Sayre, D. (1988). X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31–September 4, 1987. Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-540-39246-0
Chicago Style (17th ed.) CitationSayre, David. X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31–September 4, 1987. Berlin, Heidelberg: Springer Berlin Heidelberg, 1988. https://doi.org/10.1007/978-3-540-39246-0.
MLA (9th ed.) CitationSayre, David. X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31–September 4, 1987. Springer Berlin Heidelberg, 1988. https://doi.org/10.1007/978-3-540-39246-0.
Warning: These citations may not always be 100% accurate.