Surface Analysis by Electron Spectroscopy: Measurement and Interpretation
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boston, MA
Springer US
1994
|
| Schriftenreihe: | Updates in Applied Physics and Electrical Technology
|
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | This book is the fifth in aseries of scientific textbooks designed to cover advances in selected research fields from a basic and general viewpoint. The reader is taken carefully but rapidly through the introductory material in order that the significance of recent developments can be understood with only limited initial knowledge. The inclusion in the Appendix of the abstracts of many of the more important papers in the field provides further assistance for the non-specialist, and acts as aspringboard to supplementary reading for those who wish to consult the original literature. Surface analysis has been the subject of numerous books and review articles, and the fundamental scientific principles of the more popular techniques are now reasonably weIl established. This book is concerned with the very powerful techniques of Auger electron and X-ray photoelectron spectroscopy (AES and XPS), with an emphasis on how they may be performed as part of a modern analytical facility. Since the development of AES and XPS in the late 1960s and early 1970s there have been great strides forward in the sensitivities and resolutions of the instrumentation. Simultaneously, these spectroscopies have undergone a veritable explosion, both in their acceptance alongside more routine analytical techniques and in the range of problems and materials to which they are applied. As a result, many researchers in industry and in academia now come into contact with AES and XPS not as specialists, but as users |
| Beschreibung: | 1 Online-Ressource (XI, 156 p) |
| ISBN: | 9781489909671 9781489909695 |
| DOI: | 10.1007/978-1-4899-0967-1 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV042412501 | ||
| 003 | DE-604 | ||
| 005 | 20171109 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 150316s1994 |||| o||u| ||||||eng d | ||
| 020 | |a 9781489909671 |c Online |9 978-1-4899-0967-1 | ||
| 020 | |a 9781489909695 |c Print |9 978-1-4899-0969-5 | ||
| 024 | 7 | |a 10.1007/978-1-4899-0967-1 |2 doi | |
| 035 | |a (OCoLC)906699500 | ||
| 035 | |a (DE-599)BVBBV042412501 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-91 |a DE-83 | ||
| 082 | 0 | |a 543 |2 23 | |
| 084 | |a PHY 000 |2 stub | ||
| 100 | 1 | |a Smith, Graham C. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Surface Analysis by Electron Spectroscopy |b Measurement and Interpretation |c by Graham C. Smith |
| 264 | 1 | |a Boston, MA |b Springer US |c 1994 | |
| 300 | |a 1 Online-Ressource (XI, 156 p) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Updates in Applied Physics and Electrical Technology | |
| 500 | |a This book is the fifth in aseries of scientific textbooks designed to cover advances in selected research fields from a basic and general viewpoint. The reader is taken carefully but rapidly through the introductory material in order that the significance of recent developments can be understood with only limited initial knowledge. The inclusion in the Appendix of the abstracts of many of the more important papers in the field provides further assistance for the non-specialist, and acts as aspringboard to supplementary reading for those who wish to consult the original literature. Surface analysis has been the subject of numerous books and review articles, and the fundamental scientific principles of the more popular techniques are now reasonably weIl established. This book is concerned with the very powerful techniques of Auger electron and X-ray photoelectron spectroscopy (AES and XPS), with an emphasis on how they may be performed as part of a modern analytical facility. Since the development of AES and XPS in the late 1960s and early 1970s there have been great strides forward in the sensitivities and resolutions of the instrumentation. Simultaneously, these spectroscopies have undergone a veritable explosion, both in their acceptance alongside more routine analytical techniques and in the range of problems and materials to which they are applied. As a result, many researchers in industry and in academia now come into contact with AES and XPS not as specialists, but as users | ||
| 650 | 4 | |a Chemistry | |
| 650 | 4 | |a Analytical biochemistry | |
| 650 | 4 | |a Crystallography | |
| 650 | 4 | |a Surfaces (Physics) | |
| 650 | 4 | |a Analytical Chemistry | |
| 650 | 4 | |a Solid State Physics | |
| 650 | 4 | |a Spectroscopy and Microscopy | |
| 650 | 4 | |a Condensed Matter Physics | |
| 650 | 4 | |a Characterization and Evaluation of Materials | |
| 650 | 4 | |a Chemie | |
| 650 | 0 | 7 | |a Elektronenspektroskopie |0 (DE-588)4014332-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Oberflächenanalyse |0 (DE-588)4172243-7 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Oberflächenanalyse |0 (DE-588)4172243-7 |D s |
| 689 | 0 | 1 | |a Elektronenspektroskopie |0 (DE-588)4014332-6 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 856 | 4 | 0 | |u https://doi.org/10.1007/978-1-4899-0967-1 |x Verlag |3 Volltext |
| 912 | |a ZDB-2-PHA |a ZDB-2-BAE | ||
| 940 | 1 | |q ZDB-2-PHA_Archive | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-027847994 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Datensatz im Suchindex
| _version_ | 1804153075376586752 |
|---|---|
| any_adam_object | |
| author | Smith, Graham C. |
| author_facet | Smith, Graham C. |
| author_role | aut |
| author_sort | Smith, Graham C. |
| author_variant | g c s gc gcs |
| building | Verbundindex |
| bvnumber | BV042412501 |
| classification_tum | PHY 000 |
| collection | ZDB-2-PHA ZDB-2-BAE |
| ctrlnum | (OCoLC)906699500 (DE-599)BVBBV042412501 |
| dewey-full | 543 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 543 - Analytical chemistry |
| dewey-raw | 543 |
| dewey-search | 543 |
| dewey-sort | 3543 |
| dewey-tens | 540 - Chemistry and allied sciences |
| discipline | Chemie / Pharmazie Physik |
| doi_str_mv | 10.1007/978-1-4899-0967-1 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03432nmm a2200553zc 4500</leader><controlfield tag="001">BV042412501</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20171109 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">150316s1994 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781489909671</subfield><subfield code="c">Online</subfield><subfield code="9">978-1-4899-0967-1</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781489909695</subfield><subfield code="c">Print</subfield><subfield code="9">978-1-4899-0969-5</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-1-4899-0967-1</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)906699500</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV042412501</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">543</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Smith, Graham C.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Surface Analysis by Electron Spectroscopy</subfield><subfield code="b">Measurement and Interpretation</subfield><subfield code="c">by Graham C. Smith</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boston, MA</subfield><subfield code="b">Springer US</subfield><subfield code="c">1994</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XI, 156 p)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Updates in Applied Physics and Electrical Technology</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">This book is the fifth in aseries of scientific textbooks designed to cover advances in selected research fields from a basic and general viewpoint. The reader is taken carefully but rapidly through the introductory material in order that the significance of recent developments can be understood with only limited initial knowledge. The inclusion in the Appendix of the abstracts of many of the more important papers in the field provides further assistance for the non-specialist, and acts as aspringboard to supplementary reading for those who wish to consult the original literature. Surface analysis has been the subject of numerous books and review articles, and the fundamental scientific principles of the more popular techniques are now reasonably weIl established. This book is concerned with the very powerful techniques of Auger electron and X-ray photoelectron spectroscopy (AES and XPS), with an emphasis on how they may be performed as part of a modern analytical facility. Since the development of AES and XPS in the late 1960s and early 1970s there have been great strides forward in the sensitivities and resolutions of the instrumentation. Simultaneously, these spectroscopies have undergone a veritable explosion, both in their acceptance alongside more routine analytical techniques and in the range of problems and materials to which they are applied. As a result, many researchers in industry and in academia now come into contact with AES and XPS not as specialists, but as users</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Chemistry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Analytical biochemistry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Crystallography</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Surfaces (Physics)</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Analytical Chemistry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Solid State Physics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Spectroscopy and Microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Condensed Matter Physics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Characterization and Evaluation of Materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Chemie</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenspektroskopie</subfield><subfield code="0">(DE-588)4014332-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Oberflächenanalyse</subfield><subfield code="0">(DE-588)4172243-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Oberflächenanalyse</subfield><subfield code="0">(DE-588)4172243-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Elektronenspektroskopie</subfield><subfield code="0">(DE-588)4014332-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-1-4899-0967-1</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-PHA</subfield><subfield code="a">ZDB-2-BAE</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-PHA_Archive</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-027847994</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
| id | DE-604.BV042412501 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:20:50Z |
| institution | BVB |
| isbn | 9781489909671 9781489909695 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027847994 |
| oclc_num | 906699500 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-83 |
| owner_facet | DE-91 DE-BY-TUM DE-83 |
| physical | 1 Online-Ressource (XI, 156 p) |
| psigel | ZDB-2-PHA ZDB-2-BAE ZDB-2-PHA_Archive |
| publishDate | 1994 |
| publishDateSearch | 1994 |
| publishDateSort | 1994 |
| publisher | Springer US |
| record_format | marc |
| series2 | Updates in Applied Physics and Electrical Technology |
| spelling | Smith, Graham C. Verfasser aut Surface Analysis by Electron Spectroscopy Measurement and Interpretation by Graham C. Smith Boston, MA Springer US 1994 1 Online-Ressource (XI, 156 p) txt rdacontent c rdamedia cr rdacarrier Updates in Applied Physics and Electrical Technology This book is the fifth in aseries of scientific textbooks designed to cover advances in selected research fields from a basic and general viewpoint. The reader is taken carefully but rapidly through the introductory material in order that the significance of recent developments can be understood with only limited initial knowledge. The inclusion in the Appendix of the abstracts of many of the more important papers in the field provides further assistance for the non-specialist, and acts as aspringboard to supplementary reading for those who wish to consult the original literature. Surface analysis has been the subject of numerous books and review articles, and the fundamental scientific principles of the more popular techniques are now reasonably weIl established. This book is concerned with the very powerful techniques of Auger electron and X-ray photoelectron spectroscopy (AES and XPS), with an emphasis on how they may be performed as part of a modern analytical facility. Since the development of AES and XPS in the late 1960s and early 1970s there have been great strides forward in the sensitivities and resolutions of the instrumentation. Simultaneously, these spectroscopies have undergone a veritable explosion, both in their acceptance alongside more routine analytical techniques and in the range of problems and materials to which they are applied. As a result, many researchers in industry and in academia now come into contact with AES and XPS not as specialists, but as users Chemistry Analytical biochemistry Crystallography Surfaces (Physics) Analytical Chemistry Solid State Physics Spectroscopy and Microscopy Condensed Matter Physics Characterization and Evaluation of Materials Chemie Elektronenspektroskopie (DE-588)4014332-6 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 gnd rswk-swf Oberflächenanalyse (DE-588)4172243-7 s Elektronenspektroskopie (DE-588)4014332-6 s 1\p DE-604 https://doi.org/10.1007/978-1-4899-0967-1 Verlag Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Smith, Graham C. Surface Analysis by Electron Spectroscopy Measurement and Interpretation Chemistry Analytical biochemistry Crystallography Surfaces (Physics) Analytical Chemistry Solid State Physics Spectroscopy and Microscopy Condensed Matter Physics Characterization and Evaluation of Materials Chemie Elektronenspektroskopie (DE-588)4014332-6 gnd Oberflächenanalyse (DE-588)4172243-7 gnd |
| subject_GND | (DE-588)4014332-6 (DE-588)4172243-7 |
| title | Surface Analysis by Electron Spectroscopy Measurement and Interpretation |
| title_auth | Surface Analysis by Electron Spectroscopy Measurement and Interpretation |
| title_exact_search | Surface Analysis by Electron Spectroscopy Measurement and Interpretation |
| title_full | Surface Analysis by Electron Spectroscopy Measurement and Interpretation by Graham C. Smith |
| title_fullStr | Surface Analysis by Electron Spectroscopy Measurement and Interpretation by Graham C. Smith |
| title_full_unstemmed | Surface Analysis by Electron Spectroscopy Measurement and Interpretation by Graham C. Smith |
| title_short | Surface Analysis by Electron Spectroscopy |
| title_sort | surface analysis by electron spectroscopy measurement and interpretation |
| title_sub | Measurement and Interpretation |
| topic | Chemistry Analytical biochemistry Crystallography Surfaces (Physics) Analytical Chemistry Solid State Physics Spectroscopy and Microscopy Condensed Matter Physics Characterization and Evaluation of Materials Chemie Elektronenspektroskopie (DE-588)4014332-6 gnd Oberflächenanalyse (DE-588)4172243-7 gnd |
| topic_facet | Chemistry Analytical biochemistry Crystallography Surfaces (Physics) Analytical Chemistry Solid State Physics Spectroscopy and Microscopy Condensed Matter Physics Characterization and Evaluation of Materials Chemie Elektronenspektroskopie Oberflächenanalyse |
| url | https://doi.org/10.1007/978-1-4899-0967-1 |
| work_keys_str_mv | AT smithgrahamc surfaceanalysisbyelectronspectroscopymeasurementandinterpretation |