Material Characterization Using Ion Beams:
Gespeichert in:
Weitere Verfasser: | , |
---|---|
Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Boston, MA
Springer US
1978
|
Schriftenreihe: | NATO Advanced Study Institutes Series, Series B: Physics
28 |
Schlagworte: | |
Online-Zugang: | Volltext |
Beschreibung: | The extensive use of low-energy accelerators in non-nuclear physics has now reached the stage where these activities are recognized as a natural field of investigation. Many other areas in physics and chemistry have undergone similarly spectacular development: beam foil spectroscopy in atomic physics, studies in atomic collisions, materials implantation, defects creation, nuclear microanalysis, and so on. Now, this most recent activity by itself and in its evident connection with the others has brought a new impetus to both the fundamental and the applied aspects of materials science. A summer school on "Material Characterization Using Ion Beams" has resulted from these developments and the realization that the use of ion beams is not restricted to accelerators but covers a wide energy range in the developing technology. The idea of the ion beam as a common denominator of many activities dealing with surface and near-surface characterization was enthusiastically received by many scientists and a school on this subject received the positive endorsement of NATO. The Advanced Study Institute on Materials Science has assumed for us the status of an "institution" leading to better contact among the many laboratories engaged in this field. The fourth Institute in this series was held in Aleria, Corsica, between August 22 and September 12, 1976 |
Beschreibung: | 1 Online-Ressource (XVIII, 517 p) |
ISBN: | 9781468408560 9781468408584 |
ISSN: | 0258-1221 |
DOI: | 10.1007/978-1-4684-0856-0 |
Internformat
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490 | 1 | |a NATO Advanced Study Institutes Series, Series B: Physics |v 28 |x 0258-1221 | |
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Datensatz im Suchindex
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---|---|
any_adam_object | |
author2 | Thomas, J. P. Cachard, A. |
author2_role | edt edt |
author2_variant | j p t jp jpt a c ac |
author_facet | Thomas, J. P. Cachard, A. |
building | Verbundindex |
bvnumber | BV042411849 |
classification_tum | PHY 000 |
collection | ZDB-2-PHA ZDB-2-BAE |
ctrlnum | (OCoLC)905348918 (DE-599)BVBBV042411849 |
dewey-full | 530.41 |
dewey-hundreds | 500 - Natural sciences and mathematics |
dewey-ones | 530 - Physics |
dewey-raw | 530.41 |
dewey-search | 530.41 |
dewey-sort | 3530.41 |
dewey-tens | 530 - Physics |
discipline | Physik |
doi_str_mv | 10.1007/978-1-4684-0856-0 |
format | Electronic eBook |
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genre | 1\p (DE-588)1071861417 Konferenzschrift 1976 Aleria gnd-content 2\p (DE-588)1071861417 Konferenzschrift 1976 Aléria gnd-content |
genre_facet | Konferenzschrift 1976 Aleria Konferenzschrift 1976 Aléria |
id | DE-604.BV042411849 |
illustrated | Not Illustrated |
indexdate | 2024-07-10T01:20:49Z |
institution | BVB |
isbn | 9781468408560 9781468408584 |
issn | 0258-1221 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027847342 |
oclc_num | 905348918 |
open_access_boolean | |
owner | DE-91 DE-BY-TUM DE-83 |
owner_facet | DE-91 DE-BY-TUM DE-83 |
physical | 1 Online-Ressource (XVIII, 517 p) |
psigel | ZDB-2-PHA ZDB-2-BAE ZDB-2-PHA_Archive |
publishDate | 1978 |
publishDateSearch | 1978 |
publishDateSort | 1978 |
publisher | Springer US |
record_format | marc |
series2 | NATO Advanced Study Institutes Series, Series B: Physics |
spelling | Material Characterization Using Ion Beams edited by J. P. Thomas, A. Cachard Boston, MA Springer US 1978 1 Online-Ressource (XVIII, 517 p) txt rdacontent c rdamedia cr rdacarrier NATO Advanced Study Institutes Series, Series B: Physics 28 0258-1221 The extensive use of low-energy accelerators in non-nuclear physics has now reached the stage where these activities are recognized as a natural field of investigation. Many other areas in physics and chemistry have undergone similarly spectacular development: beam foil spectroscopy in atomic physics, studies in atomic collisions, materials implantation, defects creation, nuclear microanalysis, and so on. Now, this most recent activity by itself and in its evident connection with the others has brought a new impetus to both the fundamental and the applied aspects of materials science. A summer school on "Material Characterization Using Ion Beams" has resulted from these developments and the realization that the use of ion beams is not restricted to accelerators but covers a wide energy range in the developing technology. The idea of the ion beam as a common denominator of many activities dealing with surface and near-surface characterization was enthusiastically received by many scientists and a school on this subject received the positive endorsement of NATO. The Advanced Study Institute on Materials Science has assumed for us the status of an "institution" leading to better contact among the many laboratories engaged in this field. The fourth Institute in this series was held in Aleria, Corsica, between August 22 and September 12, 1976 Physics Solid State Physics Spectroscopy and Microscopy Ionenstrahl (DE-588)4162347-2 gnd rswk-swf Ionenoptik (DE-588)4162327-7 gnd rswk-swf Untersuchungsmethode (DE-588)4324907-3 gnd rswk-swf Werkstoffprüfung (DE-588)4037934-6 gnd rswk-swf Festkörperoberfläche (DE-588)4127823-9 gnd rswk-swf Channeling (DE-588)4147560-4 gnd rswk-swf Ionenspektroskopie (DE-588)4455365-1 gnd rswk-swf Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd rswk-swf 1\p (DE-588)1071861417 Konferenzschrift 1976 Aleria gnd-content 2\p (DE-588)1071861417 Konferenzschrift 1976 Aléria gnd-content Festkörperoberfläche (DE-588)4127823-9 s Untersuchungsmethode (DE-588)4324907-3 s 3\p DE-604 Ionenoptik (DE-588)4162327-7 s Werkstoffprüfung (DE-588)4037934-6 s 4\p DE-604 Ionenstrahl (DE-588)4162347-2 s 5\p DE-604 Ionenspektroskopie (DE-588)4455365-1 s 6\p DE-604 Sekundärionen-Massenspektrometrie (DE-588)4077346-2 s 7\p DE-604 Channeling (DE-588)4147560-4 s 8\p DE-604 Thomas, J. P. edt Cachard, A. edt NATO Advanced Study Institutes Series, Series B Physics 28 (DE-604)BV001891224 28 https://doi.org/10.1007/978-1-4684-0856-0 Verlag Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 5\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 6\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 7\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 8\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Material Characterization Using Ion Beams Physics Solid State Physics Spectroscopy and Microscopy Ionenstrahl (DE-588)4162347-2 gnd Ionenoptik (DE-588)4162327-7 gnd Untersuchungsmethode (DE-588)4324907-3 gnd Werkstoffprüfung (DE-588)4037934-6 gnd Festkörperoberfläche (DE-588)4127823-9 gnd Channeling (DE-588)4147560-4 gnd Ionenspektroskopie (DE-588)4455365-1 gnd Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
subject_GND | (DE-588)4162347-2 (DE-588)4162327-7 (DE-588)4324907-3 (DE-588)4037934-6 (DE-588)4127823-9 (DE-588)4147560-4 (DE-588)4455365-1 (DE-588)4077346-2 (DE-588)1071861417 |
title | Material Characterization Using Ion Beams |
title_auth | Material Characterization Using Ion Beams |
title_exact_search | Material Characterization Using Ion Beams |
title_full | Material Characterization Using Ion Beams edited by J. P. Thomas, A. Cachard |
title_fullStr | Material Characterization Using Ion Beams edited by J. P. Thomas, A. Cachard |
title_full_unstemmed | Material Characterization Using Ion Beams edited by J. P. Thomas, A. Cachard |
title_short | Material Characterization Using Ion Beams |
title_sort | material characterization using ion beams |
topic | Physics Solid State Physics Spectroscopy and Microscopy Ionenstrahl (DE-588)4162347-2 gnd Ionenoptik (DE-588)4162327-7 gnd Untersuchungsmethode (DE-588)4324907-3 gnd Werkstoffprüfung (DE-588)4037934-6 gnd Festkörperoberfläche (DE-588)4127823-9 gnd Channeling (DE-588)4147560-4 gnd Ionenspektroskopie (DE-588)4455365-1 gnd Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
topic_facet | Physics Solid State Physics Spectroscopy and Microscopy Ionenstrahl Ionenoptik Untersuchungsmethode Werkstoffprüfung Festkörperoberfläche Channeling Ionenspektroskopie Sekundärionen-Massenspektrometrie Konferenzschrift 1976 Aleria Konferenzschrift 1976 Aléria |
url | https://doi.org/10.1007/978-1-4684-0856-0 |
volume_link | (DE-604)BV001891224 |
work_keys_str_mv | AT thomasjp materialcharacterizationusingionbeams AT cacharda materialcharacterizationusingionbeams |