X-ray scattering from semiconductors and other materials:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Singapore ; Hackensack, NJ
World Scientific
2015
|
| Ausgabe: | 3. ed. |
| Schlagworte: | |
| Beschreibung: | XVI, 493 S. Ill., graph. Darst. |
| ISBN: | 9789814436922 |
Internformat
MARC
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| 001 | BV042369876 | ||
| 003 | DE-604 | ||
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| 007 | t | ||
| 008 | 150219s2015 ad|| |||| 00||| eng d | ||
| 010 | |a 2014031060 | ||
| 020 | |a 9789814436922 |c alk. paper |9 978-981-4436-92-2 | ||
| 035 | |a (OCoLC)910338434 | ||
| 035 | |a (DE-599)GBV799812668 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-91G | ||
| 084 | |a PHY 685f |2 stub | ||
| 084 | |a PHY 606f |2 stub | ||
| 084 | |a ELT 072f |2 stub | ||
| 100 | 1 | |a Fewster, Paul F. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a X-ray scattering from semiconductors and other materials |c Paul F. Fewster |
| 250 | |a 3. ed. | ||
| 264 | 1 | |a Singapore ; Hackensack, NJ |b World Scientific |c 2015 | |
| 300 | |a XVI, 493 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 0 | 7 | |a Halbleiterwerkstoff |0 (DE-588)4158817-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Röntgenstrukturanalyse |0 (DE-588)4137203-7 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Halbleiterwerkstoff |0 (DE-588)4158817-4 |D s |
| 689 | 0 | 1 | |a Röntgenstrukturanalyse |0 (DE-588)4137203-7 |D s |
| 689 | 0 | |5 DE-604 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-027806154 | ||
Datensatz im Suchindex
| _version_ | 1804153005746946048 |
|---|---|
| any_adam_object | |
| author | Fewster, Paul F. |
| author_facet | Fewster, Paul F. |
| author_role | aut |
| author_sort | Fewster, Paul F. |
| author_variant | p f f pf pff |
| building | Verbundindex |
| bvnumber | BV042369876 |
| classification_tum | PHY 685f PHY 606f ELT 072f |
| ctrlnum | (OCoLC)910338434 (DE-599)GBV799812668 |
| discipline | Physik Elektrotechnik |
| edition | 3. ed. |
| format | Book |
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| id | DE-604.BV042369876 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T01:19:44Z |
| institution | BVB |
| isbn | 9789814436922 |
| language | English |
| lccn | 2014031060 |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027806154 |
| oclc_num | 910338434 |
| open_access_boolean | |
| owner | DE-91G DE-BY-TUM |
| owner_facet | DE-91G DE-BY-TUM |
| physical | XVI, 493 S. Ill., graph. Darst. |
| publishDate | 2015 |
| publishDateSearch | 2015 |
| publishDateSort | 2015 |
| publisher | World Scientific |
| record_format | marc |
| spelling | Fewster, Paul F. Verfasser aut X-ray scattering from semiconductors and other materials Paul F. Fewster 3. ed. Singapore ; Hackensack, NJ World Scientific 2015 XVI, 493 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Halbleiterwerkstoff (DE-588)4158817-4 gnd rswk-swf Röntgenstrukturanalyse (DE-588)4137203-7 gnd rswk-swf Halbleiterwerkstoff (DE-588)4158817-4 s Röntgenstrukturanalyse (DE-588)4137203-7 s DE-604 |
| spellingShingle | Fewster, Paul F. X-ray scattering from semiconductors and other materials Halbleiterwerkstoff (DE-588)4158817-4 gnd Röntgenstrukturanalyse (DE-588)4137203-7 gnd |
| subject_GND | (DE-588)4158817-4 (DE-588)4137203-7 |
| title | X-ray scattering from semiconductors and other materials |
| title_auth | X-ray scattering from semiconductors and other materials |
| title_exact_search | X-ray scattering from semiconductors and other materials |
| title_full | X-ray scattering from semiconductors and other materials Paul F. Fewster |
| title_fullStr | X-ray scattering from semiconductors and other materials Paul F. Fewster |
| title_full_unstemmed | X-ray scattering from semiconductors and other materials Paul F. Fewster |
| title_short | X-ray scattering from semiconductors and other materials |
| title_sort | x ray scattering from semiconductors and other materials |
| topic | Halbleiterwerkstoff (DE-588)4158817-4 gnd Röntgenstrukturanalyse (DE-588)4137203-7 gnd |
| topic_facet | Halbleiterwerkstoff Röntgenstrukturanalyse |
| work_keys_str_mv | AT fewsterpaulf xrayscatteringfromsemiconductorsandothermaterials |