Advanced Computing in Electron Microscopy:
Saved in:
| Main Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Boston, MA
Springer US
1998
|
| Subjects: | |
| Online Access: | Volltext |
| Item Description: | pending |
| Physical Description: | 1 Online-Ressource (IX, 250 p) |
| ISBN: | 9781475744064 9781475744088 |
| DOI: | 10.1007/978-1-4757-4406-4 |
Staff View
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Record in the Search Index
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| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.36 |
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| dewey-sort | 3621.36 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
| doi_str_mv | 10.1007/978-1-4757-4406-4 |
| format | Electronic eBook |
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| id | DE-604.BV042412379 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:20:50Z |
| institution | BVB |
| isbn | 9781475744064 9781475744088 |
| language | English |
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| physical | 1 Online-Ressource (IX, 250 p) |
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| publishDate | 1998 |
| publishDateSearch | 1998 |
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| publisher | Springer US |
| record_format | marc |
| spelling | Kirkland, Earl J. Verfasser aut Advanced Computing in Electron Microscopy by Earl J. Kirkland Boston, MA Springer US 1998 1 Online-Ressource (IX, 250 p) txt rdacontent c rdamedia cr rdacarrier pending Physics Computer science / Mathematics Computer engineering Electronics Optical materials Surfaces (Physics) Spectroscopy and Microscopy Computational Mathematics and Numerical Analysis Electronics and Microelectronics, Instrumentation Electrical Engineering Optical and Electronic Materials Characterization and Evaluation of Materials Informatik Mathematik Computersimulation (DE-588)4148259-1 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s Computersimulation (DE-588)4148259-1 s 1\p DE-604 https://doi.org/10.1007/978-1-4757-4406-4 Verlag Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Kirkland, Earl J. Advanced Computing in Electron Microscopy Physics Computer science / Mathematics Computer engineering Electronics Optical materials Surfaces (Physics) Spectroscopy and Microscopy Computational Mathematics and Numerical Analysis Electronics and Microelectronics, Instrumentation Electrical Engineering Optical and Electronic Materials Characterization and Evaluation of Materials Informatik Mathematik Computersimulation (DE-588)4148259-1 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4148259-1 (DE-588)4014327-2 |
| title | Advanced Computing in Electron Microscopy |
| title_auth | Advanced Computing in Electron Microscopy |
| title_exact_search | Advanced Computing in Electron Microscopy |
| title_full | Advanced Computing in Electron Microscopy by Earl J. Kirkland |
| title_fullStr | Advanced Computing in Electron Microscopy by Earl J. Kirkland |
| title_full_unstemmed | Advanced Computing in Electron Microscopy by Earl J. Kirkland |
| title_short | Advanced Computing in Electron Microscopy |
| title_sort | advanced computing in electron microscopy |
| topic | Physics Computer science / Mathematics Computer engineering Electronics Optical materials Surfaces (Physics) Spectroscopy and Microscopy Computational Mathematics and Numerical Analysis Electronics and Microelectronics, Instrumentation Electrical Engineering Optical and Electronic Materials Characterization and Evaluation of Materials Informatik Mathematik Computersimulation (DE-588)4148259-1 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | Physics Computer science / Mathematics Computer engineering Electronics Optical materials Surfaces (Physics) Spectroscopy and Microscopy Computational Mathematics and Numerical Analysis Electronics and Microelectronics, Instrumentation Electrical Engineering Optical and Electronic Materials Characterization and Evaluation of Materials Informatik Mathematik Computersimulation Elektronenmikroskopie |
| url | https://doi.org/10.1007/978-1-4757-4406-4 |
| work_keys_str_mv | AT kirklandearlj advancedcomputinginelectronmicroscopy |