Principles of semiconductor network testing:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boston
Butterworth-Heinemann
c1995
|
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | Includes bibliographical references and index This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources |
| Beschreibung: | 1 Online-Ressource (xiv, 213 p.) |
| ISBN: | 9780080539560 0080539564 9780750694728 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV042316077 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 150129s1995 |||| o||u| ||||||eng d | ||
| 020 | |a 9780080539560 |c electronic bk. |9 978-0-08-053956-0 | ||
| 020 | |a 0080539564 |c electronic bk. |9 0-08-053956-4 | ||
| 020 | |a 9780750694728 |9 978-0-7506-9472-8 | ||
| 035 | |a (ZDB-33-EBS)ocn174141702 | ||
| 035 | |a (OCoLC)174141702 | ||
| 035 | |a (DE-599)BVBBV042316077 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-1046 | ||
| 082 | 0 | |a 621.3815/48 |2 22 | |
| 100 | 1 | |a Afshar, Amir |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Principles of semiconductor network testing |c Amir Afshar |
| 264 | 1 | |a Boston |b Butterworth-Heinemann |c c1995 | |
| 300 | |a 1 Online-Ressource (xiv, 213 p.) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a Includes bibliographical references and index | ||
| 500 | |a This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources | ||
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated |2 bisacsh | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Electronics / Circuits / General |2 bisacsh | |
| 650 | 7 | |a Integrated circuits / Testing |2 fast | |
| 650 | 7 | |a Semiconductors / Testing |2 fast | |
| 650 | 4 | |a Integrated circuits |x Testing | |
| 650 | 4 | |a Semiconductors |x Testing | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe, Hardcover |z 0-7506-9472-6 |
| 856 | 4 | 0 | |u http://www.sciencedirect.com/science/book/9780750694728 |x Verlag |3 Volltext |
| 912 | |a ZDB-33-ESD |a ZDB-33-EBS | ||
| 940 | 1 | |q FAW_PDA_ESD | |
| 940 | 1 | |q FLA_PDA_ESD | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-027753068 | ||
Datensatz im Suchindex
| _version_ | 1804152910988181504 |
|---|---|
| any_adam_object | |
| author | Afshar, Amir |
| author_facet | Afshar, Amir |
| author_role | aut |
| author_sort | Afshar, Amir |
| author_variant | a a aa |
| building | Verbundindex |
| bvnumber | BV042316077 |
| collection | ZDB-33-ESD ZDB-33-EBS |
| ctrlnum | (ZDB-33-EBS)ocn174141702 (OCoLC)174141702 (DE-599)BVBBV042316077 |
| dewey-full | 621.3815/48 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815/48 |
| dewey-search | 621.3815/48 |
| dewey-sort | 3621.3815 248 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02197nmm a2200457zc 4500</leader><controlfield tag="001">BV042316077</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">150129s1995 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780080539560</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">978-0-08-053956-0</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0080539564</subfield><subfield code="c">electronic bk.</subfield><subfield code="9">0-08-053956-4</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780750694728</subfield><subfield code="9">978-0-7506-9472-8</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-33-EBS)ocn174141702</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)174141702</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV042316077</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-1046</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815/48</subfield><subfield code="2">22</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Afshar, Amir</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Principles of semiconductor network testing</subfield><subfield code="c">Amir Afshar</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boston</subfield><subfield code="b">Butterworth-Heinemann</subfield><subfield code="c">c1995</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (xiv, 213 p.)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TECHNOLOGY & ENGINEERING / Electronics / Circuits / General</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Integrated circuits / Testing</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Semiconductors / Testing</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Testing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Testing</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe, Hardcover</subfield><subfield code="z">0-7506-9472-6</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://www.sciencedirect.com/science/book/9780750694728</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-33-ESD</subfield><subfield code="a">ZDB-33-EBS</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">FAW_PDA_ESD</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">FLA_PDA_ESD</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-027753068</subfield></datafield></record></collection> |
| id | DE-604.BV042316077 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:18:14Z |
| institution | BVB |
| isbn | 9780080539560 0080539564 9780750694728 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027753068 |
| oclc_num | 174141702 |
| open_access_boolean | |
| owner | DE-1046 |
| owner_facet | DE-1046 |
| physical | 1 Online-Ressource (xiv, 213 p.) |
| psigel | ZDB-33-ESD ZDB-33-EBS FAW_PDA_ESD FLA_PDA_ESD |
| publishDate | 1995 |
| publishDateSearch | 1995 |
| publishDateSort | 1995 |
| publisher | Butterworth-Heinemann |
| record_format | marc |
| spelling | Afshar, Amir Verfasser aut Principles of semiconductor network testing Amir Afshar Boston Butterworth-Heinemann c1995 1 Online-Ressource (xiv, 213 p.) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh Integrated circuits / Testing fast Semiconductors / Testing fast Integrated circuits Testing Semiconductors Testing Erscheint auch als Druck-Ausgabe, Hardcover 0-7506-9472-6 http://www.sciencedirect.com/science/book/9780750694728 Verlag Volltext |
| spellingShingle | Afshar, Amir Principles of semiconductor network testing TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh Integrated circuits / Testing fast Semiconductors / Testing fast Integrated circuits Testing Semiconductors Testing |
| title | Principles of semiconductor network testing |
| title_auth | Principles of semiconductor network testing |
| title_exact_search | Principles of semiconductor network testing |
| title_full | Principles of semiconductor network testing Amir Afshar |
| title_fullStr | Principles of semiconductor network testing Amir Afshar |
| title_full_unstemmed | Principles of semiconductor network testing Amir Afshar |
| title_short | Principles of semiconductor network testing |
| title_sort | principles of semiconductor network testing |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated bisacsh TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh Integrated circuits / Testing fast Semiconductors / Testing fast Integrated circuits Testing Semiconductors Testing |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated TECHNOLOGY & ENGINEERING / Electronics / Circuits / General Integrated circuits / Testing Semiconductors / Testing Integrated circuits Testing Semiconductors Testing |
| url | http://www.sciencedirect.com/science/book/9780750694728 |
| work_keys_str_mv | AT afsharamir principlesofsemiconductornetworktesting |