Reflection high-energy electron diffraction and reflection electron imaging of surfaces: proceedings of a NATO ARW held in Veldhoven, The Netherlands, June 15-19, 1987
Gespeichert in:
| Weitere Verfasser: | , |
|---|---|
| Format: | Elektronisch Tagungsbericht E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boston, MA
Springer US
1988
|
| Schriftenreihe: | NATO ASI Series, Series B: Physics
188 |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | This volume contains the papers presented at the NATO Advanced Research Workshop in "Reflection High Energy Electron Diffraction and Reflection Electron Imaging of Surfaces" held at the Koningshof conference center, Veldhoven, the Netherlands, June 15-19, 1987. The main topics of the workshop, Reflection High Energy Electron Diffraction (RHEED) and Reflection Electron Microscopy (REM), have a common basis in the diffraction processes which high energy electrons undergo when they interact with solid surfaces at grazing angles. However, while REM is a new technique developed on the basis of recent advances in transmission electron microscopy, RHEED is an old method in surface crystallography going back to the discovery of electron diffraction in 1927 by Davisson and Germer. Until the development of ultra high vacuum techniques in the 1960's made instruments using slow electrons more accessable, RHEED was the dominating electron diffraction technique. Since then and until recently the method of Low Energy Electron Diffraction (LEED) largely surpassed RHEED in popularity in surface studies. The two methods are closely related of course, each with its own specific advantages. The grazing angle geometry of RHEED has now become a very useful feature because this makes it ideally suited for combination with the thin growth technique of Molecular Beam Epitaxy (MBE). This combination allows in-situ studies of freshly grown and even growing surfaces, opening up new areas of research of both fundamental and technological importance |
| Beschreibung: | 1 Online-Ressource (556p) |
| ISBN: | 9781468455809 9781468455823 |
| DOI: | 10.1007/978-1-4684-5580-9 |
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Datensatz im Suchindex
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| any_adam_object | |
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| dewey-sort | 3530.41 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| doi_str_mv | 10.1007/978-1-4684-5580-9 |
| format | Electronic Conference Proceeding eBook |
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| spelling | Larsen, P. K. edt Reflection high-energy electron diffraction and reflection electron imaging of surfaces proceedings of a NATO ARW held in Veldhoven, The Netherlands, June 15-19, 1987 edited by P. K. Larsen and P. J. Dobson Boston, MA Springer US 1988 1 Online-Ressource (556p) txt rdacontent c rdamedia cr rdacarrier NATO ASI Series, Series B: Physics 188 This volume contains the papers presented at the NATO Advanced Research Workshop in "Reflection High Energy Electron Diffraction and Reflection Electron Imaging of Surfaces" held at the Koningshof conference center, Veldhoven, the Netherlands, June 15-19, 1987. The main topics of the workshop, Reflection High Energy Electron Diffraction (RHEED) and Reflection Electron Microscopy (REM), have a common basis in the diffraction processes which high energy electrons undergo when they interact with solid surfaces at grazing angles. However, while REM is a new technique developed on the basis of recent advances in transmission electron microscopy, RHEED is an old method in surface crystallography going back to the discovery of electron diffraction in 1927 by Davisson and Germer. Until the development of ultra high vacuum techniques in the 1960's made instruments using slow electrons more accessable, RHEED was the dominating electron diffraction technique. Since then and until recently the method of Low Energy Electron Diffraction (LEED) largely surpassed RHEED in popularity in surface studies. The two methods are closely related of course, each with its own specific advantages. The grazing angle geometry of RHEED has now become a very useful feature because this makes it ideally suited for combination with the thin growth technique of Molecular Beam Epitaxy (MBE). This combination allows in-situ studies of freshly grown and even growing surfaces, opening up new areas of research of both fundamental and technological importance Physics Crystallography Surfaces (Physics) Solid State Physics Spectroscopy and Microscopy Condensed Matter Physics Characterization and Evaluation of Materials RHEED (DE-588)4295703-5 gnd rswk-swf Festkörperoberfläche (DE-588)4127823-9 gnd rswk-swf Reflexionselektronenmikroskopie (DE-588)4295699-7 gnd rswk-swf 1\p (DE-588)1071861417 Konferenzschrift 1987 Veldhoven gnd-content Festkörperoberfläche (DE-588)4127823-9 s Reflexionselektronenmikroskopie (DE-588)4295699-7 s 2\p DE-604 RHEED (DE-588)4295703-5 s 3\p DE-604 Dobson, P. J. edt Advanced Research Workshop on Reflection High Energy Electron Diffraction and Reflection Electron Imaging of Surfaces 1987 Veldhoven Sonstige (DE-588)5003265-3 oth Erscheint auch als Druck-Ausgabe 0-306-43035-5 https://doi.org/10.1007/978-1-4684-5580-9 Verlag Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Reflection high-energy electron diffraction and reflection electron imaging of surfaces proceedings of a NATO ARW held in Veldhoven, The Netherlands, June 15-19, 1987 Physics Crystallography Surfaces (Physics) Solid State Physics Spectroscopy and Microscopy Condensed Matter Physics Characterization and Evaluation of Materials RHEED (DE-588)4295703-5 gnd Festkörperoberfläche (DE-588)4127823-9 gnd Reflexionselektronenmikroskopie (DE-588)4295699-7 gnd |
| subject_GND | (DE-588)4295703-5 (DE-588)4127823-9 (DE-588)4295699-7 (DE-588)1071861417 |
| title | Reflection high-energy electron diffraction and reflection electron imaging of surfaces proceedings of a NATO ARW held in Veldhoven, The Netherlands, June 15-19, 1987 |
| title_auth | Reflection high-energy electron diffraction and reflection electron imaging of surfaces proceedings of a NATO ARW held in Veldhoven, The Netherlands, June 15-19, 1987 |
| title_exact_search | Reflection high-energy electron diffraction and reflection electron imaging of surfaces proceedings of a NATO ARW held in Veldhoven, The Netherlands, June 15-19, 1987 |
| title_full | Reflection high-energy electron diffraction and reflection electron imaging of surfaces proceedings of a NATO ARW held in Veldhoven, The Netherlands, June 15-19, 1987 edited by P. K. Larsen and P. J. Dobson |
| title_fullStr | Reflection high-energy electron diffraction and reflection electron imaging of surfaces proceedings of a NATO ARW held in Veldhoven, The Netherlands, June 15-19, 1987 edited by P. K. Larsen and P. J. Dobson |
| title_full_unstemmed | Reflection high-energy electron diffraction and reflection electron imaging of surfaces proceedings of a NATO ARW held in Veldhoven, The Netherlands, June 15-19, 1987 edited by P. K. Larsen and P. J. Dobson |
| title_short | Reflection high-energy electron diffraction and reflection electron imaging of surfaces |
| title_sort | reflection high energy electron diffraction and reflection electron imaging of surfaces proceedings of a nato arw held in veldhoven the netherlands june 15 19 1987 |
| title_sub | proceedings of a NATO ARW held in Veldhoven, The Netherlands, June 15-19, 1987 |
| topic | Physics Crystallography Surfaces (Physics) Solid State Physics Spectroscopy and Microscopy Condensed Matter Physics Characterization and Evaluation of Materials RHEED (DE-588)4295703-5 gnd Festkörperoberfläche (DE-588)4127823-9 gnd Reflexionselektronenmikroskopie (DE-588)4295699-7 gnd |
| topic_facet | Physics Crystallography Surfaces (Physics) Solid State Physics Spectroscopy and Microscopy Condensed Matter Physics Characterization and Evaluation of Materials RHEED Festkörperoberfläche Reflexionselektronenmikroskopie Konferenzschrift 1987 Veldhoven |
| url | https://doi.org/10.1007/978-1-4684-5580-9 |
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