Advanced Computing in Electron Microscopy:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boston, MA
Springer US
1998
|
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | pending |
| Beschreibung: | 1 Online-Ressource (IX, 250 p) |
| ISBN: | 9781475744064 9781475744088 |
| DOI: | 10.1007/978-1-4757-4406-4 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV042412379 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 150316s1998 |||| o||u| ||||||eng d | ||
| 020 | |a 9781475744064 |c Online |9 978-1-4757-4406-4 | ||
| 020 | |a 9781475744088 |c Print |9 978-1-4757-4408-8 | ||
| 024 | 7 | |a 10.1007/978-1-4757-4406-4 |2 doi | |
| 035 | |a (OCoLC)863997441 | ||
| 035 | |a (DE-599)BVBBV042412379 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-91 |a DE-83 | ||
| 082 | 0 | |a 621.36 |2 23 | |
| 084 | |a PHY 000 |2 stub | ||
| 100 | 1 | |a Kirkland, Earl J. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Advanced Computing in Electron Microscopy |c by Earl J. Kirkland |
| 264 | 1 | |a Boston, MA |b Springer US |c 1998 | |
| 300 | |a 1 Online-Ressource (IX, 250 p) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a pending | ||
| 650 | 4 | |a Physics | |
| 650 | 4 | |a Computer science / Mathematics | |
| 650 | 4 | |a Computer engineering | |
| 650 | 4 | |a Electronics | |
| 650 | 4 | |a Optical materials | |
| 650 | 4 | |a Surfaces (Physics) | |
| 650 | 4 | |a Spectroscopy and Microscopy | |
| 650 | 4 | |a Computational Mathematics and Numerical Analysis | |
| 650 | 4 | |a Electronics and Microelectronics, Instrumentation | |
| 650 | 4 | |a Electrical Engineering | |
| 650 | 4 | |a Optical and Electronic Materials | |
| 650 | 4 | |a Characterization and Evaluation of Materials | |
| 650 | 4 | |a Informatik | |
| 650 | 4 | |a Mathematik | |
| 650 | 0 | 7 | |a Computersimulation |0 (DE-588)4148259-1 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
| 689 | 0 | 1 | |a Computersimulation |0 (DE-588)4148259-1 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 856 | 4 | 0 | |u https://doi.org/10.1007/978-1-4757-4406-4 |x Verlag |3 Volltext |
| 912 | |a ZDB-2-PHA |a ZDB-2-BAE | ||
| 940 | 1 | |q ZDB-2-PHA_Archive | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-027847872 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Datensatz im Suchindex
| _version_ | 1804153075038945280 |
|---|---|
| any_adam_object | |
| author | Kirkland, Earl J. |
| author_facet | Kirkland, Earl J. |
| author_role | aut |
| author_sort | Kirkland, Earl J. |
| author_variant | e j k ej ejk |
| building | Verbundindex |
| bvnumber | BV042412379 |
| classification_tum | PHY 000 |
| collection | ZDB-2-PHA ZDB-2-BAE |
| ctrlnum | (OCoLC)863997441 (DE-599)BVBBV042412379 |
| dewey-full | 621.36 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.36 |
| dewey-search | 621.36 |
| dewey-sort | 3621.36 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
| doi_str_mv | 10.1007/978-1-4757-4406-4 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02042nmm a2200589zc 4500</leader><controlfield tag="001">BV042412379</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">150316s1998 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781475744064</subfield><subfield code="c">Online</subfield><subfield code="9">978-1-4757-4406-4</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781475744088</subfield><subfield code="c">Print</subfield><subfield code="9">978-1-4757-4408-8</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-1-4757-4406-4</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)863997441</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV042412379</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.36</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Kirkland, Earl J.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Advanced Computing in Electron Microscopy</subfield><subfield code="c">by Earl J. Kirkland</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boston, MA</subfield><subfield code="b">Springer US</subfield><subfield code="c">1998</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (IX, 250 p)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">pending</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Physics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Computer science / Mathematics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Computer engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Surfaces (Physics)</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Spectroscopy and Microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Computational Mathematics and Numerical Analysis</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics and Microelectronics, Instrumentation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electrical Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical and Electronic Materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Characterization and Evaluation of Materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Informatik</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Mathematik</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Computersimulation</subfield><subfield code="0">(DE-588)4148259-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Computersimulation</subfield><subfield code="0">(DE-588)4148259-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-1-4757-4406-4</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-PHA</subfield><subfield code="a">ZDB-2-BAE</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-PHA_Archive</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-027847872</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
| id | DE-604.BV042412379 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:20:50Z |
| institution | BVB |
| isbn | 9781475744064 9781475744088 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027847872 |
| oclc_num | 863997441 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-83 |
| owner_facet | DE-91 DE-BY-TUM DE-83 |
| physical | 1 Online-Ressource (IX, 250 p) |
| psigel | ZDB-2-PHA ZDB-2-BAE ZDB-2-PHA_Archive |
| publishDate | 1998 |
| publishDateSearch | 1998 |
| publishDateSort | 1998 |
| publisher | Springer US |
| record_format | marc |
| spelling | Kirkland, Earl J. Verfasser aut Advanced Computing in Electron Microscopy by Earl J. Kirkland Boston, MA Springer US 1998 1 Online-Ressource (IX, 250 p) txt rdacontent c rdamedia cr rdacarrier pending Physics Computer science / Mathematics Computer engineering Electronics Optical materials Surfaces (Physics) Spectroscopy and Microscopy Computational Mathematics and Numerical Analysis Electronics and Microelectronics, Instrumentation Electrical Engineering Optical and Electronic Materials Characterization and Evaluation of Materials Informatik Mathematik Computersimulation (DE-588)4148259-1 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s Computersimulation (DE-588)4148259-1 s 1\p DE-604 https://doi.org/10.1007/978-1-4757-4406-4 Verlag Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Kirkland, Earl J. Advanced Computing in Electron Microscopy Physics Computer science / Mathematics Computer engineering Electronics Optical materials Surfaces (Physics) Spectroscopy and Microscopy Computational Mathematics and Numerical Analysis Electronics and Microelectronics, Instrumentation Electrical Engineering Optical and Electronic Materials Characterization and Evaluation of Materials Informatik Mathematik Computersimulation (DE-588)4148259-1 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4148259-1 (DE-588)4014327-2 |
| title | Advanced Computing in Electron Microscopy |
| title_auth | Advanced Computing in Electron Microscopy |
| title_exact_search | Advanced Computing in Electron Microscopy |
| title_full | Advanced Computing in Electron Microscopy by Earl J. Kirkland |
| title_fullStr | Advanced Computing in Electron Microscopy by Earl J. Kirkland |
| title_full_unstemmed | Advanced Computing in Electron Microscopy by Earl J. Kirkland |
| title_short | Advanced Computing in Electron Microscopy |
| title_sort | advanced computing in electron microscopy |
| topic | Physics Computer science / Mathematics Computer engineering Electronics Optical materials Surfaces (Physics) Spectroscopy and Microscopy Computational Mathematics and Numerical Analysis Electronics and Microelectronics, Instrumentation Electrical Engineering Optical and Electronic Materials Characterization and Evaluation of Materials Informatik Mathematik Computersimulation (DE-588)4148259-1 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | Physics Computer science / Mathematics Computer engineering Electronics Optical materials Surfaces (Physics) Spectroscopy and Microscopy Computational Mathematics and Numerical Analysis Electronics and Microelectronics, Instrumentation Electrical Engineering Optical and Electronic Materials Characterization and Evaluation of Materials Informatik Mathematik Computersimulation Elektronenmikroskopie |
| url | https://doi.org/10.1007/978-1-4757-4406-4 |
| work_keys_str_mv | AT kirklandearlj advancedcomputinginelectronmicroscopy |