X-Ray microscopy: Proceedings of the International Symposium, Göttingen, Fed. Rep. of Germany, September 14–16, 1983
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Format: | Elektronisch Tagungsbericht E-Book |
Sprache: | English |
Veröffentlicht: |
Berlin, Heidelberg
Springer Berlin Heidelberg
1984
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Schriftenreihe: | Springer Series in Optical Sciences
43 |
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Online-Zugang: | Volltext |
Beschreibung: | X-ray microscopy fills a gap between optical and electron microscopy. Using soft x-rays, a resolution higher than with visible light can be obtained. In comparison to electron microscopy, thick, wet, unstained specimens can be examined. This is especially advantageous for biological applications. The intense synchrotron radiation of electron storage rings and the development of optical elements for soft x-rays render x-ray microscopy feasible for basic research. Wider applications will be possible in the future with the development of laboratory x-ray sources and microscopes. In 1979 a conference on x-ray microscopy was organized by the New York Academy of Sciences and in 1981 a symposium on high resolution soft x-ray optics was held at Brookhaven. The present volume contains the contributions to the symposium "X-Ray Microscopy", organized by the Akademie der Wissenschaften in Gottingen in September 1983. In their capacity as conference chairmen, the editors would like to thank the Akademie der Wissenschaften, especially Prof. H.G. Wagner, Secretary of the Academy, and Mr. J. Pfahlert for organizing the symposium. We are indebted to the Stiftung Volkswagenwerk for financial support. The symposium was held at the Max-Planck-Institut für Strömungsforschung. We are grateful for their hospitality and assistance during the symposium. Thanks are due to all authors and to the Springer Verlag for their combined efforts. We thank Dipl.-Phys. P. Guttmann, Dr. B. Niemann and Mrs. A. Marienhagen for their assistance during the final preparation of the manuscripts |
Beschreibung: | 1 Online-Ressource (IX, 349 Seiten) |
ISBN: | 9783540388333 9783662135471 |
DOI: | 10.1007/978-3-540-38833-3 |
Internformat
MARC
LEADER | 00000nmm a2200000zcb4500 | ||
---|---|---|---|
001 | BV042412894 | ||
003 | DE-604 | ||
005 | 20230621 | ||
006 | a |||| 10||| | ||
007 | cr|uuu---uuuuu | ||
008 | 150316s1984 |||| o||u| ||||||eng d | ||
020 | |a 9783540388333 |c Online |9 978-3-540-38833-3 | ||
020 | |a 9783662135471 |c Print |9 978-3-662-13547-1 | ||
024 | 7 | |a 10.1007/978-3-540-38833-3 |2 doi | |
035 | |a (OCoLC)864044399 | ||
035 | |a (DE-599)BVBBV042412894 | ||
040 | |a DE-604 |b ger |e aacr | ||
041 | 0 | |a eng | |
049 | |a DE-91 |a DE-83 | ||
082 | 0 | |a 621.36 |2 23 | |
084 | |a UH 5090 |0 (DE-625)145653: |2 rvk | ||
084 | |a UH 5100 |0 (DE-625)145654: |2 rvk | ||
084 | |a UH 6400 |0 (DE-625)145766: |2 rvk | ||
084 | |a UQ 5600 |0 (DE-625)146528: |2 rvk | ||
084 | |a PHY 000 |2 stub | ||
245 | 1 | 0 | |a X-Ray microscopy |b Proceedings of the International Symposium, Göttingen, Fed. Rep. of Germany, September 14–16, 1983 |c editors G. Schmahl and D. Rudolph |
264 | 1 | |a Berlin, Heidelberg |b Springer Berlin Heidelberg |c 1984 | |
300 | |a 1 Online-Ressource (IX, 349 Seiten) | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
490 | 1 | |a Springer Series in Optical Sciences |v 43 | |
500 | |a X-ray microscopy fills a gap between optical and electron microscopy. Using soft x-rays, a resolution higher than with visible light can be obtained. In comparison to electron microscopy, thick, wet, unstained specimens can be examined. This is especially advantageous for biological applications. The intense synchrotron radiation of electron storage rings and the development of optical elements for soft x-rays render x-ray microscopy feasible for basic research. Wider applications will be possible in the future with the development of laboratory x-ray sources and microscopes. In 1979 a conference on x-ray microscopy was organized by the New York Academy of Sciences and in 1981 a symposium on high resolution soft x-ray optics was held at Brookhaven. The present volume contains the contributions to the symposium "X-Ray Microscopy", organized by the Akademie der Wissenschaften in Gottingen in September 1983. In their capacity as conference chairmen, the editors would like to thank the Akademie der Wissenschaften, especially Prof. H.G. Wagner, Secretary of the Academy, and Mr. J. Pfahlert for organizing the symposium. We are indebted to the Stiftung Volkswagenwerk for financial support. The symposium was held at the Max-Planck-Institut für Strömungsforschung. We are grateful for their hospitality and assistance during the symposium. Thanks are due to all authors and to the Springer Verlag for their combined efforts. We thank Dipl.-Phys. P. Guttmann, Dr. B. Niemann and Mrs. A. Marienhagen for their assistance during the final preparation of the manuscripts | ||
650 | 4 | |a Physics | |
650 | 4 | |a Optics, Optoelectronics, Plasmonics and Optical Devices | |
650 | 4 | |a Solid State Physics | |
650 | 4 | |a Spectroscopy and Microscopy | |
650 | 4 | |a Biophysics and Biological Physics | |
650 | 0 | 7 | |a Röntgenmikroskopie |0 (DE-588)4178315-3 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Röntgenstrahlung |0 (DE-588)4129728-3 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Mikroskopie |0 (DE-588)4039238-7 |2 gnd |9 rswk-swf |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1983 |z Göttingen |2 gnd-content | |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1983 |z Göttingen |2 gnd-content | |
689 | 0 | 0 | |a Mikroskopie |0 (DE-588)4039238-7 |D s |
689 | 0 | 1 | |a Röntgenstrahlung |0 (DE-588)4129728-3 |D s |
689 | 0 | |8 1\p |5 DE-604 | |
689 | 1 | 0 | |a Röntgenmikroskopie |0 (DE-588)4178315-3 |D s |
689 | 1 | |5 DE-604 | |
700 | 1 | |a Schmahl, Günter |d 1936-2018 |0 (DE-588)1035132923 |4 edt | |
700 | 1 | |a Rudolph, Dietbert |d 1939- |0 (DE-588)1145512542 |4 edt | |
711 | 2 | |a Symposium X-Ray Microscopy |n 1 |d 1983 |c Göttingen |j Sonstige |0 (DE-588)5002268-4 |4 oth | |
776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 3-540-13271-6 |
776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 0-387-13271-6 |
830 | 0 | |a Springer Series in Optical Sciences |v 43 |w (DE-604)BV000000237 |9 43 | |
856 | 4 | 0 | |u https://doi.org/10.1007/978-3-540-38833-3 |x Verlag |3 Volltext |
912 | |a ZDB-2-PHA |a ZDB-2-BAE | ||
940 | 1 | |q ZDB-2-PHA_Archive | |
999 | |a oai:aleph.bib-bvb.de:BVB01-027848387 | ||
883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk |
Datensatz im Suchindex
_version_ | 1804153076379025408 |
---|---|
any_adam_object | |
author2 | Schmahl, Günter 1936-2018 Rudolph, Dietbert 1939- |
author2_role | edt edt |
author2_variant | g s gs d r dr |
author_GND | (DE-588)1035132923 (DE-588)1145512542 |
author_facet | Schmahl, Günter 1936-2018 Rudolph, Dietbert 1939- |
building | Verbundindex |
bvnumber | BV042412894 |
classification_rvk | UH 5090 UH 5100 UH 6400 UQ 5600 |
classification_tum | PHY 000 |
collection | ZDB-2-PHA ZDB-2-BAE |
ctrlnum | (OCoLC)864044399 (DE-599)BVBBV042412894 |
dewey-full | 621.36 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.36 |
dewey-search | 621.36 |
dewey-sort | 3621.36 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
doi_str_mv | 10.1007/978-3-540-38833-3 |
format | Electronic Conference Proceeding eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>04339nmm a2200673zcb4500</leader><controlfield tag="001">BV042412894</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20230621 </controlfield><controlfield tag="006">a |||| 10||| </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">150316s1984 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783540388333</subfield><subfield code="c">Online</subfield><subfield code="9">978-3-540-38833-3</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783662135471</subfield><subfield code="c">Print</subfield><subfield code="9">978-3-662-13547-1</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-3-540-38833-3</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)864044399</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV042412894</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.36</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 5090</subfield><subfield code="0">(DE-625)145653:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 5100</subfield><subfield code="0">(DE-625)145654:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6400</subfield><subfield code="0">(DE-625)145766:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UQ 5600</subfield><subfield code="0">(DE-625)146528:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">X-Ray microscopy</subfield><subfield code="b">Proceedings of the International Symposium, Göttingen, Fed. Rep. of Germany, September 14–16, 1983</subfield><subfield code="c">editors G. Schmahl and D. Rudolph</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Berlin, Heidelberg</subfield><subfield code="b">Springer Berlin Heidelberg</subfield><subfield code="c">1984</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (IX, 349 Seiten)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Springer Series in Optical Sciences</subfield><subfield code="v">43</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">X-ray microscopy fills a gap between optical and electron microscopy. Using soft x-rays, a resolution higher than with visible light can be obtained. In comparison to electron microscopy, thick, wet, unstained specimens can be examined. This is especially advantageous for biological applications. The intense synchrotron radiation of electron storage rings and the development of optical elements for soft x-rays render x-ray microscopy feasible for basic research. Wider applications will be possible in the future with the development of laboratory x-ray sources and microscopes. In 1979 a conference on x-ray microscopy was organized by the New York Academy of Sciences and in 1981 a symposium on high resolution soft x-ray optics was held at Brookhaven. The present volume contains the contributions to the symposium "X-Ray Microscopy", organized by the Akademie der Wissenschaften in Gottingen in September 1983. In their capacity as conference chairmen, the editors would like to thank the Akademie der Wissenschaften, especially Prof. H.G. Wagner, Secretary of the Academy, and Mr. J. Pfahlert for organizing the symposium. We are indebted to the Stiftung Volkswagenwerk for financial support. The symposium was held at the Max-Planck-Institut für Strömungsforschung. We are grateful for their hospitality and assistance during the symposium. Thanks are due to all authors and to the Springer Verlag for their combined efforts. We thank Dipl.-Phys. P. Guttmann, Dr. B. Niemann and Mrs. A. Marienhagen for their assistance during the final preparation of the manuscripts</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Physics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optics, Optoelectronics, Plasmonics and Optical Devices</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Solid State Physics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Spectroscopy and Microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Biophysics and Biological Physics</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Röntgenmikroskopie</subfield><subfield code="0">(DE-588)4178315-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Röntgenstrahlung</subfield><subfield code="0">(DE-588)4129728-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikroskopie</subfield><subfield code="0">(DE-588)4039238-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1983</subfield><subfield code="z">Göttingen</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1983</subfield><subfield code="z">Göttingen</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Mikroskopie</subfield><subfield code="0">(DE-588)4039238-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Röntgenstrahlung</subfield><subfield code="0">(DE-588)4129728-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Röntgenmikroskopie</subfield><subfield code="0">(DE-588)4178315-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Schmahl, Günter</subfield><subfield code="d">1936-2018</subfield><subfield code="0">(DE-588)1035132923</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Rudolph, Dietbert</subfield><subfield code="d">1939-</subfield><subfield code="0">(DE-588)1145512542</subfield><subfield code="4">edt</subfield></datafield><datafield tag="711" ind1="2" ind2=" "><subfield code="a">Symposium X-Ray Microscopy</subfield><subfield code="n">1</subfield><subfield code="d">1983</subfield><subfield code="c">Göttingen</subfield><subfield code="j">Sonstige</subfield><subfield code="0">(DE-588)5002268-4</subfield><subfield code="4">oth</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">3-540-13271-6</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">0-387-13271-6</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Springer Series in Optical Sciences</subfield><subfield code="v">43</subfield><subfield code="w">(DE-604)BV000000237</subfield><subfield code="9">43</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-3-540-38833-3</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-PHA</subfield><subfield code="a">ZDB-2-BAE</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-PHA_Archive</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-027848387</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
genre | (DE-588)1071861417 Konferenzschrift 1983 Göttingen gnd-content |
genre_facet | Konferenzschrift 1983 Göttingen |
id | DE-604.BV042412894 |
illustrated | Not Illustrated |
indexdate | 2024-07-10T01:20:51Z |
institution | BVB |
institution_GND | (DE-588)5002268-4 |
isbn | 9783540388333 9783662135471 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027848387 |
oclc_num | 864044399 |
open_access_boolean | |
owner | DE-91 DE-BY-TUM DE-83 |
owner_facet | DE-91 DE-BY-TUM DE-83 |
physical | 1 Online-Ressource (IX, 349 Seiten) |
psigel | ZDB-2-PHA ZDB-2-BAE ZDB-2-PHA_Archive |
publishDate | 1984 |
publishDateSearch | 1984 |
publishDateSort | 1984 |
publisher | Springer Berlin Heidelberg |
record_format | marc |
series | Springer Series in Optical Sciences |
series2 | Springer Series in Optical Sciences |
spelling | X-Ray microscopy Proceedings of the International Symposium, Göttingen, Fed. Rep. of Germany, September 14–16, 1983 editors G. Schmahl and D. Rudolph Berlin, Heidelberg Springer Berlin Heidelberg 1984 1 Online-Ressource (IX, 349 Seiten) txt rdacontent c rdamedia cr rdacarrier Springer Series in Optical Sciences 43 X-ray microscopy fills a gap between optical and electron microscopy. Using soft x-rays, a resolution higher than with visible light can be obtained. In comparison to electron microscopy, thick, wet, unstained specimens can be examined. This is especially advantageous for biological applications. The intense synchrotron radiation of electron storage rings and the development of optical elements for soft x-rays render x-ray microscopy feasible for basic research. Wider applications will be possible in the future with the development of laboratory x-ray sources and microscopes. In 1979 a conference on x-ray microscopy was organized by the New York Academy of Sciences and in 1981 a symposium on high resolution soft x-ray optics was held at Brookhaven. The present volume contains the contributions to the symposium "X-Ray Microscopy", organized by the Akademie der Wissenschaften in Gottingen in September 1983. In their capacity as conference chairmen, the editors would like to thank the Akademie der Wissenschaften, especially Prof. H.G. Wagner, Secretary of the Academy, and Mr. J. Pfahlert for organizing the symposium. We are indebted to the Stiftung Volkswagenwerk for financial support. The symposium was held at the Max-Planck-Institut für Strömungsforschung. We are grateful for their hospitality and assistance during the symposium. Thanks are due to all authors and to the Springer Verlag for their combined efforts. We thank Dipl.-Phys. P. Guttmann, Dr. B. Niemann and Mrs. A. Marienhagen for their assistance during the final preparation of the manuscripts Physics Optics, Optoelectronics, Plasmonics and Optical Devices Solid State Physics Spectroscopy and Microscopy Biophysics and Biological Physics Röntgenmikroskopie (DE-588)4178315-3 gnd rswk-swf Röntgenstrahlung (DE-588)4129728-3 gnd rswk-swf Mikroskopie (DE-588)4039238-7 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1983 Göttingen gnd-content Mikroskopie (DE-588)4039238-7 s Röntgenstrahlung (DE-588)4129728-3 s 1\p DE-604 Röntgenmikroskopie (DE-588)4178315-3 s DE-604 Schmahl, Günter 1936-2018 (DE-588)1035132923 edt Rudolph, Dietbert 1939- (DE-588)1145512542 edt Symposium X-Ray Microscopy 1 1983 Göttingen Sonstige (DE-588)5002268-4 oth Erscheint auch als Druck-Ausgabe 3-540-13271-6 Erscheint auch als Druck-Ausgabe 0-387-13271-6 Springer Series in Optical Sciences 43 (DE-604)BV000000237 43 https://doi.org/10.1007/978-3-540-38833-3 Verlag Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | X-Ray microscopy Proceedings of the International Symposium, Göttingen, Fed. Rep. of Germany, September 14–16, 1983 Springer Series in Optical Sciences Physics Optics, Optoelectronics, Plasmonics and Optical Devices Solid State Physics Spectroscopy and Microscopy Biophysics and Biological Physics Röntgenmikroskopie (DE-588)4178315-3 gnd Röntgenstrahlung (DE-588)4129728-3 gnd Mikroskopie (DE-588)4039238-7 gnd |
subject_GND | (DE-588)4178315-3 (DE-588)4129728-3 (DE-588)4039238-7 (DE-588)1071861417 |
title | X-Ray microscopy Proceedings of the International Symposium, Göttingen, Fed. Rep. of Germany, September 14–16, 1983 |
title_auth | X-Ray microscopy Proceedings of the International Symposium, Göttingen, Fed. Rep. of Germany, September 14–16, 1983 |
title_exact_search | X-Ray microscopy Proceedings of the International Symposium, Göttingen, Fed. Rep. of Germany, September 14–16, 1983 |
title_full | X-Ray microscopy Proceedings of the International Symposium, Göttingen, Fed. Rep. of Germany, September 14–16, 1983 editors G. Schmahl and D. Rudolph |
title_fullStr | X-Ray microscopy Proceedings of the International Symposium, Göttingen, Fed. Rep. of Germany, September 14–16, 1983 editors G. Schmahl and D. Rudolph |
title_full_unstemmed | X-Ray microscopy Proceedings of the International Symposium, Göttingen, Fed. Rep. of Germany, September 14–16, 1983 editors G. Schmahl and D. Rudolph |
title_short | X-Ray microscopy |
title_sort | x ray microscopy proceedings of the international symposium gottingen fed rep of germany september 14 16 1983 |
title_sub | Proceedings of the International Symposium, Göttingen, Fed. Rep. of Germany, September 14–16, 1983 |
topic | Physics Optics, Optoelectronics, Plasmonics and Optical Devices Solid State Physics Spectroscopy and Microscopy Biophysics and Biological Physics Röntgenmikroskopie (DE-588)4178315-3 gnd Röntgenstrahlung (DE-588)4129728-3 gnd Mikroskopie (DE-588)4039238-7 gnd |
topic_facet | Physics Optics, Optoelectronics, Plasmonics and Optical Devices Solid State Physics Spectroscopy and Microscopy Biophysics and Biological Physics Röntgenmikroskopie Röntgenstrahlung Mikroskopie Konferenzschrift 1983 Göttingen |
url | https://doi.org/10.1007/978-3-540-38833-3 |
volume_link | (DE-604)BV000000237 |
work_keys_str_mv | AT schmahlgunter xraymicroscopyproceedingsoftheinternationalsymposiumgottingenfedrepofgermanyseptember14161983 AT rudolphdietbert xraymicroscopyproceedingsoftheinternationalsymposiumgottingenfedrepofgermanyseptember14161983 AT symposiumxraymicroscopygottingen xraymicroscopyproceedingsoftheinternationalsymposiumgottingenfedrepofgermanyseptember14161983 |