Principles of semiconductor network testing:
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Bibliographic Details
Main Author: Afshar, Amir (Author)
Format: Electronic eBook
Language:English
Published: Boston Butterworth-Heinemann c1995
Subjects:
Online Access:Volltext
Item Description:Includes bibliographical references and index
This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources
Physical Description:1 Online-Ressource (xiv, 213 p.)
ISBN:9780080539560
0080539564
9780750694728

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