Scanning probe microscopy: atomic force microscopy and scanning tunneling microscopy
Saved in:
Bibliographic Details
Main Author: Voigtländer, Bert (Author)
Format: Electronic eBook
Language:English
Published: Berlin ; Heidelberg Springer [2015]
Series:NanoScience and Technology
Subjects:
Online Access:TUM01
UBW01
Volltext
Abstract
Inhaltsverzeichnis
Physical Description:1 Online-Ressource (xv, 382 Seiten) Illustrationen, Diagramme
ISBN:9783662452400
DOI:10.1007/978-3-662-45240-0

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection! Get full text