Scanning probe microscopy: atomic force microscopy and scanning tunneling microscopy
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Berlin ; Heidelberg
Springer
[2015]
|
| Schriftenreihe: | NanoScience and Technology
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| Schlagworte: | |
| Online-Zugang: | TUM01 UBW01 Volltext Abstract Inhaltsverzeichnis |
| Beschreibung: | 1 Online-Ressource (xv, 382 Seiten) Illustrationen, Diagramme |
| ISBN: | 9783662452400 |
| DOI: | 10.1007/978-3-662-45240-0 |
Internformat
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Datensatz im Suchindex
| _version_ | 1804153034455908352 |
|---|---|
| adam_text | SCANNING PROBE MICROSCOPY
/ VOIGTLAENDER, BERT
: 2015
ABSTRACT / INHALTSTEXT
THIS BOOK EXPLAINS THE OPERATING PRINCIPLES OF ATOMIC FORCE MICROSCOPY
AND SCANNING TUNNELING MICROSCOPY. THE AIM OF THIS BOOK IS TO ENABLE THE
READER TO OPERATE A SCANNING PROBE MICROSCOPE SUCCESSFULLY AND
UNDERSTAND THE DATA OBTAINED WITH THE MICROSCOPE. THE CHAPTERS ON THE
SCANNING PROBE TECHNIQUES ARE COMPLEMENTED BY THE CHAPTERS ON
FUNDAMENTALS AND IMPORTANT TECHNICAL ASPECTS. THIS TEXTBOOK IS PRIMARILY
AIMED AT GRADUATE STUDENTS FROM PHYSICS, MATERIALS SCIENCE, CHEMISTRY,
NANOSCIENCE AND ENGINEERING, AS WELL AS RESEARCHERS NEW TO THE FIELD
DIESES SCHRIFTSTUECK WURDE MASCHINELL ERZEUGT.
SCANNING PROBE MICROSCOPY
/ VOIGTLAENDER, BERT
: 2015
TABLE OF CONTENTS / INHALTSVERZEICHNIS
INTRODUCTION
HARMONIC OSCILLATOR
TECHNICAL ASPECTS OF SCANNING PROBE MICROSCOPY
SCANNING PROBE MICROSCOPY DESIGNS
ELECTRONICS FOR SCANNING PROBE MICROSCOPY
LOCK-IN TECHNIQUE
DATA REPRESENTATION AND IMAGE PROCESSING
ARTIFACTS IN SPM
WORK FUNCTION, CONTACT POTENTIAL, AND KELVIN PROBE SCANNING FORCE
MICROSCOPY
SURFACE STATES
FORCES BETWEEN TIP AND SAMPLE
TECHNICAL ASPECTS OF ATOMIC FORCE MICROSCOPY (AFM)
STATIC ATOMIC FORCE MICROSCOPY
AMPLITUDE MODULATION (AM) MODE IN DYNAMIC ATOMIC FORCE MICROSCOPY
INTERMITTENT CONTACT MODE/TAPPING MODE
MAPPING OF MECHANICAL PROPERTIES USING FORCE-DISTANCE CURVES
FREQUENCY MODULATION (FM) MODE IN DYNAMIC ATOMIC FORCE MICROSCOPY
NOISE IN ATOMIC FORCE MICROSCOPY
QUARTZ SENSORS IN ATOMIC FORCE MICROSCOPY
SCANNING TUNNELING MICROSCOPY
SCANNING TUNNELING SPECTROSCOPY (STS)
VIBRATIONAL SPECTROSCOPY WITH THE STM
SPECTROSCOPY AND IMAGING OF SURFACE STATES
BUILDING NANOSTRUCTURES ATOM BY ATOM
DIESES SCHRIFTSTUECK WURDE MASCHINELL ERZEUGT.
|
| any_adam_object | 1 |
| author | Voigtländer, Bert |
| author_GND | (DE-588)1069225231 |
| author_facet | Voigtländer, Bert |
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| author_sort | Voigtländer, Bert |
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| dewey-full | 620.115 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.115 |
| dewey-search | 620.115 |
| dewey-sort | 3620.115 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik Chemie |
| doi_str_mv | 10.1007/978-3-662-45240-0 |
| format | Electronic eBook |
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| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:20:11Z |
| institution | BVB |
| isbn | 9783662452400 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027823357 |
| oclc_num | 904339062 |
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| physical | 1 Online-Ressource (xv, 382 Seiten) Illustrationen, Diagramme |
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| publishDate | 2015 |
| publishDateSearch | 2015 |
| publishDateSort | 2015 |
| publisher | Springer |
| record_format | marc |
| series2 | NanoScience and Technology |
| spelling | Voigtländer, Bert Verfasser (DE-588)1069225231 aut Scanning probe microscopy atomic force microscopy and scanning tunneling microscopy Bert Voigtländer Berlin ; Heidelberg Springer [2015] © 2015 1 Online-Ressource (xv, 382 Seiten) Illustrationen, Diagramme txt rdacontent c rdamedia cr rdacarrier NanoScience and Technology Rastersondenmikroskopie (DE-588)4330328-6 gnd rswk-swf Rastersondenmikroskopie (DE-588)4330328-6 s DE-604 Erscheint auch als Druck-Ausgabe 978-3-662-45239-4 https://doi.org/10.1007/978-3-662-45240-0 Verlag URL des Erstveröffentlichers Volltext Springer Fremddatenuebernahme application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=027823357&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Abstract Springer Fremddatenuebernahme application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=027823357&sequence=000003&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Voigtländer, Bert Scanning probe microscopy atomic force microscopy and scanning tunneling microscopy Rastersondenmikroskopie (DE-588)4330328-6 gnd |
| subject_GND | (DE-588)4330328-6 |
| title | Scanning probe microscopy atomic force microscopy and scanning tunneling microscopy |
| title_auth | Scanning probe microscopy atomic force microscopy and scanning tunneling microscopy |
| title_exact_search | Scanning probe microscopy atomic force microscopy and scanning tunneling microscopy |
| title_full | Scanning probe microscopy atomic force microscopy and scanning tunneling microscopy Bert Voigtländer |
| title_fullStr | Scanning probe microscopy atomic force microscopy and scanning tunneling microscopy Bert Voigtländer |
| title_full_unstemmed | Scanning probe microscopy atomic force microscopy and scanning tunneling microscopy Bert Voigtländer |
| title_short | Scanning probe microscopy |
| title_sort | scanning probe microscopy atomic force microscopy and scanning tunneling microscopy |
| title_sub | atomic force microscopy and scanning tunneling microscopy |
| topic | Rastersondenmikroskopie (DE-588)4330328-6 gnd |
| topic_facet | Rastersondenmikroskopie |
| url | https://doi.org/10.1007/978-3-662-45240-0 http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=027823357&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=027823357&sequence=000003&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA |
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