Waveguide spectroscopy of thin films:
Gespeichert in:
1. Verfasser: | |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Amsterdam
Elsevier
2005
|
Ausgabe: | 1st ed |
Schriftenreihe: | Thin films and nanostructures
v. 33 |
Schlagworte: | |
Online-Zugang: | Volltext |
Beschreibung: | In this book new methods of study of the linear and nonlinear optical properties of thin films are presented. These techniques are based on the principles of the spatial Fourier spectroscopy of the light beam reflected from a prism-coupling device with the tunnel excitation of guided lightmodes in thin-film structures. Measurement techniques of determination of the absorption coefficient, refractive index and thickness of the dielectric, semiconductor or metallic films are considered. This book is highly recommended for specialists in the fields of integrated and thin film optics and for graduated students in related specialties. There are new techniques of measurement of thin-film parameters stated Includes bibliographical references (p. 207-217) and index |
Beschreibung: | 1 Online-Ressource (xv, 220 p.) |
ISBN: | 9780120885152 0120885158 0080457894 9780080457895 |
Internformat
MARC
LEADER | 00000nmm a2200000zcb4500 | ||
---|---|---|---|
001 | BV042317016 | ||
003 | DE-604 | ||
005 | 00000000000000.0 | ||
007 | cr|uuu---uuuuu | ||
008 | 150129s2005 |||| o||u| ||||||eng d | ||
020 | |a 9780120885152 |9 978-0-12-088515-2 | ||
020 | |a 0120885158 |9 0-12-088515-8 | ||
020 | |a 0080457894 |c electronic bk. |9 0-08-045789-4 | ||
020 | |a 9780080457895 |c electronic bk. |9 978-0-08-045789-5 | ||
035 | |a (OCoLC)162130215 | ||
035 | |a (DE-599)BVBBV042317016 | ||
040 | |a DE-604 |b ger |e aacr | ||
041 | 0 | |a eng | |
049 | |a DE-1046 | ||
082 | 0 | |a 530.4/175 |2 22 | |
100 | 1 | |a Khomchenko, Alexander V. |e Verfasser |4 aut | |
245 | 1 | 0 | |a Waveguide spectroscopy of thin films |c Alexander V. Khomchenko |
250 | |a 1st ed | ||
264 | 1 | |a Amsterdam |b Elsevier |c 2005 | |
300 | |a 1 Online-Ressource (xv, 220 p.) | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
490 | 0 | |a Thin films and nanostructures |v v. 33 | |
500 | |a In this book new methods of study of the linear and nonlinear optical properties of thin films are presented. These techniques are based on the principles of the spatial Fourier spectroscopy of the light beam reflected from a prism-coupling device with the tunnel excitation of guided lightmodes in thin-film structures. Measurement techniques of determination of the absorption coefficient, refractive index and thickness of the dielectric, semiconductor or metallic films are considered. This book is highly recommended for specialists in the fields of integrated and thin film optics and for graduated students in related specialties. There are new techniques of measurement of thin-film parameters stated | ||
500 | |a Includes bibliographical references (p. 207-217) and index | ||
650 | 4 | |a Couches minces / Spectre | |
650 | 4 | |a Couches minces / Propriétés optiques | |
650 | 7 | |a Thin films / Optical properties |2 fast | |
650 | 7 | |a Thin films / Spectra |2 fast | |
650 | 7 | |a SCIENCE / Physics / Condensed Matter |2 bisacsh | |
650 | 4 | |a Thin films |x Spectra | |
650 | 4 | |a Thin films |x Optical properties | |
856 | 4 | 0 | |u http://www.sciencedirect.com/science/book/9780120885152 |x Verlag |3 Volltext |
912 | |a ZDB-33-ESD |a ZDB-33-EBS | ||
940 | 1 | |q FAW_PDA_ESD | |
940 | 1 | |q FLA_PDA_ESD | |
999 | |a oai:aleph.bib-bvb.de:BVB01-027754007 |
Datensatz im Suchindex
_version_ | 1804152912992010240 |
---|---|
any_adam_object | |
author | Khomchenko, Alexander V. |
author_facet | Khomchenko, Alexander V. |
author_role | aut |
author_sort | Khomchenko, Alexander V. |
author_variant | a v k av avk |
building | Verbundindex |
bvnumber | BV042317016 |
collection | ZDB-33-ESD ZDB-33-EBS |
ctrlnum | (OCoLC)162130215 (DE-599)BVBBV042317016 |
dewey-full | 530.4/175 |
dewey-hundreds | 500 - Natural sciences and mathematics |
dewey-ones | 530 - Physics |
dewey-raw | 530.4/175 |
dewey-search | 530.4/175 |
dewey-sort | 3530.4 3175 |
dewey-tens | 530 - Physics |
discipline | Physik |
edition | 1st ed |
format | Electronic eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02340nmm a2200481zcb4500</leader><controlfield tag="001">BV042317016</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">150129s2005 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780120885152</subfield><subfield code="9">978-0-12-088515-2</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0120885158</subfield><subfield code="9">0-12-088515-8</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0080457894</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">0-08-045789-4</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780080457895</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">978-0-08-045789-5</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)162130215</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV042317016</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-1046</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">530.4/175</subfield><subfield code="2">22</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Khomchenko, Alexander V.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Waveguide spectroscopy of thin films</subfield><subfield code="c">Alexander V. Khomchenko</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1st ed</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Amsterdam</subfield><subfield code="b">Elsevier</subfield><subfield code="c">2005</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (xv, 220 p.)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Thin films and nanostructures</subfield><subfield code="v">v. 33</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">In this book new methods of study of the linear and nonlinear optical properties of thin films are presented. These techniques are based on the principles of the spatial Fourier spectroscopy of the light beam reflected from a prism-coupling device with the tunnel excitation of guided lightmodes in thin-film structures. Measurement techniques of determination of the absorption coefficient, refractive index and thickness of the dielectric, semiconductor or metallic films are considered. This book is highly recommended for specialists in the fields of integrated and thin film optics and for graduated students in related specialties. There are new techniques of measurement of thin-film parameters stated</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references (p. 207-217) and index</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Couches minces / Spectre</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Couches minces / Propriétés optiques</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Thin films / Optical properties</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Thin films / Spectra</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">SCIENCE / Physics / Condensed Matter</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Thin films</subfield><subfield code="x">Spectra</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Thin films</subfield><subfield code="x">Optical properties</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://www.sciencedirect.com/science/book/9780120885152</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-33-ESD</subfield><subfield code="a">ZDB-33-EBS</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">FAW_PDA_ESD</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">FLA_PDA_ESD</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-027754007</subfield></datafield></record></collection> |
id | DE-604.BV042317016 |
illustrated | Not Illustrated |
indexdate | 2024-07-10T01:18:15Z |
institution | BVB |
isbn | 9780120885152 0120885158 0080457894 9780080457895 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027754007 |
oclc_num | 162130215 |
open_access_boolean | |
owner | DE-1046 |
owner_facet | DE-1046 |
physical | 1 Online-Ressource (xv, 220 p.) |
psigel | ZDB-33-ESD ZDB-33-EBS FAW_PDA_ESD FLA_PDA_ESD |
publishDate | 2005 |
publishDateSearch | 2005 |
publishDateSort | 2005 |
publisher | Elsevier |
record_format | marc |
series2 | Thin films and nanostructures |
spelling | Khomchenko, Alexander V. Verfasser aut Waveguide spectroscopy of thin films Alexander V. Khomchenko 1st ed Amsterdam Elsevier 2005 1 Online-Ressource (xv, 220 p.) txt rdacontent c rdamedia cr rdacarrier Thin films and nanostructures v. 33 In this book new methods of study of the linear and nonlinear optical properties of thin films are presented. These techniques are based on the principles of the spatial Fourier spectroscopy of the light beam reflected from a prism-coupling device with the tunnel excitation of guided lightmodes in thin-film structures. Measurement techniques of determination of the absorption coefficient, refractive index and thickness of the dielectric, semiconductor or metallic films are considered. This book is highly recommended for specialists in the fields of integrated and thin film optics and for graduated students in related specialties. There are new techniques of measurement of thin-film parameters stated Includes bibliographical references (p. 207-217) and index Couches minces / Spectre Couches minces / Propriétés optiques Thin films / Optical properties fast Thin films / Spectra fast SCIENCE / Physics / Condensed Matter bisacsh Thin films Spectra Thin films Optical properties http://www.sciencedirect.com/science/book/9780120885152 Verlag Volltext |
spellingShingle | Khomchenko, Alexander V. Waveguide spectroscopy of thin films Couches minces / Spectre Couches minces / Propriétés optiques Thin films / Optical properties fast Thin films / Spectra fast SCIENCE / Physics / Condensed Matter bisacsh Thin films Spectra Thin films Optical properties |
title | Waveguide spectroscopy of thin films |
title_auth | Waveguide spectroscopy of thin films |
title_exact_search | Waveguide spectroscopy of thin films |
title_full | Waveguide spectroscopy of thin films Alexander V. Khomchenko |
title_fullStr | Waveguide spectroscopy of thin films Alexander V. Khomchenko |
title_full_unstemmed | Waveguide spectroscopy of thin films Alexander V. Khomchenko |
title_short | Waveguide spectroscopy of thin films |
title_sort | waveguide spectroscopy of thin films |
topic | Couches minces / Spectre Couches minces / Propriétés optiques Thin films / Optical properties fast Thin films / Spectra fast SCIENCE / Physics / Condensed Matter bisacsh Thin films Spectra Thin films Optical properties |
topic_facet | Couches minces / Spectre Couches minces / Propriétés optiques Thin films / Optical properties Thin films / Spectra SCIENCE / Physics / Condensed Matter Thin films Spectra Thin films Optical properties |
url | http://www.sciencedirect.com/science/book/9780120885152 |
work_keys_str_mv | AT khomchenkoalexanderv waveguidespectroscopyofthinfilms |