Spectroscopy of semiconductor microstructures: proceedings of a NATO Advanced Research Workshop on Spectroscopy of Semiconductor Microstructures, held May 9 - 13, 1989, in Venice, Italy
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Bibliographic Details
Other Authors: Fasol, Gerhard (Editor), Fasolino, Annalisa (Editor), Lugli, Paolo 1956- (Editor)
Format: Electronic Conference Proceeding eBook
Language:English
Published: Boston, MA Springer US 1989
Series:NATO ASI Series, Series B: Physics 206
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Online Access:Volltext
Item Description:IDES have been realized in modulation doped AIGaAs/GaAs heterostructures by fabricating split-gate configurations and ultrafine etched structures with optimized lithography and etching techniques. With deep-mesa etching technique it is possible to prepare single and multi-layered quantum wire systems. From dc magnetotransport typical confinement energies of 2me V are determined. The FIR response is strongly governed by collective effects which give the resonances the character of local plasmon modes. In multi-layered quantum wire structures a splitting of the plasmon dispersion in longitudinal and acoustical type of layer-coupled local plasmon modes is observed. ACKNOWLEDGEMENT We would like to thank K Ploog for providing us with excellent samples and acknowledge financial support from the Bundesministerium fur Forschung und Tech­ nologie, Bonn. REFERENCES 1K-F. Berggren, T. J. Thornton, D. J. Newson, and M. Pepper, Phys. Rev. Lett. 57, 1769 (1986) 2H. van Houten, B. J. van Wees, M. G. J. Heijman, J. P. Andre, D. Andrews, and G. J. Davies, Appl. Phys. Lett. 49, 1781 (1986) 3J. Cibert, P. M. Petroff, G. J. Dolan, S. J. Pearton, A. C. Gossard, and J. H. English, Appl. Phys. Lett. 49, 1275 (1986) 4T. P. Smith, III. , H. Arnot, J. M. Hong, C. M. Knoedler, S. E. Laux, and H. Schmid, Phys. Rev. Lett. 59, 2802 (1987) 5M. L. Roukes, A. Scherer, S. J. Allen, Jr. , H. G. Craighead, R. M. Ruthen, E. D. Beebe, and J. P. Harbison, Phys. Rev. Lett
Physical Description:1 Online-Ressource (XIV, 667 p)
ISBN:9781475765656
9781475765670
DOI:10.1007/978-1-4757-6565-6

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