X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31–September 4, 1987
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Berlin, Heidelberg
Springer Berlin Heidelberg
1988
|
| Schriftenreihe: | Springer Series in Optical Sciences
56 |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987. Previous recent symposia on the sub ject were held in New York in 1979, Gottingen in 1983 and Taipei in 1986. Developments in x-ray microscopy continue at a rapid pace, with im portant advances in all major areas: x-ray sources, optics and components, and microscopes and imaging systems. Taken as a whole, the work pre sented here emphasizes three major directions: (a) improvements in the capability and image-quality of x-ray microscopy, expressed principally in systems attached to large, high-brightness x-ray sources; (b) greater access to x-ray microscopy, expressed chiefly in systems employing small, often pulsed, x-ray sources; and (c) increased rate of exploration of applications of x-ray microscopy. The number of papers presented at the symposium has roughly dou bled compared with that of its predecessors. While we are delighted at this growth as a manifestation of vitality and rapid growth of the field, we did have to ask the authors to limit the length of their papers and to submit them in camera-ready form. We thank the authors for their con tributions and for their efforts in adhering to the guidelines on manuscript preparation |
| Beschreibung: | 1 Online-Ressource (XIV, 455 p) |
| ISBN: | 9783540392460 9783662144909 |
| ISSN: | 0342-4111 |
| DOI: | 10.1007/978-3-540-39246-0 |
Internformat
MARC
| LEADER | 00000nmm a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV042412919 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 150316s1988 |||| o||u| ||||||eng d | ||
| 020 | |a 9783540392460 |c Online |9 978-3-540-39246-0 | ||
| 020 | |a 9783662144909 |c Print |9 978-3-662-14490-9 | ||
| 024 | 7 | |a 10.1007/978-3-540-39246-0 |2 doi | |
| 035 | |a (OCoLC)864115873 | ||
| 035 | |a (DE-599)BVBBV042412919 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-91 |a DE-83 | ||
| 082 | 0 | |a 621.36 |2 23 | |
| 084 | |a PHY 000 |2 stub | ||
| 100 | 1 | |a Sayre, David |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a X-Ray Microscopy II |b Proceedings of the International Symposium, Brookhaven, NY, August 31–September 4, 1987 |c edited by David Sayre, Janos Kirz, Malcolm Howells, Harvey Rarback |
| 264 | 1 | |a Berlin, Heidelberg |b Springer Berlin Heidelberg |c 1988 | |
| 300 | |a 1 Online-Ressource (XIV, 455 p) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Springer Series in Optical Sciences |v 56 |x 0342-4111 | |
| 500 | |a This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987. Previous recent symposia on the sub ject were held in New York in 1979, Gottingen in 1983 and Taipei in 1986. Developments in x-ray microscopy continue at a rapid pace, with im portant advances in all major areas: x-ray sources, optics and components, and microscopes and imaging systems. Taken as a whole, the work pre sented here emphasizes three major directions: (a) improvements in the capability and image-quality of x-ray microscopy, expressed principally in systems attached to large, high-brightness x-ray sources; (b) greater access to x-ray microscopy, expressed chiefly in systems employing small, often pulsed, x-ray sources; and (c) increased rate of exploration of applications of x-ray microscopy. The number of papers presented at the symposium has roughly dou bled compared with that of its predecessors. While we are delighted at this growth as a manifestation of vitality and rapid growth of the field, we did have to ask the authors to limit the length of their papers and to submit them in camera-ready form. We thank the authors for their con tributions and for their efforts in adhering to the guidelines on manuscript preparation | ||
| 650 | 4 | |a Physics | |
| 650 | 4 | |a Optics, Optoelectronics, Plasmonics and Optical Devices | |
| 700 | 1 | |a Kirz, Janos |e Sonstige |4 oth | |
| 700 | 1 | |a Howells, Malcolm |e Sonstige |4 oth | |
| 700 | 1 | |a Rarback, Harvey |e Sonstige |4 oth | |
| 856 | 4 | 0 | |u https://doi.org/10.1007/978-3-540-39246-0 |x Verlag |3 Volltext |
| 912 | |a ZDB-2-PHA |a ZDB-2-BAE | ||
| 940 | 1 | |q ZDB-2-PHA_Archive | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-027848412 | ||
Datensatz im Suchindex
| _version_ | 1804153076420968448 |
|---|---|
| any_adam_object | |
| author | Sayre, David |
| author_facet | Sayre, David |
| author_role | aut |
| author_sort | Sayre, David |
| author_variant | d s ds |
| building | Verbundindex |
| bvnumber | BV042412919 |
| classification_tum | PHY 000 |
| collection | ZDB-2-PHA ZDB-2-BAE |
| ctrlnum | (OCoLC)864115873 (DE-599)BVBBV042412919 |
| dewey-full | 621.36 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.36 |
| dewey-search | 621.36 |
| dewey-sort | 3621.36 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
| doi_str_mv | 10.1007/978-3-540-39246-0 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02851nmm a2200421zcb4500</leader><controlfield tag="001">BV042412919</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">150316s1988 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783540392460</subfield><subfield code="c">Online</subfield><subfield code="9">978-3-540-39246-0</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783662144909</subfield><subfield code="c">Print</subfield><subfield code="9">978-3-662-14490-9</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-3-540-39246-0</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)864115873</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV042412919</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.36</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Sayre, David</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">X-Ray Microscopy II</subfield><subfield code="b">Proceedings of the International Symposium, Brookhaven, NY, August 31–September 4, 1987</subfield><subfield code="c">edited by David Sayre, Janos Kirz, Malcolm Howells, Harvey Rarback</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Berlin, Heidelberg</subfield><subfield code="b">Springer Berlin Heidelberg</subfield><subfield code="c">1988</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XIV, 455 p)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Springer Series in Optical Sciences</subfield><subfield code="v">56</subfield><subfield code="x">0342-4111</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987. Previous recent symposia on the sub ject were held in New York in 1979, Gottingen in 1983 and Taipei in 1986. Developments in x-ray microscopy continue at a rapid pace, with im portant advances in all major areas: x-ray sources, optics and components, and microscopes and imaging systems. Taken as a whole, the work pre sented here emphasizes three major directions: (a) improvements in the capability and image-quality of x-ray microscopy, expressed principally in systems attached to large, high-brightness x-ray sources; (b) greater access to x-ray microscopy, expressed chiefly in systems employing small, often pulsed, x-ray sources; and (c) increased rate of exploration of applications of x-ray microscopy. The number of papers presented at the symposium has roughly dou bled compared with that of its predecessors. While we are delighted at this growth as a manifestation of vitality and rapid growth of the field, we did have to ask the authors to limit the length of their papers and to submit them in camera-ready form. We thank the authors for their con tributions and for their efforts in adhering to the guidelines on manuscript preparation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Physics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optics, Optoelectronics, Plasmonics and Optical Devices</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Kirz, Janos</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Howells, Malcolm</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Rarback, Harvey</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-3-540-39246-0</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-PHA</subfield><subfield code="a">ZDB-2-BAE</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-PHA_Archive</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-027848412</subfield></datafield></record></collection> |
| id | DE-604.BV042412919 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:20:51Z |
| institution | BVB |
| isbn | 9783540392460 9783662144909 |
| issn | 0342-4111 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027848412 |
| oclc_num | 864115873 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-83 |
| owner_facet | DE-91 DE-BY-TUM DE-83 |
| physical | 1 Online-Ressource (XIV, 455 p) |
| psigel | ZDB-2-PHA ZDB-2-BAE ZDB-2-PHA_Archive |
| publishDate | 1988 |
| publishDateSearch | 1988 |
| publishDateSort | 1988 |
| publisher | Springer Berlin Heidelberg |
| record_format | marc |
| series2 | Springer Series in Optical Sciences |
| spelling | Sayre, David Verfasser aut X-Ray Microscopy II Proceedings of the International Symposium, Brookhaven, NY, August 31–September 4, 1987 edited by David Sayre, Janos Kirz, Malcolm Howells, Harvey Rarback Berlin, Heidelberg Springer Berlin Heidelberg 1988 1 Online-Ressource (XIV, 455 p) txt rdacontent c rdamedia cr rdacarrier Springer Series in Optical Sciences 56 0342-4111 This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987. Previous recent symposia on the sub ject were held in New York in 1979, Gottingen in 1983 and Taipei in 1986. Developments in x-ray microscopy continue at a rapid pace, with im portant advances in all major areas: x-ray sources, optics and components, and microscopes and imaging systems. Taken as a whole, the work pre sented here emphasizes three major directions: (a) improvements in the capability and image-quality of x-ray microscopy, expressed principally in systems attached to large, high-brightness x-ray sources; (b) greater access to x-ray microscopy, expressed chiefly in systems employing small, often pulsed, x-ray sources; and (c) increased rate of exploration of applications of x-ray microscopy. The number of papers presented at the symposium has roughly dou bled compared with that of its predecessors. While we are delighted at this growth as a manifestation of vitality and rapid growth of the field, we did have to ask the authors to limit the length of their papers and to submit them in camera-ready form. We thank the authors for their con tributions and for their efforts in adhering to the guidelines on manuscript preparation Physics Optics, Optoelectronics, Plasmonics and Optical Devices Kirz, Janos Sonstige oth Howells, Malcolm Sonstige oth Rarback, Harvey Sonstige oth https://doi.org/10.1007/978-3-540-39246-0 Verlag Volltext |
| spellingShingle | Sayre, David X-Ray Microscopy II Proceedings of the International Symposium, Brookhaven, NY, August 31–September 4, 1987 Physics Optics, Optoelectronics, Plasmonics and Optical Devices |
| title | X-Ray Microscopy II Proceedings of the International Symposium, Brookhaven, NY, August 31–September 4, 1987 |
| title_auth | X-Ray Microscopy II Proceedings of the International Symposium, Brookhaven, NY, August 31–September 4, 1987 |
| title_exact_search | X-Ray Microscopy II Proceedings of the International Symposium, Brookhaven, NY, August 31–September 4, 1987 |
| title_full | X-Ray Microscopy II Proceedings of the International Symposium, Brookhaven, NY, August 31–September 4, 1987 edited by David Sayre, Janos Kirz, Malcolm Howells, Harvey Rarback |
| title_fullStr | X-Ray Microscopy II Proceedings of the International Symposium, Brookhaven, NY, August 31–September 4, 1987 edited by David Sayre, Janos Kirz, Malcolm Howells, Harvey Rarback |
| title_full_unstemmed | X-Ray Microscopy II Proceedings of the International Symposium, Brookhaven, NY, August 31–September 4, 1987 edited by David Sayre, Janos Kirz, Malcolm Howells, Harvey Rarback |
| title_short | X-Ray Microscopy II |
| title_sort | x ray microscopy ii proceedings of the international symposium brookhaven ny august 31 september 4 1987 |
| title_sub | Proceedings of the International Symposium, Brookhaven, NY, August 31–September 4, 1987 |
| topic | Physics Optics, Optoelectronics, Plasmonics and Optical Devices |
| topic_facet | Physics Optics, Optoelectronics, Plasmonics and Optical Devices |
| url | https://doi.org/10.1007/978-3-540-39246-0 |
| work_keys_str_mv | AT sayredavid xraymicroscopyiiproceedingsoftheinternationalsymposiumbrookhavennyaugust31september41987 AT kirzjanos xraymicroscopyiiproceedingsoftheinternationalsymposiumbrookhavennyaugust31september41987 AT howellsmalcolm xraymicroscopyiiproceedingsoftheinternationalsymposiumbrookhavennyaugust31september41987 AT rarbackharvey xraymicroscopyiiproceedingsoftheinternationalsymposiumbrookhavennyaugust31september41987 |