Quantitative X-Ray Diffractometry:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
New York, NY
Springer US
1995
|
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pattern can be measured, not its phase. The inverse problem, of determining the structure from the pattern thus contains ambiguities that must be resolved by other means. Quantitative X-ray analysis provides one way to resolve this phase problem: mixing the material in question with a material of known structure yields interferences that can be analyzed to yield the unknown phases. Invented in 1916, but little used at the time, the technique has seen a recent revival due to the development of extremely precise X-ray diffractometers coupled with powerful computers |
| Beschreibung: | 1 Online-Ressource (XVII, 372p. 70 illus) |
| ISBN: | 9781461395355 9781461395379 |
| DOI: | 10.1007/978-1-4613-9535-5 |
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| 500 | |a One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pattern can be measured, not its phase. The inverse problem, of determining the structure from the pattern thus contains ambiguities that must be resolved by other means. Quantitative X-ray analysis provides one way to resolve this phase problem: mixing the material in question with a material of known structure yields interferences that can be analyzed to yield the unknown phases. Invented in 1916, but little used at the time, the technique has seen a recent revival due to the development of extremely precise X-ray diffractometers coupled with powerful computers | ||
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Datensatz im Suchindex
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| author | Zevin, Lev S. |
| author_facet | Zevin, Lev S. |
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| author_sort | Zevin, Lev S. |
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| bvnumber | BV042411494 |
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| dewey-full | 548 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 548 - Crystallography |
| dewey-raw | 548 |
| dewey-search | 548 |
| dewey-sort | 3548 |
| dewey-tens | 540 - Chemistry and allied sciences |
| discipline | Chemie / Pharmazie Physik |
| doi_str_mv | 10.1007/978-1-4613-9535-5 |
| format | Electronic eBook |
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| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:20:48Z |
| institution | BVB |
| isbn | 9781461395355 9781461395379 |
| language | English |
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| physical | 1 Online-Ressource (XVII, 372p. 70 illus) |
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| spelling | Zevin, Lev S. Verfasser aut Quantitative X-Ray Diffractometry by Lev S. Zevin, Giora Kimmel ; edited by Inez Mureinik New York, NY Springer US 1995 1 Online-Ressource (XVII, 372p. 70 illus) txt rdacontent c rdamedia cr rdacarrier One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pattern can be measured, not its phase. The inverse problem, of determining the structure from the pattern thus contains ambiguities that must be resolved by other means. Quantitative X-ray analysis provides one way to resolve this phase problem: mixing the material in question with a material of known structure yields interferences that can be analyzed to yield the unknown phases. Invented in 1916, but little used at the time, the technique has seen a recent revival due to the development of extremely precise X-ray diffractometers coupled with powerful computers Physics Crystallography Röntgendiffraktometrie (DE-588)4336833-5 gnd rswk-swf Röntgenstreuung (DE-588)4178324-4 gnd rswk-swf Röntgenstreuung (DE-588)4178324-4 s 1\p DE-604 Röntgendiffraktometrie (DE-588)4336833-5 s 2\p DE-604 Kimmel, Giora Sonstige oth Mureinik, Inez Sonstige oth https://doi.org/10.1007/978-1-4613-9535-5 Verlag Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Zevin, Lev S. Quantitative X-Ray Diffractometry Physics Crystallography Röntgendiffraktometrie (DE-588)4336833-5 gnd Röntgenstreuung (DE-588)4178324-4 gnd |
| subject_GND | (DE-588)4336833-5 (DE-588)4178324-4 |
| title | Quantitative X-Ray Diffractometry |
| title_auth | Quantitative X-Ray Diffractometry |
| title_exact_search | Quantitative X-Ray Diffractometry |
| title_full | Quantitative X-Ray Diffractometry by Lev S. Zevin, Giora Kimmel ; edited by Inez Mureinik |
| title_fullStr | Quantitative X-Ray Diffractometry by Lev S. Zevin, Giora Kimmel ; edited by Inez Mureinik |
| title_full_unstemmed | Quantitative X-Ray Diffractometry by Lev S. Zevin, Giora Kimmel ; edited by Inez Mureinik |
| title_short | Quantitative X-Ray Diffractometry |
| title_sort | quantitative x ray diffractometry |
| topic | Physics Crystallography Röntgendiffraktometrie (DE-588)4336833-5 gnd Röntgenstreuung (DE-588)4178324-4 gnd |
| topic_facet | Physics Crystallography Röntgendiffraktometrie Röntgenstreuung |
| url | https://doi.org/10.1007/978-1-4613-9535-5 |
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