APA (7th ed.) Citation

Voigtländer, B. (2015). Scanning probe microscopy: Atomic force microscopy and scanning tunneling microscopy. Springer. https://doi.org/10.1007/978-3-662-45240-0

Chicago Style (17th ed.) Citation

Voigtländer, Bert. Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy. Berlin ; Heidelberg: Springer, 2015. https://doi.org/10.1007/978-3-662-45240-0.

MLA (9th ed.) Citation

Voigtländer, Bert. Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy. Springer, 2015. https://doi.org/10.1007/978-3-662-45240-0.