Processing and Computer Vision Pattern Recognition Computer Hardware Software Engineering/Programming and Operating Systems Mustererkennung (DE-588)4040936-3 gnd rswk-swf Musteranalyse (DE-588)4226567-8 gnd rswk-swf Mustererkennung (DE-588)4040936-3 s 1\p DE-604 Musteranalyse (DE-588)4226567-8 s 2\p DE-604 https://doi.org/10.1007/978-3-642-74899-8 Verlag Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Niemann, Heinrich Pattern Analysis and Understanding Physics Computer hardware Software engineering Computer vision Optical pattern recognition Acoustics Optics, Optoelectronics, Plasmonics and Optical Devices Image Processing and Computer Vision Pattern Recognition Computer Hardware Software Engineering/Programming and Operating Systems Mustererkennung (DE-588)4040936-3 gnd Musteranalyse (DE-588)4226567-8 gnd |
| subject_GND | (DE-588)4040936-3 (DE-588)4226567-8 |
| title | Pattern Analysis and Understanding |
| title_auth | Pattern Analysis and Understanding |
| title_exact_search | Pattern Analysis and Understanding |
| title_full | Pattern Analysis and Understanding by Heinrich Niemann |
| title_fullStr | Pattern Analysis and Understanding by Heinrich Niemann |
| title_full_unstemmed | Pattern Analysis and Understanding by Heinrich Niemann |
| title_short | Pattern Analysis and Understanding |
| title_sort | pattern analysis and understanding |
| topic | Physics Computer hardware Software engineering Computer vision Optical pattern recognition Acoustics Optics, Optoelectronics, Plasmonics and Optical Devices Image Processing and Computer Vision Pattern Recognition Computer Hardware Software Engineering/Programming and Operating Systems Mustererkennung (DE-588)4040936-3 gnd Musteranalyse (DE-588)4226567-8 gnd |
| topic_facet | Physics Computer hardware Software engineering Computer vision Optical pattern recognition Acoustics Optics, Optoelectronics, Plasmonics and Optical Devices Image Processing and Computer Vision Pattern Recognition Computer Hardware Software Engineering/Programming and Operating Systems Mustererkennung Musteranalyse |
| url | https://doi.org/10.1007/978-3-642-74899-8 |
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