Scanning electron microscopy: physics of image formation and microanalysis
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Berlin, Heidelberg
Springer Berlin Heidelberg
1998
|
| Ausgabe: | Second Completely Revised and Updated Edition |
| Schriftenreihe: | Springer Series in Optical Sciences
45 |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information |
| Beschreibung: | 1 Online-Ressource (XIV, 529 p) |
| ISBN: | 9783540389675 9783642083723 |
| DOI: | 10.1007/978-3-540-38967-5 |
Internformat
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| 500 | |a Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information | ||
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Datensatz im Suchindex
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| dewey-full | 530.41 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 530 - Physics |
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| discipline | Physik |
| doi_str_mv | 10.1007/978-3-540-38967-5 |
| edition | Second Completely Revised and Updated Edition |
| format | Electronic eBook |
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| id | DE-604.BV042412906 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:20:51Z |
| institution | BVB |
| isbn | 9783540389675 9783642083723 |
| language | English |
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| owner_facet | DE-91 DE-BY-TUM DE-83 |
| physical | 1 Online-Ressource (XIV, 529 p) |
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| publishDate | 1998 |
| publishDateSearch | 1998 |
| publishDateSort | 1998 |
| publisher | Springer Berlin Heidelberg |
| record_format | marc |
| series | Springer Series in Optical Sciences |
| series2 | Springer Series in Optical Sciences |
| spelling | Reimer, Ludwig 1928- Verfasser (DE-588)13230130X aut Scanning electron microscopy physics of image formation and microanalysis Ludwig Reimer Second Completely Revised and Updated Edition Berlin, Heidelberg Springer Berlin Heidelberg 1998 1 Online-Ressource (XIV, 529 p) txt rdacontent c rdamedia cr rdacarrier Springer Series in Optical Sciences 45 Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information Physics Solid State Physics Spectroscopy and Microscopy Physics, general Rasterelektronenmikroskopie (DE-588)4048455-5 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 s DE-604 Erscheint auch als Druck-Ausgabe 3-540-63976-4 Springer Series in Optical Sciences 45 (DE-604)BV000000237 45 https://doi.org/10.1007/978-3-540-38967-5 Verlag Volltext |
| spellingShingle | Reimer, Ludwig 1928- Scanning electron microscopy physics of image formation and microanalysis Springer Series in Optical Sciences Physics Solid State Physics Spectroscopy and Microscopy Physics, general Rasterelektronenmikroskopie (DE-588)4048455-5 gnd |
| subject_GND | (DE-588)4048455-5 |
| title | Scanning electron microscopy physics of image formation and microanalysis |
| title_auth | Scanning electron microscopy physics of image formation and microanalysis |
| title_exact_search | Scanning electron microscopy physics of image formation and microanalysis |
| title_full | Scanning electron microscopy physics of image formation and microanalysis Ludwig Reimer |
| title_fullStr | Scanning electron microscopy physics of image formation and microanalysis Ludwig Reimer |
| title_full_unstemmed | Scanning electron microscopy physics of image formation and microanalysis Ludwig Reimer |
| title_short | Scanning electron microscopy |
| title_sort | scanning electron microscopy physics of image formation and microanalysis |
| title_sub | physics of image formation and microanalysis |
| topic | Physics Solid State Physics Spectroscopy and Microscopy Physics, general Rasterelektronenmikroskopie (DE-588)4048455-5 gnd |
| topic_facet | Physics Solid State Physics Spectroscopy and Microscopy Physics, general Rasterelektronenmikroskopie |
| url | https://doi.org/10.1007/978-3-540-38967-5 |
| volume_link | (DE-604)BV000000237 |
| work_keys_str_mv | AT reimerludwig scanningelectronmicroscopyphysicsofimageformationandmicroanalysis |