Ion Beam Surface Layer Analysis: Volume 1
Gespeichert in:
| Weitere Verfasser: | , , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boston, MA
Springer US
1976
|
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | The II. International Conference on Ion Beam Surface Layer Analysis was held on September 15-19, 1975 at the Nuclear Research Center, Karlsruhe, Germany. The date fell between two related conferences: "Application of Ion-Beams to Materials" at Warwick, England and "Atomic Collisions in Solids" at Amsterdam, the Netherlands. The first conference on Ion Beam Surface Layer Analysis was held at Yorktown Heights, New York, 1973. The major topic of that and the present conference was the material analysis with ion beams including backscattering and channeling, nuclear reactions and ion induced X-rays with emphasis on technical problems and novel applications. The increasing interest in this field was documented by 7 invited papers and 85 contributions which were presented at the meeting in Karlsruhe to about 150 participants from 21 countries. The oral presentations were followed by parallel sessions on "Fundamental Aspects", "Analytical Problems" and "Applications" encouraging detailed discussions on the topics of most current interest. Summaries of these sessions were presented by the discussion leaders to the whole conference. All invited and contributed papers are included in these proceedings; summaries of the discussion sessions will appear in a separate booklet and are availble from the editors. The application of ion beams to material analysis is now well established |
| Beschreibung: | 1 Online-Ressource (XVII, 494 p) |
| ISBN: | 9781461588764 9781461588788 |
| DOI: | 10.1007/978-1-4615-8876-4 |
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| 500 | |a The II. International Conference on Ion Beam Surface Layer Analysis was held on September 15-19, 1975 at the Nuclear Research Center, Karlsruhe, Germany. The date fell between two related conferences: "Application of Ion-Beams to Materials" at Warwick, England and "Atomic Collisions in Solids" at Amsterdam, the Netherlands. The first conference on Ion Beam Surface Layer Analysis was held at Yorktown Heights, New York, 1973. The major topic of that and the present conference was the material analysis with ion beams including backscattering and channeling, nuclear reactions and ion induced X-rays with emphasis on technical problems and novel applications. The increasing interest in this field was documented by 7 invited papers and 85 contributions which were presented at the meeting in Karlsruhe to about 150 participants from 21 countries. The oral presentations were followed by parallel sessions on "Fundamental Aspects", "Analytical Problems" and "Applications" encouraging detailed discussions on the topics of most current interest. Summaries of these sessions were presented by the discussion leaders to the whole conference. All invited and contributed papers are included in these proceedings; summaries of the discussion sessions will appear in a separate booklet and are availble from the editors. The application of ion beams to material analysis is now well established | ||
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Datensatz im Suchindex
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| author_facet | Meyer, O. Linker, G. Käppeler, F. |
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| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:20:49Z |
| institution | BVB |
| isbn | 9781461588764 9781461588788 |
| language | English |
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| physical | 1 Online-Ressource (XVII, 494 p) |
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| publishDate | 1976 |
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| spelling | Meyer, O. edt Ion Beam Surface Layer Analysis Volume 1 edited by O. Meyer, G. Linker, F. Käppeler Boston, MA Springer US 1976 1 Online-Ressource (XVII, 494 p) txt rdacontent c rdamedia cr rdacarrier The II. International Conference on Ion Beam Surface Layer Analysis was held on September 15-19, 1975 at the Nuclear Research Center, Karlsruhe, Germany. The date fell between two related conferences: "Application of Ion-Beams to Materials" at Warwick, England and "Atomic Collisions in Solids" at Amsterdam, the Netherlands. The first conference on Ion Beam Surface Layer Analysis was held at Yorktown Heights, New York, 1973. The major topic of that and the present conference was the material analysis with ion beams including backscattering and channeling, nuclear reactions and ion induced X-rays with emphasis on technical problems and novel applications. The increasing interest in this field was documented by 7 invited papers and 85 contributions which were presented at the meeting in Karlsruhe to about 150 participants from 21 countries. The oral presentations were followed by parallel sessions on "Fundamental Aspects", "Analytical Problems" and "Applications" encouraging detailed discussions on the topics of most current interest. Summaries of these sessions were presented by the discussion leaders to the whole conference. All invited and contributed papers are included in these proceedings; summaries of the discussion sessions will appear in a separate booklet and are availble from the editors. The application of ion beams to material analysis is now well established Physics Nuclear physics Nuclear Physics, Heavy Ions, Hadrons Linker, G. edt Käppeler, F. edt https://doi.org/10.1007/978-1-4615-8876-4 Verlag Volltext |
| spellingShingle | Ion Beam Surface Layer Analysis Volume 1 Physics Nuclear physics Nuclear Physics, Heavy Ions, Hadrons |
| title | Ion Beam Surface Layer Analysis Volume 1 |
| title_auth | Ion Beam Surface Layer Analysis Volume 1 |
| title_exact_search | Ion Beam Surface Layer Analysis Volume 1 |
| title_full | Ion Beam Surface Layer Analysis Volume 1 edited by O. Meyer, G. Linker, F. Käppeler |
| title_fullStr | Ion Beam Surface Layer Analysis Volume 1 edited by O. Meyer, G. Linker, F. Käppeler |
| title_full_unstemmed | Ion Beam Surface Layer Analysis Volume 1 edited by O. Meyer, G. Linker, F. Käppeler |
| title_short | Ion Beam Surface Layer Analysis |
| title_sort | ion beam surface layer analysis volume 1 |
| title_sub | Volume 1 |
| topic | Physics Nuclear physics Nuclear Physics, Heavy Ions, Hadrons |
| topic_facet | Physics Nuclear physics Nuclear Physics, Heavy Ions, Hadrons |
| url | https://doi.org/10.1007/978-1-4615-8876-4 |
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